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X pert3 diffractometer

Manufactured by Malvern Panalytical
Sourced in Netherlands, United Kingdom

The X'Pert3 diffractometer is a versatile X-ray diffraction (XRD) instrument designed for materials analysis. It is capable of performing a range of XRD techniques to characterize the crystalline structure and composition of various materials. The X'Pert3 diffractometer provides reliable and accurate data for applications in research, development, and quality control across a variety of industries.

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4 protocols using x pert3 diffractometer

1

Structural and Compositional Analysis of Prepared Samples

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The crystal structure of the prepared samples was determined on X'Pert3 diffractometer (PANalytical, Netherlands) with a Cu Kα as radiation source (λ = 1.54056 °A) in a 2θ range of 10–70°. The morphology of the prepared samples was characterized on a field-emission scanning electron microscopy (FE-SEM) (Hitachi, SU-5000) and transmission electron microscope (TEM, JEOL JEM-2100F). The chemical composition and the valence state of V in the prepared samples were analyzed by X-ray photoelectron spectroscopy (XPS) spectrometer (ESCALAB 250Xi) using monochromic Al Kα excitation.
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2

Crystallinity Index Determination of BNF

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The diffraction patterns of the BNF samples were obtained using a PANalytical, Xpert3 Diffractometer (Malvern, UK), which is equipped with the CRISP technology and enabled by the 2nd generation PreFIX technology, pneumatic shutters and with beams of 59 attenuators and Cu-Kα radiation (wavelength, λ = 1.54 Å) and generated at 45 kV below a current of 40 mA using a scan rate of 2θ = 10 min−1 in the 2θ ranged between 10° and 90°. The 2θ reflection angle was used to acquire the diffraction patterns.
The following equation was used to calculate the crystallinity index (CrI)
CrI=I200Iam/I200
where Iam is the lowest intensity related to the amorphous structure, and I200 is the highest intensity of the diffraction peak.
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3

Comprehensive Characterization of Thin Films

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The X-ray diffraction (XRD) pattern is acquired by a wide-angle X-ray diffractometer (PANalytical X’pert3 diffractometer) using Cu Kα radiation of wavelength 1.54060 Å. The XRD data are collected at room temperature in the range of 10–50° (2θ) using a step size of 0.02°. Structural compositions of the films are obtained using Raman spectroscopy (Thermo Fisher DXR2xi, laser source of λ = 532 nm and power of 5 mW). The microstructures of the surfaces and cross-sections of the films are observed with scanning electron microscopy (SEM; FEI Quanta 450). Before the SEM measurements, all samples are coated with the gold electrode by magnetron sputtering (Q150TS).
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4

X-Ray Diffraction Analysis of Cuticle Samples

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Two samples were subject to X-ray diffraction (XRD) in a PANalytical X'PERT-3 diffractometer.
Samples of cuticle were taken from each specimen, ground to a powder, homogenized, randomly orientated on a glass slide, packed into a sample container, and irradiated with X-rays (Klug and Alexander, 1974) . This resulted in constructive interference, which, when Bragg's Law was met, could be plotted on a X-T intensity plot diffractogram (Klug and Alexander, 1974) . Each diffractogram was compared against a database of standard reference patterns, allowing for mineral species identifications. Any mineralogies that comprise less than two percent of the sample went undetected (Klug and Alexander, 1974) .
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