Transmission electron microscopy (TEM) and high-resolution TEM (HR-TEM) images were acquired using a JEOL EM-2010 microscope (JEOL, Tokyo, Japan) at an accelerating voltage of 200 kV. The powder X-ray diffraction (XRD) pattern was obtained by a Rigaku D/Max-3C diffractometer (Cu Kα radiation, λ = 0.15418 nm, Rigaku Co. Ltd., Tokyo, Japan). The UV-Vis absorption spectra were acquired by a Jasco V-570-type spectrophotometer (Jasco SLM-468, Tokyo, Japan). Elemental analysis was performed by inductively coupled plasma-atomic emission spectroscopy (ICP-AES) using an ICPS-7500 spectrometer (Shimadzu, Kyoto, Japan). The MTT cell proliferation assay was performed by an ELx808TM absorbance microplate reader (Biotek Instruments Inc., Winooski, VT, USA).
Icps 7500 spectrometer
Manufactured by Shimadzu
Sourced in Japan
The ICPS-7500 is a sequential inductively coupled plasma optical emission spectrometer (ICP-OES) manufactured by Shimadzu. It is designed for the analysis of trace elements in a variety of sample types. The ICPS-7500 utilizes a plasma source to excite atoms and ions, which then emit light at characteristic wavelengths that can be detected and measured to determine the elemental composition of the sample.
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3 protocols using icps 7500 spectrometer
1
Multitechnique Nanomaterial Characterization
2
Structural Characterization of Ru Catalysts
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XRD patterns of Ru-x samples were measured on the D8ADVANCE diffractometer equipped with a Kα radiation. The morphologies and particle size of different Ru crystals were investigated by high-angle annular dark-field scanning transmission electron microscopy (HADDF-STEM) images on a JEOL-2100F FETEM. XPS spectra were conducted over a Thermo VG ESCALAB250 X-ray photoelectron spectrometer. UPS measurements were performed on a UV/VIS spectrometer Lambada 25. The mass loadings of Ru on the porous carbon substrate were measured by ICP-AES (Shimadzu ICPS-7500 spectrometer). BET surface area was determined through low-temperature N2 adsorption-desorption experiments on a Micromeritics ASAP 2020 sorptometer.
3
Accelerated Elution of Metal Ions
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To analyze the eluted metal ion concentration from the antenna, the SID was put in a glass bottle filled with 10 ml of deionized water. For the accelerated test, the solution was heated up to 80°C for 5 days. After 5 days, the media was collected, and hydrochloric acid with a concentration of 3% (v/v) was added. The metal ion concentrations of Sn, Bi, Ag, and Cu were analyzed by ICPS (ICPS-7500 spectrometer, Shimadzu Corporation, Japan).
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