The crystal structure was analyzed by X-ray powder diffraction (XRD) patterns obtained by Bruker D8 Advance diffractometer by using Cu Kα radiation (λ = 1.5406 Å, 40 kV, 40 mA). The size and morphology of the products were investigated by transmission electron microscopy (TEM, JEOL, JEM-2100) and scanning electron microscopy (SEM). Thermogravimetry (TG) measurements were carried out on a thermal analyzer (TGA-7, Perkin-Elmer, Canton, MA, USA). Fourier transform infrared (FTIR) spectra were recorded at room temperature with a Perkin-Elmer Spectrumone FTIR spectrometer. The stokes luminescence spectra were recorded with a Hitachi F-4600 fluorescence spectrophotometer at room temperature (2.5 nm for spectral resolution (FWHM) of the spectrophotometer and 700 V for PMT voltage). The anti-stokes luminescence spectra were recorded using a Hitachi F-4600 fluorescence spectrophotometer with an adjustable laser (980 nm) as the excitation source with a fiber-optic accessory. For comparison of the luminescence properties of different samples, the luminescence spectra were measured with the same instrument parameters (2.5 nm for spectral resolution (FWHM) of the spectrophotometer and 400 V for PMT voltage). Fluorescence kinetics test used OPO pulsed laser as an excitation source.
F 4600 fluorescence spectrophotometer
Manufactured by Hitachi
Sourced in Japan
The F-4600 fluorescence spectrophotometer is a laboratory instrument designed for the analysis of fluorescent samples. It measures the emission spectrum and intensity of fluorescent substances, providing quantitative data on the fluorescent properties of the sample. The F-4600 features high-sensitivity detection, a wide wavelength range, and advanced software for data analysis and processing.
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Lab products found in correlation
8453 uv vis spectrophotometer, by Agilent Technologies (5 mentions)
Uv 3600 uv vis nir spectrophotometer, by Shimadzu (4 mentions)
Amazon sl ion trap mass spectrometer, by Bruker (3 mentions)
Av400 400 mhz spectrometer, by Bruker (3 mentions)
1100 ion trap msd spectrometer, by Agilent Technologies (3 mentions)
Uv 2700 uv vis spectrophotometer, by Shimadzu (3 mentions)
Zetasizer nano zs90, by Malvern Panalytical (3 mentions)
Uv 2550 spectrophotometer, by Shimadzu (3 mentions)
Av 400, by Bruker (3 mentions)
Fv1000 confocal laser scanning microscope, by Olympus (3 mentions)
Jem 2100, by JEOL (2 mentions)
D8 advance diffractometer, by Bruker (2 mentions)
Uv 2600 spectrophotometer, by Shimadzu (2 mentions)
Escalab 250xi, by Thermo Fisher Scientific (2 mentions)
Av 400 spectrometer, by Bruker (2 mentions)
Absolute pl quantum yield spectrometer c11347, by Hamamatsu Photonics (2 mentions)
Lambda 750 spectrophotometer, by PerkinElmer (2 mentions)
Smartlab, by Rigaku (2 mentions)
Agilent 6510 q tof lc ms instrument, by Agilent Technologies (2 mentions)
Uv 2550 uv vis spectrophotometer, by Hitachi (2 mentions)
127 protocols using f 4600 fluorescence spectrophotometer
1
Comprehensive Material Characterization Protocol
2
Comprehensive Nanomaterial Characterization
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JEOL-2100f high resolution transmission electron microscope (equipped with xflash, Bruker, Germany), 5030t X-ray spectrometer (Japan Electronics Co., Ltd.), F-4600 fluorescence spectrophotometer (Hitachi high tech company), PHS-3c pH meter (Shanghai Yidian Scientific Instrument Co., Ltd.), d1008 series handheld centrifuge (Beijing Dalong Xingchuang Experimental Instrument Co., Ltd.), zf-7a portable UV detection lamp (Shanghai Guanghao analyzer Co., Ltd.), manual (adjustable and fixed) pipette (Beijing Dalong Xingchuang Experimental Instrument Co., Ltd.), and HJ-4A constant temperature magnetic heating agitator (Jiangsu Jintan Honghua instrument factory).
