Scanning electron microscope (SEM) measurements were taken on JEOL JSM6700F or Hitachi S-4800 field-emission scanning electron microscopes. The samples with the gold coating were transferred onto the microscope stage and examined at 10 kV.
The transmission electron microscopy (TEM) images were obtained on a JEOL JEM-1400 transmission electron microscope (120 kV). A drop of the dispersed solution of the samples was dropped onto a TEM grid (a copper grid with a 200 mesh) and then dried for observation. Images were recorded with a Gatan multiscan charge-coupled device (CCD) for the collection and processing of digital micrographs.
Thermogravimetric analysis (TGA) measurements were performed at DSC 822e (Piscataway, NJ, USA) with a scanning speed of 10 °C·min−1 over 50–800 °C under a nitrogen atmosphere.
Fourier transform infrared (FTIR) spectra were carried out on a VERTEX-70/70v FT-IR spectrometer (Bruker Optics, Germany) using a KBr pellet method.
X-ray diffraction (XRD) measurements were completed on a DMAX-2500PC diffractometer with Cu Kα radiation (λ = 0.15418 nm) and a graphite monochromator. Samples were examined within 1–30° in the 2θ mode at a speed of 1° min−1.