COD, TN, NH4+-N, NO3−-N, and NO2−-N were measured according to standard methods (APHA, 1999). The DO and pH were measured with a dissolved oxygen meter (SANXIN, SX700, China). X-ray diffraction (XRD; Rint 2200, Rigaku Corporation, Japan) and scanning electron microscopy (SEM; Sigma 300, Zeiss, Germany) were performed. All water samples were repeated in three groups, and the average value was calculated with the standard deviation.
Rint 2200
Manufactured by Rigaku
Sourced in Japan
The RINT 2200 is a X-ray diffractometer produced by Rigaku. It is designed for the analysis of crystalline materials. The RINT 2200 utilizes X-ray diffraction technology to identify and quantify the crystalline phases present in a sample.
Automatically generated - may contain errors
Lab products found in correlation
Sigma 300, by Zeiss (1 mentions)
Jsm 890, by JEOL (1 mentions)
Toc 500, by Shimadzu (1 mentions)
Jsm 6400, by JEOL (1 mentions)
Avio 200, by PerkinElmer (1 mentions)
Eca 600 nmr spectrometer, by JEOL (1 mentions)
Unity 300 spectrometer, by Agilent Technologies (1 mentions)
Dsc 250, by TA Instruments (1 mentions)
2400 2 analyzer, by PerkinElmer (1 mentions)
Tga 550, by TA Instruments (1 mentions)
Ft ir 4700 spectrometer, by Jasco (1 mentions)
Jms 700tz, by JEOL (1 mentions)
Ft ir 4600 spectrometer, by Jasco (1 mentions)
Sigma 500, by Zeiss (1 mentions)
Jem 2010f, by JEOL (1 mentions)
Jps 9200 x ray photoelectron spectrometer, by JEOL (1 mentions)
3100 pc spectrophotometer, by Shimadzu (1 mentions)
Esca 3400, by Shimadzu (1 mentions)
Jem 2100f microscope, by JEOL (1 mentions)
Jsm 7001f microscope, by JEOL (1 mentions)
17 protocols using rint 2200
1
Comprehensive Water Quality Analysis
2
Comprehensive Characterization of Nanomaterials
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The products were characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM), and transmission electron microscopy (TEM). Conventional XRD measurements were performed at room temperature on a Rigaku Rint-2200 diffractometer using Cu Kα radiation. The diffraction data were collected in a 2θ range of 10° to 60° with a step size of 0.04°. SEM micrographs were recorded with a JSM-890 (JEOL) operated at 15 kV. TEM measurements were performed with an HR-9000 (Hitachi) operated at 200 kV, taking care not to expose the samples to air.
3
Comprehensive Analytical Characterization of Minerals
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
Total Fe and rare earths in the acids were analysed by inductively coupled plasma optical emission spectrometry (ICP-OES, Avio-200, Perkinelmer, USA). Fe2+ and Fe3+ in the acids were determined through the standard method35 (link). Nitrate in the nitric acid was determined by ion chromatograph (881 pro, Metrohm, Switzerland). Total organic carbon and pH were measured by organic matter analyser (TOC 500, Shimadzu, Japan) and pH meter (S210-S, Mettler Toledo, USA). The crystallisation and morphology of the obtained particles were recorded by X-ray diffractometer (XRD, Rigaku, Rint2200, Japan) and scanning electron microscope (SEM, JSM-6400, JEOL, Japan), respectively.
4
Structural and Thermal Characterization Methods
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
X-ray diffraction (XRD) patterns were acquired using a Rigaku RINT2200 (Japan) with Cu Kα radiation over a scan range of 3–40° at a rate of 2° min−1. NMR spectra in solutions were recorded using a Varian Unity-300 spectrometer (Palo Alto, CA, USA) with tetramethylsilane (TMS) as an internal standard. The DBU contents in the intercalation compounds of γ-TiP were measured using a PerkinElmer 2400II analyzer (Waltham, MA, USA). The 13C CPMAS NMR spectra were recorded using a JEOL ECA-600 NMR spectrometer (Tokyo, Japan). Thermogravimetric (TG) analysis was carried out using a TA instrument TGA-550 at a heating rate of 10 °C min−1 under nitrogen. Differential scanning calorimetry (DSC) was carried out using a TA instrument DSC250 at a heating rate of 10 °C min−1 under nitrogen.
5
Structural Analysis of Material Samples
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The crystalline phases of samples were identified by X-ray diffraction (XRD; Rigaku, RINT-2200) using a Cu Kα radiation. The unit cell parameters were investigated by Rietveld refinement (using the RIETAN-FP program).37 (link) Surface morphologies of samples were observed using a scanning electron microscope (SEM, Hitachi Corp., S-3000HXS); the energy dispersive X-ray analysis has been performed using 15 keV. X-ray photoelectron spectrometry (XPS) measurements were carried out using an electron spectrometer (Shimadzu Corp./Kratos, AXIS-165×) with an Al Kα X-ray source. The position of each peaks was collected by using C spectra. Fourier transform infrared spectroscopy (FTIR) measurements were carried out using a FTIR 4700 spectrometer (JASCO).