3
Characterization of Molecular Structures
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1H NMR and 13C NMR spectra were recorded on a Bruker Avance 300 spectrometer (Bruker Biospin International AG, Postfach, Switzerland). Chemical shifts were presented in parts per million (δ) relative to CHCl3 (7.26 ppm in 1H NMR). Fourier transform infrared spectroscopy (FT-IR) data were recorded with a Bruker TENSOR 27 FT-IR instrument (Bruker Optics, Billerica, MA, USA) using the conventional KBr pellet method. The elemental composition was measured with X-ray photoelectron spectroscopy (XPS) (ESCALAB 250 XI, Al KR source, Thermo Fisher Scientific, Waltham, MA, USA). The morphology of samples was observed via Hitachi SU8010 scanning electron microscopy (Hitachi High-Tech, Okinawa, Japan) with an operated voltage at 5kV. The fluorescence emission spectra (FL) were obtained on a HITACHI F-4600 fluorescence spectrophotometer (Hitachi High-Tech, Okinawa, Japan) at room temperature. Ultraviolet visible (UV-vis) absorption spectra were measured with a Shimadzu UV-2600 spectrophotometer (Shimadzu, Suzhou, China).
4
Characterization of Organic Compounds
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1H NMR and 13C NMR spectra were recorded on a Bruker Model AV 300 system. ESI mass spectra were obtained on a Finnigan LCQ Advantage ion trap mass spectrometer (Thermo Fisher Corporation) that was equipped with a standard ESI source, respectively. A F-4600 fluorescence spectrophotometer (Hitachi High-Technologies Corporation, Japan) was used to record fluorescence spectra with excitation wavelengths set to 310 nm. Cell imaging was carried out on a IX71 fluorescence microscope (Olympus, Japan).
5
Structural and Luminescent Properties of Samarium-Doped Calcium Lanthanum Phosphate Phosphors
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Powder X-ray diffraction (XRD) data was acquired from a Bruker D8 Advance X-ray powder diffractometer, using Cu Kα radiation (λ = 1.5418 Å) with operation voltage of 40 kV and current of 40 mA. Then, Rietveld analysis was performed on XRD data (step size: 0.02°, counting time: 2 s per step, and 2θ: 5° – 120°) collected from Ca9La0.99(PO4)7:0.01Sm3+ and Ca9La0.88(PO4)7:0.12Sm3+ phosphors. TOPAS program was used to perform crystal structure refinement.25 And photoluminescence emission (PL) and excitation (PLE) spectra, as well as temperature-dependent luminescence properties were all obtained by a Hitachi F-4600 fluorescence spectrophotometer. In addition, the decay curves were detected by a Yvon TBXPS spectrofluorometer. ZEISS 6035 scanning electron microscope (SEM) equipped with an Inca X-Max energy dispersive spectroscope (EDS) operated at voltage of 20 kV was used to characterize the particle morphology and conduct elemental analysis.
6
Characterization of Novel Photosensitive Compounds
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All the chemical reagents used in the experiments were purchased from commercial sources and were not purified further prior to use. The solutions of metal ions (0.1 mol L−1) used in the tests were prepared by dissolving the corresponding metal nitrates in distilled water except for K+, Ba2+, Hg2+ and Sn2+ (their counter ions were chloride ions). The NMR spectra were measured with tetramethylsilane (TMS) as the internal standard on a Bruker AV400 spectrometer. Mass spectra were recorded with a Bruker Amazon SL ion trap mass spectrometer (ESI) using methanol as the solvent. The melting points were determined on a WRS-1B melting point apparatus. The absorption spectra and fluorescence spectra were collected on an Agilent 8454 UV/vis spectrometer and a Hitachi F-4600 fluorescence spectrophotometer, respectively. Moreover, MUA-165 UV lamp and MVL-210 visible lamp were used for photoirradiation. The fluorescence quantum yield was determined on an Absolute PL Quantum Yield Spectrometer QYC11347-11. Infrared spectra (IR) were collected on a BrukerVertex-70 spectrometer. Unless otherwise indicated, all measurements were made at room temperature, and the sample concentration was maintained at 2.0 × 10−5 mol L−1.
7
Synthesis and Characterization of Diarylethene 1O
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All solvents used were of spectro-grade
and purified by distillation prior to use. Expect for K1+ and Hg2+ (their counter anions were chloride
ions), other metal ions were obtained by the dissolution of their
respective metal nitrates (0.1 mmol) in distilled water (10 mL). EDTA
was obtained by the dissolution of EDTA disodium salt (Na2EDTA) (1.0 mmol) in distilled water (10 mL).1H NMR and 13C NMR spectra were collected on a Bruker AV400 (400 MHz)
spectrometer with DMSO-d6 as a solvent
and tetramethylsilane (TMS) as an internal standard. UV/vis spectra
were measured on an Agilent 8453 UV/vis spectrophotometer. Fluorescence
spectra were recorded with a Hitachi F-4600 fluorescence spectrophotometer.
