AFM and TEM analyses were performed at the Microscopy Unit from the University of Valladolid. Samples were deposited on Lacey Carbon Type-A, 300 mesh, copper grids, and visualized and photographed using a JEOL JEM-1011 HR TEM coupled with a Gatan Erlangshen ES1000W camera. For AMF analysis, samples were deposited on a mica surface from aqueous solutions by drop casting. Images were recorded in AC mode (tapping mode) with a CYPHER ES instrument from Asylum Research (Oxford Instruments, Abingdon, UK), using silicon cantilevers AC160TS-R3 with aluminum reflex coating (Olympus) and tip radius <10 nm. The analysis was done using a set point of 500, 72 mV, a drive amplitude of 791.16, a drive frequency of 268.639, and integral gain of 268.639. Data acquisition and control was done with IGOR Pro 6.2 (Asylum Research, Oxford Instruments, Abingdon, UK). Images analysis was done with ARgyle (Argyle Software Ltd., Bath, UK).
Cypher es instrument
Manufactured by Oxford Instruments
Sourced in United Kingdom
The CYPHER ES is an atomic force microscope (AFM) instrument produced by Oxford Instruments. It is designed to provide high-resolution imaging and analysis of surfaces at the nanoscale level.
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Lab products found in correlation
2 protocols using cypher es instrument
1
Nanomaterial Characterization by AFM and TEM
2
Tapping Mode AFM Imaging in Fluid
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Images were acquired on an Asylum Research Cypher ES instrument in tapping mode. Silicon nitride BL-AC40TS probes were driven at their nominal frequency (approximately 25 kHz) using the blue drive photothermal excitation system for fluid imaging. Images analysed by skan software were acquired at 512 × 512 pixels at 2 Hz or 1024 × 1024 pixels at 0.5 Hz using a scan angle of 90°. Images were levelled using mean plane subtraction and corrected for horizontal strokes using Gwyddion software. A median filter (3 pixel radius) was applied to remove spikes from tip-sample adhesion before skan analysis.
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