Escalab 250xi xps

A copper sheet (Cu, 2 cm × 4 cm, purity of 99.4%) was used as a cathode, and it was ultrasonically washed with ethanol and deionized water before use. A platinum sheet was used as an anode, and the distance between the anode and cathode was 2.0 cm. A measured amount of triethanolamine was added to 100 g of 0.2 M CuSO₄ solution, and the mixture was used as the electrodeposition solution. The electrodeposition experiment was carried out under a constant current condition of 40 mA/cm² at 25 °C for 2 min. After that, the copper sheet was taken out, washed with deionized water and air-dried to obtain the granular copper film (GCF) sample. When the added amount of triethanolamine was 0, 0.2 and 0.4 g, the samples were prepared and designated as GCF-0, GCF-0.2 and GCF-0.4, respectively. The morphology and crystal structure of the films were examined by a scanning electron microscope (SEM Quanta 450 FEG, FEI, Hillsboro, OR, USA), X-ray diffractometer (XRD Bruker D8 Discover, Bruker AXS, Karlsruhe, Germany) and X-ray photoelectron spectrometer (XPS ESCALAB-250Xi, Thermo Fisher Scientific, Waltham, MA, USA), respectively.

FTIR analysis was carried out using a Thermo Nicolet 6700 FTIR (Thermo Fisher Scientific, Waltham, MD, USA). XPS analysis was carried out using an XPS Escalab 250Xi (Thermo Fisher Scientific, Waltham, MD, USA). Thermogravimetric analysis was carried out using a Q600 SDT thermal analyzer (TA Instruments, Leatherhead, UK) at a heating rate of 10 °C/min, ranging from room temperature to 800 °C, with a flow of nitrogen gas (purity 5.0) at 100 mL/min. The determination of potential zeta was carried out by a Zetasizer Nano ZS (Malvern Instruments, Malvern, UK). The absorbance measurements of the hemolysis tests were taken using the NanoDrop ND-1000 UV-Vis Spectrophotometer (Thermo Fisher Scientific, Waltham, MD, USA).

The crystal structure of the Mn(OH)₂ nanowire array was analyzed by X-ray diffractometer (XRD, D8 ADVANCE, Bruker, Karlsruhe, Germany). The morphologies and microstructures of the Mn(OH)₂ nanowires were examined by scanning electron microscope (SEM, Gemini 500, Zeiss, Oberkohen, Baden-Wurttemberg, Germany) and transmission electron microscope (TEM, Tecnai F20, FEI, Hillsborough, OR, USA). The composition of Mn(OH)₂ was characterized by X-ray photoelectron spectroscopy (XPS ESCALAB 250 Xi, Thermo Fisher Scientific, Waltham, MA, USA).

An X-ray diffractometer (XRD, D8 ADVANCE, Bruker, Karlsruhe, Germany) using Cu Kα radiation (λ = 1.5418 Å) was used to analyze the phases and structures of the deposited films. A scanning electron microscope (SEM, Quanta 200, FEI, Hillsborough, OR, USA) was used to study the morphologies and microstructures of the samples. Transmission electron microscopy (TEM, Tecnai F20, FEI, Hillsborough, OR, USA) and high-resolution TEM images were taken to confirm the size as well as the crystalline structure of the PANI film. Integrated elemental compositions over an area was collected using energy dispersive X-ray spectroscopy (EDS GENESIS Apex, EDAX Inc. Mahwah, NJ, USA) equipped with TEM. X-ray photoelectron spectroscopy (XPS ESCALAB 250 Xi, Thermo Fisher Scientific, Waltham, MA, USA) measurements were performed by using a monochromatic Al Kα X-ray beam (1486.6 eV), The binding energies were calibrated using C 1s peak (BE = 284.6 eV) as a standard.

The micro-morphology and elemental distribution were tested using a Zeiss Sigma 300-SEM (Carl Zeiss AG, Oberkochen, Germany) and a Tecnai G20-TEM (FEI, Hillsborough, OR, USA). The crystal structure and chemical composition of the as-prepared catalysts was recorded using an X-ray diffractometer with Cu Kα radiation (XRD, Bede Scientific Ltd., Centennial, CO, USA; Operated at 45 mA and 40 KV; Bruker Corporation, Waltham, MA, USA) and X-ray photoelectron spectroscopy with Al-K radiation (XPS, ESCALAB, 250Xi; Thermo Fisher Scientific, Waltham, MA, USA).

The phase and composition of the as-prepared samples was examined with an X-ray diffractometer (XRD, Bruker, D8 Advance, Beijing, China) using Cu Kα radiation (λ = 1.5418 Å). The morphology and microstructures were characterized by transmission electron microscope (TEM, JEOL JEM-2100, Beijing, China). X-ray photoelectron spectroscopy (XPS) measurements were conducted on a Thermo XPS ESCALAB 250Xi instrument (Thermo Scientific, Shanghai, China). UV-Vis-NIR diffuser reflectance (DRS) measurements were carried out on a UV/Vis/NIR spectrometer (PerkinElmer, Lambda 950, Shanghai, China). Specific surface area measurements were conducted by Autosorb-iQ2-Mp (Quantachrome, Shanghai, China).