X pert3 diffractometer
The X'Pert3 diffractometer is a versatile X-ray diffraction (XRD) instrument designed for materials analysis. It is capable of performing a range of XRD techniques to characterize the crystalline structure and composition of various materials. The X'Pert3 diffractometer provides reliable and accurate data for applications in research, development, and quality control across a variety of industries.
4 protocols using x pert3 diffractometer
Structural and Compositional Analysis of Prepared Samples
Crystallinity Index Determination of BNF
The following equation was used to calculate the crystallinity index (CrI)
where Iam is the lowest intensity related to the amorphous structure, and I200 is the highest intensity of the diffraction peak.
Comprehensive Characterization of Thin Films
X-Ray Diffraction Analysis of Cuticle Samples
Samples of cuticle were taken from each specimen, ground to a powder, homogenized, randomly orientated on a glass slide, packed into a sample container, and irradiated with X-rays (Klug and Alexander, 1974) . This resulted in constructive interference, which, when Bragg's Law was met, could be plotted on a X-T intensity plot diffractogram (Klug and Alexander, 1974) . Each diffractogram was compared against a database of standard reference patterns, allowing for mineral species identifications. Any mineralogies that comprise less than two percent of the sample went undetected (Klug and Alexander, 1974) .
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