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Jsm 6700f

Manufactured by Hitachi
Sourced in Japan

The JSM-6700F is a field emission scanning electron microscope (FE-SEM) designed and manufactured by Hitachi. It provides high-resolution imaging capabilities for a wide range of materials and applications. The JSM-6700F is capable of producing detailed images at low accelerating voltages, making it suitable for the examination of various samples, including those that are sensitive to electron beam damage.

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7 protocols using jsm 6700f

1

Multimodal Microscopic Characterization of Materials

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The optical microscope (Scope A1 from ZEISS, SLMPLN50× from Olympus, NA = 0.35) measurements were taken with the solution or the dried fibers on the glass slides.
Scanning electron microscope (SEM) measurements were taken on JEOL JSM6700F or Hitachi S-4800 field-emission scanning electron microscopes. The samples with the gold coating were transferred onto the microscope stage and examined at 10 kV.
The transmission electron microscopy (TEM) images were obtained on a JEOL JEM-1400 transmission electron microscope (120 kV). A drop of the dispersed solution of the samples was dropped onto a TEM grid (a copper grid with a 200 mesh) and then dried for observation. Images were recorded with a Gatan multiscan charge-coupled device (CCD) for the collection and processing of digital micrographs.
Thermogravimetric analysis (TGA) measurements were performed at DSC 822e (Piscataway, NJ, USA) with a scanning speed of 10 °C·min−1 over 50–800 °C under a nitrogen atmosphere.
Fourier transform infrared (FTIR) spectra were carried out on a VERTEX-70/70v FT-IR spectrometer (Bruker Optics, Germany) using a KBr pellet method.
X-ray diffraction (XRD) measurements were completed on a DMAX-2500PC diffractometer with Cu Kα radiation (λ = 0.15418 nm) and a graphite monochromator. Samples were examined within 1–30° in the 2θ mode at a speed of 1° min−1.
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2

Multimodal Characterization of Nanostructures

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TEM images were taken using a Hitachi H-7650 transmission electron microscope at an acceleration voltage of 100 kV. Energy dispersive X-ray (EDX) analysis was collected on a scanning electron microscope (SEM, JSM-6700F) using silicon wafer. X-ray diffraction (XRD) characterization was performed using a Philips X’Pert Pro X-ray diffractometer with a monochromatized Cu Kα radiation source and a wavelength of 0.1542 nm. The atomic ratio of Cu and Pd was investigated by inductively coupled plasma atomic emission spectrometry (ICP-AES, Atomscan Advantage, Thermo Jarrell Ash, USA). The MSOT equipment (inVision 128) was purchased from iThera Medical (Munich, Germany), and includes a total of 128 ultrasound transducer elements, each at 5 MHz, arranged in an array of 270 degrees. Illumination of the imaging plane is achieved with an OPO pumped Nd:YAG laser, which is tunable in 1 nm steps between 680 nm and 980 nm.
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3

Room-Temperature Synthesis of Ag-based Composites

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The general room-temperature solid-state reaction processes for AgnX@Ag are illustrated in Fig. 4. It included the route (I) for silver halides@Ag (strong-acid insoluble silver salts) and the route (II) for AgnX@Ag (feeble-acid insoluble silver salts). In route (I), powdery (NH2OH)2·H2SO4 and halide salts (such as NaCl, NaBr) were mixed with molar ratio of a:b, and then the pre-mixture was grounded together for 10 min at room temperature. Afterward, silver acetate (CH3COOAg) was added into the pre-mixture with absolute molar amount of (2a + b), and this mixture was ground for another 10 min. Finally, the prepared powders were washed with deionized water and dried in air. In route (II), the AgnX was firstly obtained by the room-temperature solid-state ion-exchange reaction between CH3COOAg and soluble salts MnX (such as Na2CrO4, Na3PO4, etc.) with feed molar ratio of np:p. Then the (NH2OH)2·H2SO4 with a given molar amount q (it must be less than 1/2 dose of CH3COOAg, namely q < np/2) was mixed with the collected AgnX powder and then grounded for 10 min. Afterward, the mixture was washed with deionized water and dried in air. The resulting powders were washed and dried in air. Then the AgnX@Ag sample was characterized by XRD (MXP18AHF, MAC, Cu-Kα λ = 0.154056 nm), SEM (JSM-6700F), and UV-Vis spectrophotometer (Hitachi U-3310).
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4

Multimodal Materials Characterization

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Energy-dispersive spectroscopy (EDS) and SEM analyses were accomplished with a JEOL JSM-6700F scanning electron microscope and Hitachi FE-SEM SU8010. Inductively coupled plasma (ICP) measurement was investigated on an Ultima 2 inductively coupled plasma OES spectrometer.
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5

Multifaceted Characterization of Electrode Materials

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X-ray diffraction measurements were carried out on Shimadzu XRD-6000 using Cu Kα radiation (λ = 1.5418Ǻ), and 2θ from 10 to 80 ° with a scan rate of 6 ° min−1. TEM (PHILIPS, Tecnai 12) and FESEM (JEOL, JSM-6700F or FESEM, Hitachi, S-4800) were conducted to study the morphological features of the samples. Raman spectroscopy was conducted on a Jobin-Yvon LabRam HR80 spectrometer to examine the chemical composition using a 532 nm laser. Fourier transform infrared spectrometer (FTIR) spectra were obtained by Nicolet 6700 spectrometer. X-ray photoelectron spectroscopy (XPS) was performed on a VG Scientific ESCLAB 220 iXL X-ray photoelectron spectrometer. Peeling test was measured with a universal electromechanical tester (Instron 4465) to evaluate the binder strength, and an electrode sample prepared in 30 mm width and 80 mm length was attached to 3 M tape.
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6

Comprehensive Nanomaterial Characterization

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The morphology of as synthesized materials was characterized using the transmission electron microscopy (TEM, Hitachi H-760 operated at 80 kV) and the scanning electron microscopy (SEM, JSM-6700F). The materials’ crystal structure was studied by using selected area electron diffraction (SAED) in a high-resolution TEM (HRTEM, JEOL JEM-2100F operated at 200 kV). The elemental analysis of the materials was conducted using energy-dispersive X-ray spectroscopy (EDS) inside the HRTEM.
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7

Characterization of ASA-CS Nanoparticles

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The mean size, size distribution and zeta potential measurements were performed on a Malvern Zetasizer Ver. 6.32 (Malvern Instruments, UK) in deionized water. The surface morphology of the ASA-CS nanoparticles was observed by scanning electron microscope (SEM) (Hitachi, JSM-6700F, Japan). For SEM, the nanoparticles suspensions were spread on a glass plate and dried at room temperature. The dried nanoparticles were coated with gold metal under vacuum and then examined. The chemical structure and complexes formation of CS and drug-loaded CS nanoparticles were analyzed by fourier transform infrared spectroscopy (FT-IR) (Bruker, TENSOR, Germany) and nuclear magnetic resonance (1H NMR) (Bruker, NMR500, Germany). The samples for infrared analysis were prepared by grinding the dry specimens with KBr and pressing the mixed powder to form disks.
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