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Titan 80 300 tem

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The Titan 80-300 TEM is a transmission electron microscope (TEM) manufactured by Thermo Fisher Scientific. Its primary function is to provide high-resolution imaging of samples by transmitting a beam of electrons through a thin specimen, allowing for the observation and analysis of the sample's internal structure and composition at the nanoscale level.

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Lab products found in correlation

Tecnai g2 f20 x twin tem, by Thermo Fisher Scientific (1 mentions) Tecnai f30 tem, by Thermo Fisher Scientific (1 mentions) Quanta 3d dual beam, by Thermo Fisher Scientific (1 mentions) Leap 4000xhr system, by Cameca (1 mentions) Double tilt holder, by Ametek (1 mentions) Titan 80 300 environmental tem, by Thermo Fisher Scientific (1 mentions) Ultrascan 1000xp, by Ametek (1 mentions)

13 protocols using titan 80 300 tem

1

In Situ TEM Imaging of Structural Dynamics

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HR-TEM and DF-TEM experiments were conducted using FEI Tecnai G2 F20 X-TWIN TEM and FEI Titan 80-300 TEM, operated at either 80 or 300 kV. Acquisition times for DF-TEM images were 3 to 10 s. The spatial resolution of DF-TEM imaging is 1 nm. A Gatan 628-0500 in situ heating holder system was used to increase the sample temperature up to 900°C. All DF-TEM images were taken at the field of view where no image change was observed for more than 1-min exposure, preventing any change by the beam exposure during the measurement.
The angle-averaged spatial autocorrelation function 〈G(r)〉 of the DF-TEM images is the statistical correlation of two points separated by distance r and was calculated following the method of Giraldo-Gallo et al. (26 (link)). The characteristic length scale L from 〈G(r)〉 represents ξ in the disordered phase, although it approximately corresponds to the inverse square root of the paired dislocation density in the quasi-ordered crystalline phase. Each data point in Figs. 2 and 4 was calculated from the correlation functions of multiple (>10) images acquired from the membranes of the same thickness.
Hong S.S., Yu J.H., Lu D., Marshall A.F., Hikita Y., Cui Y, & Hwang H.Y. (2017). Two-dimensional limit of crystalline order in perovskite membrane films. Science Advances, 3(11), eaao5173.
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2

Nanomaterial Characterization by In-situ TEM

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The TEM samples used for in-situ TEM were prepared using a focus ion beam scanning electron microscopy (Helios). In-situ TEM experiments were conducted using an FEI Titan 80-300 TEM equipped with an aberration corrector for the objective lens and a Gatan furnace-based heating holder. The accelerate voltage of 300 kV and electron beam dose rate of ≈103 e Å−2 s−1 were used in the in-situ TEM experiments. The TEM samples were heated to elevated temperatures (200 to 300 °C) during the experiments to promote the reaction, making it suitable for in-situ TEM observation. The high angle annular dark-field (HAADF) scanning transmission electron microscopy (STEM) image, annular bright-field (ABF) STEM image and electron energy-loss spectrum (EELS) mapping were conducted using JEM ARM200F. The collection angle for HAADF and ABF imaging were 90-370 mrad and 10–23 mrad, respectively. The probe current of ≈20 pA was used for STEM imaging and EELS mapping to minimize the electron beam induced phase transition. The Dual-EELS was used for the energy calibration of Fe-L edge with the simultaneously acquired zero loss spectrum.
Yang Z., Wang L., Dhas J.A., Engelhard M.H., Bowden M.E., Liu W., Zhu Z., Wang C., Chambers S.A., Sushko P.V, & Du Y. (2023). Guided anisotropic oxygen transport in vacancy ordered oxides. Nature Communications, 14, 6068.
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3

