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143 protocols using phenom prox

1

Grape Pomace Particles: SEM Analysis

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Scanning electron microscopy was
performed with a Phenom ProX (Phenom World BV, Netherlands) on the
grape pomace to visualize the shape and structure of the particles.
Fracture surface morphology was observed using scanning electron microscopy
(SEM) on a Phenom ProX (Phenom World BV, Netherlands) equipped with
back scattering electron at 10 kV acceleration voltage. The samples
used for the SEM images were fractured with a pendulum hammer to provide
a cross section for imaging.
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2

SEM Analysis of C. albicans Biofilms

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The morphological changes in C. albicans ATCC 10231 cells were assessed by scanning electron microscopy (SEM, Phenom ProX, PhenomWorld, Eindhoven, Netherlands), using the method described by Bezerra et al. [43 (link)], with some modifications. Biofilms were fixed with a 4% formaldehyde solution in DPBS for 30 min at 37 °C. Then, the biofilms were washed three times with sodium phosphate buffer (pH = 7.4). Next, samples were dehydrated with increased ethanol concentrations (30%, 50%, 70%, and 100%) for 10 min at 24 °C. Lastly, the final dehydration was conducted with hexamethyldisilane (HDMS) for 10 min, removing the solvent at the end of washing to allow the samples to air dry. The samples were analyzed by scanning electron microscopy (SEM, Phenom ProX, PhenomWorld).
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3

Nanoleakage Assessment Protocol

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For nanoleakage, the beams received two layers of nail varnish up to 1 mm from the bonding interface on both sides. Then, they were individually immersed in an aqueous ammoniacal silver nitrate solution (50% in weight; pH = 7.0) and kept in a dark environment for 24 h, thoroughly rinsed in running water, and immersed in a photo-developing solution (Kodak, Rochester, Nova York, USA) under fluorescent light for 8 h, in order to reduce silver ions into metallic silver grains at the bonding interface. Afterwards, the surfaces were wet polished with 600-grit, 1200-grit, and 4000-grit SiC paper, ultrasonically cleaned in water for 10 min (Ultrassom 750 USC, Quimis, Rio de Janeiro, Brazil), and dried for 48 hours in a desiccator with blue silica gel at 37°C.
The resin/dentin interfaces were observed using scanning electron microscopy (SEM) (Phenom ProX, Phenom-World, Eindhoven, Netherlands), at an accelerating voltage of 15 kV, backscattered mode, and using a charge reduction sample holder (low vacuum environment). Three images were registered for each beam: two from both ends (right and left sides) and one central, with a magnification of 2000x. The amount of silver nitrate uptake in the hybrid layer was registered as a percentage of the total area observed, using an Energy-dispersive X-ray spectroscopy (EDS) detector (Phenom ProX, Phenom-World, Eindhoven, Netherland).
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4

Morphological and Structural Analysis of Treated Montmorillonite

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The TM's morphology before and after modification was observed by scanning electron microscopy (SEM, Phenom ProX, Phenom-World BV, Eindhoven, Netherlands). The crystal structure of TM was examined using X-ray diffraction (XRD, AL-2700B, Dandong Aolong Ray Instrument Co., Ltd, China) at a scanning speed of 4° min−1 over a 2θ range of 10°–70°, with an X-ray tube voltage of 40 kV and a current of 30 mA. The chemical groups on the MTM surface were studied using Fourier Transform Infrared Spectrometer (FTIR, NicoletteTM 6700, Thermo Scientific IN10, USA). The dispersion of TM in the composite support was observed using SEM, and its elemental composition and distribution were analyzed by Energy Dispersive Spectrometer (EDS). Before SEM analysis, all samples were subjected to gold sputter coating (10 mA, 120 s) to enhance conductivity. Compression and tensile tests were performed by the Universal Testing Machine (ZQ-990LA, Dongguan Wisdom Precision Instruments Co.). The tensile and compressive properties of the standard tensile and compressive samples were tested at a strain rate of 1 mm min−1, with no less than three sets of test data.
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5

