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Axs smart apex 2

Manufactured by Bruker
Sourced in Germany

The AXS SMART APEX II is a single-crystal X-ray diffractometer designed for the structural analysis of crystalline materials. It provides high-resolution data collection and advanced data processing capabilities for a wide range of applications in materials science, chemistry, and structural biology.

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5 protocols using axs smart apex 2

1

Single Crystal X-ray Diffraction of Compound 1

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Single crystal X-ray diffraction measurements were collected on a Bruker AXS SMART APEX II (Bruker, Karlsruhe, Germany) diffractometer for compound 1 with graphite monochromated Mo-Kα (λ = 0.71073 Å) radiation at 293 K. Data processing was performed using the SAINT processing program. The structure was solved through direct methods and refined on F2 by means of the full-matrix least-squares method with the SHELX-97 program. All the non-hydrogen atoms were refined with anisotropic thermal parameters. A summary of the detailed crystallographic data and structure refinement parameters for 1 (CCDC No. 2106882) are given in Tables S1–S3 in the SI.
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2

Structural Determination of Cobalt Complexes

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Single crystals of 1 and 2 that were suitable for structural determination were obtained from hydrothermal and solvothermal reactions, respectively, and their diffraction data were collected on a Bruker AXS SMART APEX II diffractometer, using graphite-monochromated MoKα radiation with λα = 0.71073 Å. The reflections of 1 and 2 that were collected were reduced and corrected by using Lorentz-polarization [24 ], and their structures were solved by using the direct method in the SHELXTL-97 program [25 (link)], both of which are well-established computational procedures. The solutions first afforded the positions of some of the heavier atoms, including the cobalt atom. The remaining atoms were found in a series of difference Fourier maps and least-square refinements, while the hydrogen atoms were added by using the HADD command. The methanol carbon atom is disordered such that two orientations can be found. Table 1 lists the crystal parameters and structural refinement results.
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3

Structural Characterization of Complexes 1-3

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The diffraction data for complexes of 13 were collected on a Bruker AXS SMART APEX II diffractometer at 296 K, which was equipped with a graphite-monochromated MoKα (Kα = 0.71073 Å) radiation. Data collection and reduction were performed by standard methods with use of well-established computational procedures [32 ,33 ]. Positions of some of the heavier atoms were located by the direct or Patterson method and the remaining atoms were found in a series of alternating difference Fourier maps and least-square refinements [34 ]. Basic information pertaining to crystal parameters and structure refinement is summarized in Table 1. Selected bond distances and angles are listed in Table S1.
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4

Single-Crystal X-Ray Diffraction Analysis

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Single-crystal
X-ray diffraction
analyses were carried out on a Bruker AXS SMART APEX-II diffractometer
equipped with a CCD detector. All measurements were performed using
monochromated Mo Kα radiation from an Incoatec microfocus sealed
tube at 100 K. Absorption corrections were performed semiempirically
from equivalents. Molecular structures were solved by direct methods
(SHELXS-97)47 (link) and refined by full-matrix
least-squares techniques against F2 (SHELXL-2014/6).48 (link) Crystallographic data, figures, and selected
geometric parameters are given in the Supporting Information. CCDC 2070035–2070038 contain supplementary crystallographic data for
this paper. These data can be obtained free of charge via www.ccdc.cam.ac.uk/data_request/cif.
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5

Detailed Crystallographic Data Analysis

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Crystal data were collected at low temperature (193K) on a Bruker-AXS SMART APEX II diffractometer (Ber + Lau -) and on a Bruker AXS Quazar APEX II diffractometer (Ber + AOT -, Ber + Tos -, Ber + TPB -, Ber + DS -, Ber + NTf2 -) using a 30 W air-cooled microfocus source (ImS) with focusing multilayer optics using MoK radiation (wavelength = 0.71073 Å). Phi-and omega-scans were used. The structures were solved by direct methods (ShelXS-97) or using an intrinsic phasing method (ShelXT). 51, 52 All non-hydrogen atoms were refined anisotropically using the least-square method on F 2 . 52 ORTEP molecular views are given in Figures S4 to S8 (Supplementary Information). Crystallographic data are given in Table 4. CCDC supplementary crystallographic data for the structures can be obtained free of charge via www.ccdc.cam.ac.uk/conts/retrieving.html (or for the CCDC, 12 Union Road, Cambridge CB2 1EZ, UK; fax: +441223 336033; e-mail: deposit@ccdc.cam.ac.uk).
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