Characterization of HEA Films by APT

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The characterization of the films before irradiation was performed using XRD and TEM to investigate the existing phases in the films and the overall microstructure. In addition to the in situ images taken at the IVEM–Tandem Facility, post-characterization was also performed using FEI Tecnai F30 TEM operating at 300 keV and FEI Titan 80-300 TEM operating at 300 keV. APT was performed on three HEA films: (i) pristine, (ii) annealed to 1050 K, and (iii) irradiated with 3-MeV Cu+ to ~8 dpa. Needle specimens for APT analysis were prepared using an FEI Quanta 3D DualBeam focused ion beam system through a lift-out and annular milling process (42 ). APT analysis was conducted using a CAMECA LEAP 4000XHR system in laser-assisted mode using a 40-pJ laser pulse energy, with a 355-nm ultraviolet laser at 125-kHz pulse frequency while maintaining the specimen temperature at 40 K and detection rate at 0.005 atoms per pulse. The APT data were reconstructed using Integrated Visualization and Analysis Software (IVAS) 3.8 APT data analysis software.
El-Atwani O., Li N., Li M., Devaraj A., Baldwin J.K., Schneider M.M., Sobieraj D., Wróbel J.S., Nguyen-Manh D., Maloy S.A, & Martinez E. (2019). Outstanding radiation resistance of tungsten-based high-entropy alloys. Science Advances, 5(3), eaav2002.
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4

Bright Field TEM Imaging of Nanodisks

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Bright field TEM images of nanodisks were acquired from the “windows” mentioned earlier, using a Titan 80–300 TEM (FEI) operated at an accelerating voltage of 300 kV.
Alekseeva S., Fanta A.B., Iandolo B., Antosiewicz T.J., Nugroho F.A., Wagner J.B., Burrows A., Zhdanov V.P, & Langhammer C. (2017). Grain boundary mediated hydriding phase transformations in individual polycrystalline metal nanoparticles. Nature Communications, 8, 1084.
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5

Doping Level Quantification in TEM

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Energy dispersive x-ray experiments conducted in an FEI Titan 80-300 TEM, operated at 80 kV, confirmed the doping level, with a Sr/Ca content of ~3.1:10.9.
Bugnet M., Löffler S., Hawthorn D., Dabkowska H.A., Luke G.M., Schattschneider P., Sawatzky G.A., Radtke G, & Botton G.A. (2016). Real-space localization and quantification of hole distribution in chain-ladder Sr3Ca11Cu24O41 superconductor. Science Advances, 2(3), e1501652.
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6

Multimodal Microscopy for Material Characterization

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FIB/SEM imaging and TEM specimen preparation by FIB lift out were conducted on a FEI Helios DualBeam FIB operating at 1–30 kV. STEM observation was conducted on FEI Titan 80-300 TEM with probe corrector. In STEM mode the beam current is 60 pA. For high-resolution lattice imaging, the beam dose is around 106 e Å–2. HRTEM observations were conducted on FEI Titan 80-300 Environmental TEM with objective lens corrector. The beam current is 140 pA. The in situ TEM heating holder is carried using a double tilt holder based on resistant heating coil made by Gatan (Gatan Inc., Pleasanton, CA, USA). The sample was heated at a constant rate of 5 °C min–1 from room temperature and the temperature is measured using a thermal couple integrated into the holder. In situ XRD experiments were carried out using a Bruker D8 advace X-ray diffractometer with a heating stage.
Yan P., Zheng J., Chen T., Luo L., Jiang Y., Wang K., Sui M., Zhang J.G., Zhang S, & Wang C. (2018). Coupling of electrochemically triggered thermal and mechanical effects to aggravate failure in a layered cathode. Nature Communications, 9, 2437.
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7

