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Reflex raman microscope

Manufactured by Renishaw
Sourced in United Kingdom

The Reflex Raman microscope is a laboratory instrument designed for Raman spectroscopy analysis. It combines a high-performance optical microscope with a Raman spectrometer, enabling the acquisition of Raman spectra from microscopic sample areas. The core function of the Reflex Raman microscope is to provide detailed chemical and structural information about the composition of materials at the microscopic level.

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3 protocols using reflex raman microscope

1

Resonance Raman Spectroscopy of Cytochromes

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Resonance Raman spectra of cytochromes were recorded with a Renishaw inVia Reflex Raman microscope with a ×50 objective. A 532 nm laser was used with 5 s exposure at 50% laser power for all measurements. At least 10 individual spectra were recorded from the middle of the filaments to obtain an averaged spectrum. Spectra were subsequently corrected for background scattering from the glass slide and medium by recording additional spectra next to the filaments. Reduced spectra were measured in 10 mM sodium dithionite in artificial seawater (ASW) and oxidized spectra were measured in air-saturated ASW.
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2

Raman Scattering Analysis of Ion-Irradiated Samples

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Raman scattering measurements were performed with an inVia Renishaw Reflex Raman Microscope in micro-Raman mode, with an edge filter with spectral cutoff at 80 cm−1 and a 2400 grooves/mm grating for the analysis of the scattered light. A frequency doubled Nd:YAG laser (532 nm) was used as excitation source. The laser beam was focused through a microscope objective with magnification ×100L and numerical aperture 0.85, which results in a spot size of about 0.76 µm. Laser power was not higher than 0.44 mW. For each fluence, 2–4 measurements were done in different locations of every crater created by ion irradiation (Figure 8). For deconvolution of the Raman spectra, the method by Ribeiro-Soares et al. has been used [58 (link)]. The peaks for the D band at 1345 cm−1, the G band at 1585 cm−1 and the D’ band at 1615 cm−1 have been fitted by Lorentzian functions while Gaussian functions have been used to fit the contribution from highly disordered areas close to 1250 cm−1 and 1490 cm−1. In order for the fitting algorithm to converge, the peak positions of the Gaussian peak at 1250 cm−1 and the D’ peak needed to be fixed. After fitting, integrated peak intensities of the D and G bands and the full width at half maximum (FWHM) of the G and D’ bands have been extracted from every Raman spectra. Error bars have been created using the standard deviation of the different parameters.
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3

Characterization of NZC-g-PANI Nanocomposite

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The Fourier transform infrared
(FTIR)
spectra of bare NLP, bare ZnO NPs, and the NZC-g-PANI
nanocomposite (before and after MO and BG dye adsorption) were investigated
in the range of 4000–400 cm–1 using a Perkin
Elmer (Nicolet 6700, Thermo Fisher). High-resolution field emission
scanning electron microscopy (HR FESEM) was used to record the microstructure
of the NZC-g-PANI nanocomposite (before and after
dye adsorption) employing a Zeiss NOVA NANOSEM-450 field emission
scanning electron microscope. The NZC-g-PANI nanocomposite
was also analyzed using a transmission electron microscope (JEM 2100,
JEOL, Japan) instrument operating at 200 kV. Raman spectra of the
samples were carried out at room temperature by an inVia Reflex Raman
Microscope (Renishaw, United Kingdom) with the samples deposited on
the glass slides. X-ray diffraction (XRD) measurements were performed
on a Rigaku D/max-RA X-ray diffractometer. The diffracted intensity
of the Cu Kα radiation (λ = 0.154 nm, 45 kV, 40 mA) was
evaluated in the 5–80° 2θ range. The dye concentrations
in the treated samples were determined using a spectrophotometer (Shimadzu
UV-2450, Japan). The pH at the point of zero charge (pHpzc) was determined using a change in pH approach with a pH meter (ANALAB
Scientific pH/ORP Analyzer).
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