The fluorescence quantum yield was measured with an absolute PL quantum
yield spectrometer QY C11347-11. IR spectra were collected on a Bruker
Vertex-70 spectrometer. MS analysis was performed on an Agilent 1100
ion trap MSD spectrometer. Melting point was measured using a WRS-1B
melting point apparatus. Photoirradiation experiments were performed
using an SHG-200 UV lamp, Cx-21 ultraviolet fluorescence analysis
cabinet, and a BMH-250 visible lamp. Synthesis of diarylethene1O is shown in Scheme 3 .
and purified by distillation prior to use. Expect for K1+ and Hg2+ (their counter anions were chloride
ions), other metal ions were obtained by the dissolution of their
respective metal nitrates (0.1 mmol) in distilled water (10 mL). EDTA
was obtained by the dissolution of EDTA disodium salt (Na2EDTA) (1.0 mmol) in distilled water (10 mL).1H NMR and 13C NMR spectra were collected on a Bruker AV400 (400 MHz)
spectrometer with DMSO-d6 as a solvent
and tetramethylsilane (TMS) as an internal standard. UV/vis spectra
were measured on an Agilent 8453 UV/vis spectrophotometer. Fluorescence
spectra were recorded with a Hitachi F-4600 fluorescence spectrophotometer.
The fluorescence quantum yield was measured with an absolute PL quantum
yield spectrometer QY C11347-11. IR spectra were collected on a Bruker
Vertex-70 spectrometer. MS analysis was performed on an Agilent 1100
ion trap MSD spectrometer. Melting point was measured using a WRS-1B
melting point apparatus. Photoirradiation experiments were performed
using an SHG-200 UV lamp, Cx-21 ultraviolet fluorescence analysis
cabinet, and a BMH-250 visible lamp. Synthesis of diarylethene
8
Synthesis and Characterization of Compound 1
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All the chemicals were used without further purification. Compound 1 was synthesized according to a method described in the literature.17 (link) Tetrahydrofuran (THF) was dried over and distilled from the K–Na alloy under an atmosphere of dry argon. 1H and 13C NMR spectroscopy were conducted using the Varian Mercury 300 spectrometer, in which tetramethylsilane (TMS; δ = 0 ppm) served as the internal standard. The ultraviolet-visible (UV-visible) spectra were obtained using the Shimadzu UV-2550 spectrometer. The fluorescence spectra were acquired using the Hitachi F-4600 fluorescence spectrophotometer. The mass spectrum was obtained by Thermo DSQ II. Elemental analysis was performed by the CARLOERBA-1106 microelemental analyzer. ESI determination was carried out using the Finnigan LCQ advantage mass spectrometer. The HR-MS spectrum was obtained using the GCT premier CAB048 mass spectrometer (Scheme 1 ).
9
Fluorescence Spectroscopy Protocol for Probe Analysis
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Fluorescence detection was performed using an F-4600 fluorescence spectrophotometer (HITACHI, Japan) at room temperature (25 °C). For excitation and emission scans of the tested probes, the emission or excitation values were set according to previous literature [8 (link),[17] (link), [18] (link), [19] (link), [20] (link)]. For NocPer, the excitation spectra were recorded from 380 to 510 nm with an emission wavelength of 525 nm, and the emission spectra were recorded from 500 to 600 nm with an excitation wavelength of 465 nm. Following initial fluorescence spectrum recording, various amounts of additives were added to the reaction mixture and the spectra were immediately remeasured. The excitation and emission slits were both set to 5 nm, the wavelength scan speed was 2400 nm/min, and the photomultiplier tube (PMT) voltage was 700 V.
10
Calcium-Induced Peptide Conformational Changes
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Fluorescence spectroscopy was utilized to investigate the conformational changes of the peptide chelating with calcium ions by a Hitachi F-4600 fluorescence spectrophotometer (Hitachi Co., Tokyo, Japan). The excitation wavelength was 285 nm and the emission wavelengths between 250 and 400 nm were recorded. The slit width of excitation and emission was 20 and 30 nm respectively, and the sensitivity was 1. The preparation of sample was the same as that of ultraviolet spectroscopy analysis.
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