6
Comprehensive Material Characterization
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
FAB-MS spectra were measured on a JEOL JMS-700TZ. Elemental analyses were performed by Exter Analytical CE440. Infrared spectra were recorded on a JASCO FT/IR-4600 spectrometer. XRD spectra were characterized by a RIGAKU X-ray diffractometer RINT 2200. Single crystal X-ray diffractions were made on a RIGAKU RAXIS RAPID imaging plate area detector.
7
Characterization of Co3O4-doped Carbon Nanomaterials
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The morphology and structure of the carbon materials with and without Co3O4 nanoparticles were characterized using the Sigma-500 (ZEISS) field-emission scanning electron microscope (SEM) operated at 1.5 kV or less and the JEM-2010F (JEOL) field emission transmission electron microscope (TEM) operated at 200 kV. In addition, the degree of graphitization and phase of Co3O4 were identified by the RINT2200 (Rigaku) X-ray diffractometer with Cu Kα radiation (λ = 015418 nm) and XproRA (Horiba Scientific) Raman spectrometer with laser wavelength of 532 nm. The specific surface areas of the specimens were examined by nitrogen gas adsorption/desorption at 77 K using Belsorp-mini equipment (Bel Japan). Prior to the measurements, the specimens were heat-treated in vacuo at 473 K for 3 h. The amount of Co3O4 loading on the carbon supports was evaluated by a Netzsch, STA 2500 Regulus TG-DSC system, operated in air at a heating rate of 20 K min−1 to 1273 K. The nitrogen content and nitrogen species in the N-pCNFs were examined by a JEOL, JPS-9200 X-ray photoelectron spectrometer (XPS) with Mg Kα (1253.6 eV) excitation.
8
Comprehensive Structural Characterization of Materials
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The structure of the product was characterized by a Rigaku X-ray diffractometer (XRD) (RINT 2200, Japan) with CuKα (λ = 1.5418 Å) radiation with a step interval of 0.02° s−1. The morphological analysis was carried out by a field emission scanning electron microscope (FESEM) (JEOL JSM 7001F microscope) at an accelerating voltage of 15 kV and a transmission electron microscope (TEM) (JEOL JEM 2100F microscope) at an accelerating voltage of 200 kV. UV-vis spectroscopy analyses were performed by a Shimadzu 3100 PC spectrophotometer (Japan). X-ray photoelectron spectroscopy (XPS) was performed by a Shimadzu ESCA 3400 (Japan).
9
Structural Analysis of Mo-Se Oxide
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The structure of Mo–Se oxide was determined from powder XRD. A powder XRD pattern for structural analysis was obtained on a RINT2200 (Rigaku, Japan) with Cu Kα radiation (tube voltage: 40 kV, tube current: 40 mA, scan speed: 1° min−1, step: 0.01°). First, the powder XRD pattern was indexed by the DICVOL06 (ref. 42 ) and X-cell programs43 . After performing Pawley refinement, the most reasonable space group was obtained. Then, the Le Bail method44 was applied for intensity extraction with the EdPCR program. The initial structure was solved by a charge-flipping algorithm45 . The positions and types of atoms were obtained by analysing the generated electron density maps (Supplementary Table 5 ). The initial structure was refined by Rietveld analysis.
10
Structural Analysis of VT-1 and Cs-VT-1
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The initial structures of VT-1 and Cs-VT-1 were determined by powder XRD. The powder XRD patterns for structural analysis were obtained on a RINT2200 instrument (Rigaku, Japan) with Cu Kα radiation (tube voltage: 40 kV, tube current: 40 mA, scan speed: 1° min−1, step: 0.01°). First, the powder XRD pattern was indexed by the DICVOL0655 (link) and X-cell programs56 (link). After performing Pawley refinement, the most reasonable space group was obtained (Supplementary Table 2 ). Then, the Le Bail method57 (link) was applied for intensity extraction with the EdPCR program. The initial structure was solved by a charge-flipping algorithm58 (link). The positions and types of atoms were obtained by analysing the generated electron density maps (Supplementary Table 3 and Table 22 ). The framework oxygen atoms and cations that could not be found by the charge-flipping algorithm were added logically based on XANES and elemental analysis. The initial structure was further refined by Rietveld analysis.
About PubCompare
Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.
We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.
However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.
Ready to get started?
Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required
Revolutionizing how scientists
search and build protocols!