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Quadrasorb si 2000 08

Manufactured by Anton Paar

The QuadraSorb SI 2000–08 is a gas adsorption analyzer designed for surface area and pore size distribution measurements. It utilizes the static volumetric method to determine the adsorption and desorption isotherms of gases on solid materials.

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2 protocols using quadrasorb si 2000 08

1

Synthesis and Characterization of Ammonium Molybdate-Polypyrrole-Platinum Composite

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(NH4)6 Mo7O24 · 4H2O, Polypyrrole (PPy, un-doped, extent of labeling: ~20 wt. % loading, composite with carbon black and the CAS number is 30604-81-0) and Pt/C (10% Pt) were obtained from Sigma-Aldrich. Thiourea and KOH were from Sinopharm Chemical Reagent Co., Ltd. Sulfuric acid (H2SO4, 95–98%) and ethanol (99.9%) was purchased from Beijing Chemical Works. All aqueous solutions were prepared with ultrapure water obtained from a Millipore water purification system (≥18 MΩ, Milli-Q, Millipore).
X-ray diffraction (XRD) was performed by a Rigaku X-ray diffractometer with Cu KR target. The porosity was measured with a nitrogen adsorption-desorption isotherm using a surface area analyzer (QuadraSorb SI 2000–08, Quantachrome Instruments). The morphologies of products were observed under a field-emission scanning electron microscope (SEM; HITACHI S-4800) and a transmission electron microscope (TEM; JEM-2010, 200 kV). X-ray photoelectron spectroscopy (XPS) analysis was performed using an AXIS ULTRADLD instrument equipped with an Al Kα X-ray source. Raman spectra were recorded on an InVia-Reflex Raman microscope with a laser excitation wavelength of 532 nm.
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2

Comprehensive Materials Characterization Protocol

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X-ray diffraction (XRD) was performed with a Rigaku X-ray diffractometer with Cu KR target. The porosity was measured with a nitrogen adsorption-desorption isotherm using a surface area analyzer (QuadraSorb SI 2000-08, Quantachrome Instruments). The structure of products was observed under a field-emission scanning electron microscope (SEM; JEOL-6300 F, 3 kV) and a transmission electron microscope (TEM; JEM-2010, 200 kV). X-ray photoelectron spectroscopy (XPS) spectra were obtained using an AXIS ULTRADLD instrument equipped with an Al Kα X-ray source. Raman spectrum of powder samples were recorded on an InVia-Reflex Raman microscope with a laser excitation wavelength of 532 nm.
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