Electron Holographic Imaging of Magnetic Samples

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Electron holograms were acquired using an FEI Titan 80–300 TEM operated in Lorentz mode at 300 kV using a charge-coupled device camera and an electron biprism typically at 50 V. Magnetic induction maps were recorded after tilting the sample to ± 70° and applying a vertical magnetic field of > 1.5 T using the conventional microscope objective lens, in order to acquire images before and after reversing the direction of magnetization in the sample. Evaluation of half of the difference between phase images recorded with opposite magnetization directions in the sample was used to remove the mean inner potential contribution to the phase. The mean inner potential was subtracted from the unwrapped total phase shift in order to construct magnetic induction maps that were representative of the magnetic remanence28 (link).
Shah J., Williams W., Almeida T.P., Nagy L., Muxworthy A.R., Kovács A., Valdez-Grijalva M.A., Fabian K., Russell S.S., Genge M.J, & Dunin-Borkowski R.E. (2018). The oldest magnetic record in our solar system identified using nanometric imaging and numerical modeling. Nature Communications, 9, 1173.
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8

FIB-Prepared Tungsten Needle TEM Imaging

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The needle-shaped samples produced by FIB on tungsten wires were mounted in a Model 2050 on-axis rotation tomography holder (E.A. Fischione Instruments, Inc., Export, PA) and imaged in a Titan 80–300 TEM (FEI Company, The Netherlands) operated at 300 kV using a high-angle annular dark-field (HAADF) detector. To avoid sample damage prior to APT, only three images were recorded at −60°, 0°, and +60° tilt at a magnification of 160 k times.
Langelier B., Wang X, & Grandfield K. (2017). Atomic scale chemical tomography of human bone. Scientific Reports, 7, 39958.
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9

STEM EBIC Imaging at the Nanoscale

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The 256 × 256-pixel images in Fig. 4D–F and Fig. S23 were acquired simultaneously with an FEI Titan 80-300 TEM operated at 300 kV in STEM mode with a 200 pA beam and a 100 s frame time. The STEM EBIC images were acquired using a two-channel STEM EBIC system from NanoElectronic Imaging (NEI) incorporating a custom biasing holder manufactured by Hummingbird Scientific. No filtering has been applied to the images.
Recalde-Benitez O., Jiang T., Winkler R., Ruan Y., Zintler A., Adabifiroozjaei E., Arzumanov A., Hubbard W.A., van Omme T., Pivak Y., Perez-Garza H.H., Regan B.C., Alff L., Komissinskiy P, & Molina-Luna L. (2023). Operando two-terminal devices inside a transmission electron microscope. Communications Engineering, 2, 83.
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10

Atomic-Resolution HRTEM Imaging Protocols

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AC-HRTEM images in movie S1 were carried out using an image side CS-corrected FEI Titan 80-300 TEM operated at 80 kV accelerating voltage with a modified filament extraction voltage for information limit enhancement. Images were recorded on a slow-scan charge-coupled device camera type Gatan UltraScan 1000XP. Because a certain amount of electron dose was required to achieve atomic resolution, the exposure time for each frame was 1.0 s. The dose rate of e-beam applied in movie S1 was 1.05 × 108 e− nm−2 s−1.
AC-HRTEM images in movie S2 were carried out using the image side CC/CS-corrected SALVE instrument (20 to 80 kV) operated at 80 kV accelerating voltage with a point resolution of <0.08 nm. The exposure time for the frames in movie S2 was 0.5 s. The dose rate of e-beam applied in movie S1 was 1.05 × 108 e− nm−2 s−1. The dose rate of e-beam applied in movie S2 was 1.10 × 108 e− nm−2 s−1.
For each observation, approximately 30 s were spent for adjusting the magnification, dose rate, and focal length. All imaging experiments were carried out at room temperature. In addition, 26 s (from 252 to 278 s) was spent for centering the drifted SWNT in movie S1 during continuous irradiation.
Cao K., Skowron S.T., Biskupek J., Stoppiello C.T., Leist C., Besley E., Khlobystov A.N, & Kaiser U. (2020). Imaging an unsupported metal–metal bond in dirhenium molecules at the atomic scale. Science Advances, 6(3), eaay5849.
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