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63 protocols using nanoscope analysis

1

Atomic Force Microscopy Surface Analysis

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Surface texture investigations were performed using the tapping mode on a DimensionsTM 3100 Atomic Force Microscope (Digital Instruments/Veeco, NY, USA) with an etched silicon tip (model NCHV, tip radius = 10 nm, Bruker). Areas of 20 × 20 μm2 were recorded and analyzed using the NanoScope Analysis software (Bruker). Surface roughness was assessed with NanoScope Analysis (Bruker Corporation, MA, USA) and reported as the root mean square roughness (Rq).
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2

Atomic Force Microscopy of Cyclic DNA Dimers

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Samples in the assembly buffer {DNA: 45 mM Tris (pH 8.0), 20 mM MgCl2; protein-DNA conjugate: 20 mM Hepes [4-(2-hydroxyethyl)-1-piperazineethanesulfonic acid, pH 7.0], 20 mM MgCl2} were directly dropped onto freshly cleaved mica and incubated for 30 min at room temperature before imaging. All AFM images were captured in fluid, using PeakForce Tapping mode on a Bruker Bioscope Resolve AFM equipped with PeakForce-Hirs-F-B (Bruker). The imaging buffer was the same as the respective assembly buffer to avoid changes in product distribution due to varying solvent or salt conditions. The effective imaging force (<80 pN) was continuously adjusted to minimize sample damage and probe manipulation. The images were flattened using NanoScope Analysis (Bruker) to remove tilt and bow. The bending angles of cyclic dimers were measured in NanoScope Analysis (Bruker). Lines were drawn over the DNA strands visualized, and the angles between strands on the opposite side of the fraying ends were measured.
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3

Atomic Force Microscopy of Protein Fibrils

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A total of 0.5 mg/mL protein fibril solutions (non-sonicated and sonicated) were diluted 10 times. Then, 20 L of each solution were deposited onto freshly etched mica surface and incubated for 45 s. Subsequently, samples were rinsed with 2 ml of MilliQ water and dried under gentle airflow. AFM images were recorded using Dimension Icon (Bruker) atomic force microscope operating in tapping mode and equipped with a silicon cantilever Tap300AI-G (40 N/m, Budget Sensors) with a typical tip radius of curvature of 8 nm. Images of sample topography were recorded at high-resolution (4 × 4 µm, 1,024 × 1,024 pixels). The scan rate was 0.5 Hz. Three-dimensional maps were flattened using NanoScope Analysis (Bruker) software.
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4

AFM Characterization of Crystal Suspensions

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For AFM sample preparation, 2 μL of crystal suspensions were applied on freshly cleaved mica, washed with deionized water and dried. AFM images were collected using a Dimension Icon microscope (Bruker, USA) using Scan Asyst peak force tapping (in air) mode at a resolution of 512 lines per image and a scan rate of 0.3 – 0.5 Hz. AFM images obtained were processed using Nanoscope Analysis (Bruker, USA).
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5

AFM Characterization of Crystal Suspensions

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For AFM sample preparation, 2 μL of crystal suspensions were applied on freshly cleaved mica, washed with deionized water and dried. AFM images were collected using a Dimension Icon microscope (Bruker, USA) using Scan Asyst peak force tapping (in air) mode at a resolution of 512 lines per image and a scan rate of 0.3 – 0.5 Hz. AFM images obtained were processed using Nanoscope Analysis (Bruker, USA).
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6

Morphological Characterization of Blend Films

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Exposed and as-cast blend films of E:[70]PCBM and ET:[70]PCBM on glass are investigated for morphological differences in ScanAsyst mode on a Bruker Multimode 8 microscope (Model number: MMAFM-2) with ScanAsyst-Air probes (spring constant: 0.4 N/m, resonant frequency: 70 kHz, nominal tip radius: 2 nm). All samples are scanned at 5 µm, 1 µm, and 500 nm at a scan rate of 0.8 Hz and a resolution of 640 samples per line. Both height and peak force errors are collected for analysis during the scan. We used NanoScope Analysis (provided by Bruker) for data analysis and converting 2D morphology into the 3D structure for better interpretation.
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7

