Jfd 300
The JFD-300 is a high-performance field emission scanning electron microscope (FE-SEM) designed for advanced imaging and analytical applications. The instrument features a high-resolution electron beam column, advanced detection systems, and a user-friendly interface, enabling detailed characterization of a wide range of materials and samples.
Lab products found in correlation
12 protocols using jfd 300
Scanning Electron Microscopy of Yeast Cells
Preparation for SEM Imaging
SEM Plant Specimen Preparation
Tissue Preparation for Electron Microscopy
three consecutive 10-min PBS washes. Thereafter, a series of treatments and washes were
performed to obtain conductive dyeing: 1% tannic acid for 30 min, three consecutive 10-min
PBS washes, 1% osmium tetroxide for 1 hr, and three consecutive 10-min PBS washes.
Dehydration with an ethanol series was carried out for 30 min at each concentration,
followed by three consecutive 30-min dehydrations in 100% ethanol. The samples were
further treated with a mixture of 100% ethanol and t-butyl alcohol (1:1) for 30 min, and
then with only t-butyl alcohol for 30 min three times. After freezing, the samples were
freeze-dried in a freeze dryer (JFD-300; JEOL Ltd., Tokyo, Japan). The samples were
ion-coated with platinum using a magnetron sputtering apparatus (JUC-5000; JEOL Ltd.). A
scanning electron microscope (JSM-5200, JEOL Ltd.) was used at an acceleration voltage of
20 kV to confirm the successful removal of the interstitial connective tissue and number
of Cp.
Ultrastructural Analysis of Biological Samples
Ultrastructural analysis of cherry petals
Morphological Analysis of Oviducal Glands
For scanning electron microscopy observation, the tendril-forming area of the oviducal gland was trimmed to an approximately 1-cm cube, dehydrated in graded concentrations of ethanol, immersed in butyl alcohol, and dried in a vacuum freeze-dryer (JFD-300; JEOL Ltd, Tokyo, Japan) overnight. Tissues mounted on a sample holder were coated with platinum palladium using an ion sputtering apparatus (E-1030; Hitachi High-Technologies Corp., Tokyo, Japan) and were observed using a scanning electron microscope (s-4800; Hitachi High-Technologies Corp.).
Microscopic Visualization of Fungal-Root Interactions
For observing hyphae on the root surface using a scanning electron microscope, sections of the main roots were fixed twice in 2% (v/v) glutaraldehyde in 0.1 M sodium cacodylate buffer (pH 7.2) for 1 h and dehydrated using a graded ethanol series (20–100%), then immersed in 100% acetone. Samples were freeze-dried (JFD-300; JEOL, Tokyo, Japan), coated with a thin gold layer using a JEE-400 vacuum evaporator (JEOL) and observed using a JSM-5800 scanning electron microscope (JEOL).
Embryo Ultrastructure Analysis by TEM and SEM
SEM Analysis of Silicate-Limited Cells
For the quantitative determination of morphological changes under silicon-limitation, a hundred randomly selected cells from triplicate cultures were categorized into 4 types (see Results) by their SEM images, and then the mean percentage of each type was calculated. The data was analyzed by t-test.
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