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Smart apex system

Manufactured by Bruker

The SMART APEX system is a versatile and powerful X-ray diffraction (XRD) instrument designed for advanced materials research and analysis. The system features a high-performance X-ray source, a precise goniometer, and a state-of-the-art detector, enabling researchers to obtain high-quality, reliable data for a wide range of samples. The SMART APEX system is optimized for efficient and accurate data collection, providing researchers with the tools they need to explore the structural properties of materials.

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Lab products found in correlation

2 protocols using smart apex system

1

Structural Determination via Single-Crystal X-Ray Diffraction

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The crystal was mounted
and centered on a Bruker SMART APEX system.
The radiation used was Mo Kα (λ = 0.71073 A, m = 4.413 mm–1). Rotation and still images showed
diffractions to be sharp, while frames separated in reciprocal space
were obtained and provided an orientation matrix and initial cell
parameters. Final cell parameters were obtained from the full data
set. A “hemisphere” data set was obtained, which samples
approximately 1.2 hemispheres of reciprocal space to a resolution
of 0.84 Å using 0.3 degree steps in ω and using 10 s interval
times for each frame. Absorption corrections were applied using SADABS
(references of all software and sources of scattering factors are
contained in the SHELXTL (version 5.1) program library, G. Sheldrick,
Bruker Analytical X-ray Systems, Madison, WI, USA). The space group
was determined based on systematic absences and intensity statistics.
Direct or Patterson methods were used to locate the heavy atoms, C
atoms, and all other heteroatoms from the E-map. Repeated difference
Fourier maps allowed recognition of all expected H atoms. Prior to
location of H, other atoms were converted to and refined anisotropically.
Hydrogen atoms were refined isotropically and were placed in calculated
(dCH = 0.96 Å) positions. Structures
were collected at 100 K. Crystal data and structure analysis results
are shown in the Supporting Information.
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2

X-ray Crystal Structure Analysis

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Materials and Methods. All synthetic procedures were performed under normal atmospheric conditions. X-ray Single Crystal Diffraction Analysis. Standard procedures were used to mount the crystal on a Bruker Smart Apex system with graphite-monochromated Mo Kα radiation (λ = 0.71073 Å) at 293 K. The crystal structures were solved and refined using full-matrix least-squares routines, based on F 2 , using SHELXL within Olex2.
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