Single crystals of (DA)2MnCl4 were grown onto p-type <100> Si substrates based on an anti-solvent vapor-assisted capping crystallization (AVCC) method45 (link). Specifically, crystals of (DA)2MnCl4 were dissolved at a concentration of 100 mM in a 1:1 solution of ethanol and methanol, which was then pipetted onto plasma-cleaned Si substrates and immediately capped with polished c-plane sapphire discs. The capped substrates were placed alongside vials of diethyl ether in a closed jar and allowed to dry over several days. Optical images of crystals were taken using a Motic Panthera TEC microscope. Thickness and roughness of crystals grown by the AVCC method were measured using an atomic force microscope (Jupiter XR, Asylum Research, Santa Barbara, CA, USA) in tapping mode. The step height was calculated in the Gwyddion software by fitting the scanned region with a piecewise function over the crystal surface and the substrate. Variable temperature measurements were performed using the PolyHeater accessory.
Jupiter xr
Manufactured by Oxford Instruments
Sourced in United States
The Jupiter XR is a high-performance lab equipment product from Oxford Instruments. It is designed for precise and efficient analysis of materials. The core function of the Jupiter XR is to provide advanced X-ray capabilities for researchers and scientists working in various fields of study.
Automatically generated - may contain errors
Lab products found in correlation
5 protocols using jupiter xr
1
AVCC Growth of (DA)₂MnCl₄ Crystals
2
Atomic Force Microscopy of Patterned Surfaces
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
Atomic force microscopy
(AFM) imaging was carried out on the patterns. The experiment was
done using an Asylum Research make system (Jupiter XR). The scanning
mode was noncontact. The scanned images are shown inFigure S1 of the Supporting Information. For the AFM imaging,
we used a Si cantilever with a resonance frequency of 1500 kHz and
a tip radius of 10 ± 2 nm.
(AFM) imaging was carried out on the patterns. The experiment was
done using an Asylum Research make system (Jupiter XR). The scanning
mode was noncontact. The scanned images are shown in
we used a Si cantilever with a resonance frequency of 1500 kHz and
a tip radius of 10 ± 2 nm.
3
Multi-Modal Film Analysis
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
Films were imaged using a combination
of polarized optical microscopy (Olympus BX53 microscope), field-emission
scanning electron microscopy (Carl Zeiss Merlin), and atomic force
microscopy (Asylum Research Jupiter XR) in tapping mode using an AC55TS
tip with a spring constant of ∼85 N/m. Orientation analysis
of crystals in SEM images was performed using the Fiji plugin OrientationJ (EPFL, Switzerland).
of polarized optical microscopy (Olympus BX53 microscope), field-emission
scanning electron microscopy (Carl Zeiss Merlin), and atomic force
microscopy (Asylum Research Jupiter XR) in tapping mode using an AC55TS
tip with a spring constant of ∼85 N/m. Orientation analysis
of crystals in SEM images was performed using the Fiji plugin OrientationJ (EPFL, Switzerland).
4
Atomic Force Microscopy Measurement
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The AFM measurement
in this study was performed using a commercial AFM system OXFORD INSTRUMENTS
Asylum Research Jupiter XR with a Fast Force Map mode (Setpoint 100
nN, Points: 256, ForceDist: 1.50 μm, Z rate:
200 Hz). The cantilever used in this mode was made of Asylum Research
(AC240TS-R3) with a nominal spring constant of 2 N m–1 and a tip radius of 7 nm. Before the measurement, an actual spring
constant of the cantilever was measured by Sader’s method.
in this study was performed using a commercial AFM system OXFORD INSTRUMENTS
Asylum Research Jupiter XR with a Fast Force Map mode (Setpoint 100
nN, Points: 256, ForceDist: 1.50 μm, Z rate:
200 Hz). The cantilever used in this mode was made of Asylum Research
(AC240TS-R3) with a nominal spring constant of 2 N m–1 and a tip radius of 7 nm. Before the measurement, an actual spring
constant of the cantilever was measured by Sader’s method.
5
AFM Characterization of Nanomaterials
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The AFM measurement in this study was performed using a commercial
AFM system OXFORD INSTRUMENTS Asylum Research Jupiter XR with a Fast
Force Map mode (Set point 100 nN, Points:256, Force Dist:1.50 μm,
Z rate:200 Hz). A cantilever used in this mode was made by Asylum
Research (AC240TS-R3) with a nominal spring constant of 2 N m–1 and a tip radius of 7 nm. Before the measurement,
the actual spring constant of the cantilever was measured by following
Sader’s method.
AFM system OXFORD INSTRUMENTS Asylum Research Jupiter XR with a Fast
Force Map mode (Set point 100 nN, Points:256, Force Dist:1.50 μm,
Z rate:200 Hz). A cantilever used in this mode was made by Asylum
Research (AC240TS-R3) with a nominal spring constant of 2 N m–1 and a tip radius of 7 nm. Before the measurement,
the actual spring constant of the cantilever was measured by following
Sader’s method.
About PubCompare
Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.
We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.
However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.
Ready to get started?
Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required
Revolutionizing how scientists
search and build protocols!