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Crysalis red

Manufactured by Agilent Technologies

CrysAlis RED is a software suite for X-ray diffraction data collection and processing. It provides a comprehensive set of tools for controlling and operating X-ray diffraction instruments, including single-crystal and powder diffraction systems. The software's core function is to facilitate the acquisition, analysis, and management of X-ray diffraction data, enabling researchers to study the structural properties of materials.

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107 protocols using crysalis red

1

Single Crystal X-Ray Diffraction Protocol

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Agilent Eos Gemini diffractometer

Absorption correction: multi-scan (CrysAlis PRO and CrysAlis RED, Agilent (2012 ▶ ). Tmin = 0.881, Tmax = 1.000

11343 measured reflections

6209 independent reflections

5042 reflections with I > 2σ(I)

Rint = 0.019

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2

Single-crystal X-ray Diffraction Analysis

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Agilent Xcalibur Atlas Gemini diffractometer

Absorption correction: analytical (CrysAlis RED; Agilent, 2012 ▶ ) Tmin = 0.961, Tmax = 0.977

12199 measured reflections

3757 independent reflections

3057 reflections with I > 2σ(I)

Rint = 0.023

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3

Single Crystal X-Ray Analysis

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Data collection: CrysAlis PRO (Agilent, 2012 ▶ ); cell refinement: CrysAlis PRO; data reduction: CrysAlis RED (Agilent, 2012 ▶ ); program(s) used to solve structure: SUPERFLIP (Palatinus & Chapuis, 2007 ▶ ); program(s) used to refine structure: SHELXL2012 (Sheldrick, 2008 ▶ ); molecular graphics: OLEX2 (Dolomanov et al., 2009 ▶ ); software used to prepare material for publication: OLEX2.
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4

Single Crystal X-ray Structure Determination

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Data collection: CrysAlis PRO (Agilent, 2012 ▶ ); cell refinement: CrysAlis PRO; data reduction: CrysAlis RED (Agilent, 2012 ▶ ); program(s) used to solve structure: SUPERFLIP (Palatinus & Chapuis, 2007 ▶ ; Palatinus & van der Lee, 2008 ▶ ; Palatinus et al., 2012 ▶ ).; program(s) used to refine structure: SHELXL2012 (Sheldrick, 2008 ▶ ); molecular graphics: OLEX2 (Dolomanov et al., 2009 ▶ ); software used to prepare material for publication: OLEX2.
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5

Single Crystal X-ray Diffraction Analysis

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Agilent Eos Gemini CCD diffractometer

Absorption correction: multi-scan (CrysAlis RED; Agilent, 2012 ▸ ) Tmin = 0.419, Tmax = 0.875

6087 measured reflections

1962 independent reflections

1774 reflections with I > 2σ(I)

Rint = 0.033

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6

Single Crystal X-Ray Diffraction Protocol

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Agilent Xcalibur Atlas Gemini diffractometer

Absorption correction: analytical (CrysAlis RED; Agilent, 2012 ▶ ) Tmin = 0.87, Tmax = 0.922

5879 measured reflections

3625 independent reflections

3022 reflections with I > 2σ(I)

Rint = 0.028

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7

Crystallographic Data Analysis Workflow

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Data collection: CrysAlis PRO (Agilent, 2014 ▸ ); cell refinement: CrysAlis PRO; data reduction: CrysAlis RED (Agilent, 2014 ▸ ); program(s) used to solve structure: SHELXT (Sheldrick, 2015a ▸ ); program(s) used to refine structure: SHELXL (Sheldrick, 2015b ▸ ); molecular graphics: OLEX2 (Dolomanov et al., 2009 ▸ ); software used to prepare material for publication: OLEX2.
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8

Single Crystal X-Ray Analysis

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Data collection: CrysAlis PRO (Agilent, 2012 ▶ ); cell refinement: CrysAlis PRO; data reduction: CrysAlis RED (Agilent, 2012 ▶ ); program(s) used to solve structure: SUPERFLIP (Palatinus & Chapuis, 2007 ▶ ); program(s) used to refine structure: SHELXL2012 (Sheldrick, 2008 ▶ ); molecular graphics: OLEX2 (Dolomanov et al., 2009 ▶ ); software used to prepare material for publication: OLEX2.
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9

Single-crystal X-ray Structure Analysis

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Agilent Xcalibur (Eos Gemini) diffractometer

Absorption correction: multi-scan (CrysAlis PRO and CrysAlis RED; Agilent, 2012 ▶ ) Tmin = 0.720, Tmax = 1.000

12873 measured reflections

3991 independent reflections

3525 reflections with I > 2σ(I)

Rint = 0.041

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10

Agilent Diffractometer Structural Determination

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Agilent Agilent (Eos, Gemini) diffractometer

Absorption correction: multi-scan (CrysAlis RED; Agilent, 2012 ▶ ) Tmin = 0.582, Tmax = 1.000

7059 measured reflections

2250 independent reflections

2065 reflections with I > 2σ(I)

Rint = 0.037

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