Atomic Force Microscopy of Fixed Samples

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AFM imaging was performed on a Dimension FastScan atomic force microscope (Bruker, Santa Barbara, CA USA) in PeakForce TappingTM Mode using ScanAsyst-Air probes (nominal spring constant: 0.4 N/m and tip radius: 5 nm, Bruker) for fixed and air-dried samples. Sample imaged under fluid conditions were imaged in 0.22-μm-filtered autoclaved seawater with ScanAsyst-Fluid probes (nominal spring constant: 0.7 N/m and tip radius: 20 nm, Bruker). Acquired AFM micrographs were processed and analyzed using Nanoscope Analysis (Bruker) and Gwyddion software (http://gwyddion.net). Raw AFM height image data, generated from the feedback-controlled scanning tip motion, was processed using minimal line-flattening and plane-fitting routines. Peak force error image data, generated from the setpoint error of the applied peak forces by the scanning tip, were minimally processed using low-pass filters. Select AFM images were processed to improve visualization of surface features using Gwyddion software to generate SEM image presentations from height data simulated by Monte Carlo integration [61 ].
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8

Papilla Cell Wall Stiffness Measurement

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Pistils were placed straight in a 2% agar MS medium and 0.8% low-melting agarose was added up to a certain level where the papilla cells were maintained well immobilised in agarose while leaving the top accessible to the indenter. This set up allowed accurate measurements of cell wall stiffness on the dome-shaped top of papilla cells. AFM indentation experiments were carried out with a Catalyst Bioscope (Bruker Nano Surface, Santa Barbara, CA, USA) that was mounted on an optical microscope (MacroFluo, Leica, Germany) equipped with a x10 objective. All quantitative measurements were performed using standard pyramidal tips (RFESP-190 (Bruker)). The tip radius given by the manufacturer was 8–12 nm. The spring constant of the cantilever was measured using the thermal tune method and was 35 N/m. The deflection sensitivity of the cantilever was calibrated against a sapphire wafer. All experiments were made in ambient air at room temperature. Matrix of 10 × 10 measurements (step 500 nm) was obtained for each papilla, with a 1µN force. The Young’s Modulus was estimated using the Nanoscope Analysis (Bruker) software, using the Sneddon model with a < 200 nm indentation.
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9

Atomic Force Microscopy Analysis of Protein-Substrate Interactions

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For each AFM force measurement, a force map containing 1024 force curves was obtained and analyzed by Nanoscope analysis (Bruker). Retraction curves were analyzed to determine the number of adhesive events (negative peaks) corresponding to the force of interaction between each couple protein/substrate. Statistical analysis were performed on the number of detected peaks on each retraction curve and also on the intensity of the peak characteristic of the interaction protein/substrate which represents the required force to break the protein/substrate interaction.
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10

Atomic Force Microscopy of Alpha-Synuclein Fibrils

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A 10 μL volume of the
five times diluted aggregated sample (initial αS concentration
= 50 μM and N-protein concentration = 0.2–1 μM)
was deposited onto freshly cleaved mica (Muscovite mica, V-1quality,
EMS, US) and left to rest for 5 min. Then, the sample was carefully
washed four times with 20 μL of demineralized water (Milli-Q)
and gently dried under a low flow of nitrogen gas. AFM images were
acquired using a BioScope Catalyst (Bruker, US) in the soft tapping
mode using a silicon probe, NSC36 tip B with a force constant of 1.75
N/m (MikroMasch, Bulgaria). Images were captured with a resolution
of 512 × 512 (10 μm × 10 μm) pixels per image
at a scan rate of 0.2 to 0.5 Hz. AFM images were processed with the
scanning probe image processor (SPIP, Image Metrology, Denmark) and
the Nanoscope Analysis (Bruker, US) packages. Fibril morphology was
analyzed using a custom fibril analysis Matlab script adapted from
the FiberApp package.53 (link)
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