Al ka x ray source

The as-obtained samples were initially characterized by X-ray diffraction (XRD) using an X-ray diffraction analyzer with Cu-Kα radiation (D8-Discover, Bruker). Thermogravimetric (TG) and differential scanning calorimetry (DSC) were examined from the STA449 F3 thermal analyzer with a heating rate of 10 °C min⁻¹ over the range 50~600 °C in an air atmosphere. X-ray photoelectron spectroscopy (XPS) measurements were performed on the product using a VG MultiLab 2000 system with a monochromatic Al Ka X-ray source (Thermo VG Scientific). The morphology of the samples were examined using a field emission scanning electron microscope (FESEM, Sirion, FEI). The detailed informations of the LTO-TiO₂ composite were investigated using a high-resolution transmission electron microscope (HRTEM, Tecnai F20, FEI).

X-ray diffraction (XRD) analysis was performed using Rigaku D/MAX-RB with a scan speed of 4^o/min. ICP spectroscopy was recorded by an Agilent 7500Ce spectrometer. Energy dispersive spectroscopy (EDS) was employed to determine elemental composition. Transmission electron microscopy (TEM) and high-resolution transmission electron microscopy (HRTEM) images were recorded by a JEOL JEM-2010F microscope combined with mapping. X-ray photoelectron spectroscopy (XPS) measurements were carried out on a VG Multi Lab 52000 system with a monochromatic Al Ka X-ray source (Thermo VG Scientific). The XAFS spectra data were collected at the BL1W1B station in the Beijing Synchrotron Radiation Facility (BSRF, operated at 2.5 GeV with a maximum current of 250 mA), and the Athena and Artemis software package provides the EXAFS fitting results.