Topography of FC Surface Roughening

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SEM (Phenom proX, Phenom-World BV, Netherlands) was used at an operating voltage of 15 kV and x500 magnification to determine the topography of FC after surface roughening.
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6

Isolation and Characterization of Diazotrophs

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Cultures from the DNA-SIP assay at day 35 were used for the isolation of the diazotrophic bacteria. Briefly, the cultures were serially diluted in 0.9% NaCl solution (up to 10−5) and then screened on agar plates containing the N-free Jensen's medium (M710). The plates were incubated at 30 °C for 3–5 days, and colonies were further purified and characterized. Then, PCR amplification of the nifH gene was performed to screen for diazotrophs [43 (link)]. An acetylene reduction assay was conducted to measure the nitrogenase activity to confirm the capability for nitrogen fixation [43 (link)]. The near full-length 16S rRNA gene was amplified with the primer pair 27F/1492R and sequenced, and sequences were annotated against the NCBI database. The neighbor-joining phylogenetic tree was constructed with MEGA. The morphology of the isolated strains was examined by scanning electron microscopy (Phenom proX, Phenom-World BV, Netherlands).
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7

Scanning Electron Microscopy of BC

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The BC samples were characterized using a desktop scanning electron microscope (SEM) [Phenom ProX (Phenom-World BV, Netherlands)]. All results were acquired using the ProSuite software. The samples were added to aluminum pin stubs with electrically conductive carbon adhesive tape (PELCO Tabs™), with the excess removed using compressed air. Samples were coated with 2 nm of Au for improved conductivity. The aluminum pin stub was then placed inside a Phenom Standard Sample Holder, analysis was conducted at 10 kV with intensity image.
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8

PNP and NLP Morphology Analysis by SEM

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PNP and NLP morphology was studied by using a Phenom ProX desktop SEM (Phenom-World BV, Eindhoven, Netherlands). PNPE and NLPE were prepared as described above. Prior to being analyzed, samples were filtered by using 0.22 μm pore size filters. After that, a drop of each preparation was poured over a glass slide and kept at room temperature until the complete evaporation of water. Before scanning electron microscopy (SEM) analysis, samples were sputtered with gold in the presence of argon. At least three different images for each sample were acquired.
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9

Microstructural Analysis of Cu-Ti Alloy

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Specimens for microstructure analysis were grounded using successive grades of SiC papers up to 3000 grit and were polished with alumina-impregnated cloth (according to ASTM E3-11) [26 ]. Microstructure examination was carried out using a digital camera-assisted optical microscope and a scanning electron microscope (models: LEO 1450 VP, Zeiss, Oberkochen, Germany and Phenom ProX, Phenom-World BV, Eindhoven, Netherland, respectively) equipped with an energy dispersive spectroscopy (EDS) analysis system. For optical studies, the welded sample was etched for 15 s in Kroll’s etchant (98 mL H2O + 4 mL HNO3 + 2 mL HF), washed with ethanol and finally dried with hot air. Vickers micro-hardness test was implemented using a Buehler micro-hardness machine (load = 200 g, dwell time = 20 s) on a longitudinal section of the weld. For a better accuracy, all the micro-hardness measurements were performed at least three times to ensure the reproducibility of the hardness results.
To detect the distribution of phases and the degree of their crystallinity, X-ray diffraction (XRD) analysis was performed on different regions of the Cu-Ti sample using an Explorer GNR. The X’Pert HighScore software was used for evaluation of the XRD data.
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10

Characterizing Material Microstructure via SEM-EDS

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The samples for scanning electron microscopy (SEM) and energy dispersive spectroscopy (EDS) analyses were mounted on aluminum sample holders using double-sided and electrically conductive adhesive tape, followed by sputtering with gold for 30 s using a sputter coater (LJ-16, Beijing Yulong Times Technology Co., China) to increase their electrical conductivity52 (link),53 (link). Then, the microstructure and elemental composition of the samples were characterized by a Scanning Election Microscope (PhenomProX, Phenom-World BV, Netherlands) equipped with an EDS (INCA, Oxford Instruments, UK) under an acceleration voltage of 15 kV.
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