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Apex 2 duo diffractometer

Manufactured by Bruker

The APEX II Duo diffractometer by Bruker is a versatile X-ray diffraction instrument designed for material analysis. It is capable of performing single-crystal and powder diffraction experiments to characterize the crystallographic structure of various materials.

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4 protocols using apex 2 duo diffractometer

1

Analytical Characterization of Organic Compounds

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Melting
points were
determined in a Cole–Palmer apparatus and are uncorrected.
TLC was performed on Merck aluminum-backed plates coated with 0.2
mm thick silica gel 60 F254. Column chromatography was
carried out on silica gel 70–230 or 230–400 mesh from
Sigma-Aldrich, eluting with mixtures of increasing polarity of n-hexane/methylene chloride or n-hexane/ethyl
acetate. Electronic impact mass spectra (EIMS) were obtained in a
JEOL JMS-AX505HA spectrometer with an ionization potential of 70 eV.
DART and high-resolution electro-spray ionization mass spectra (HRESIMS)
were obtained in an AccuTOF JMS-T100LC spectrometer. IR spectra were
recorded using a Bruker Tensor 750 FT-IR spectrophotometer. The specific
rotation was determined on a PerkinElmer 343 polarimeter using chloroform
as the solvent and sodium D line as the source of light. 1H, 13C, and bidimensional NMR spectra were recorded in
Bruker Avance III (400/100 MHz), Bruker Fourier (300/75 MHz), and
Jeol Eclipse (300/75 MHz). HPLC was carried out in a Thermo Scientific
Ultimate 3000 chromatographer using analytical C18 (5 μm, 100
Å, 15 × 4.6 mm, 5 μm). The HPLC-grade solvents employed
(iPrOH, MeOH, MeCN) were from the brand Fermont.
The X-ray data were collected on a Bruker APEX II Duo diffractometer.
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2

X-ray Diffraction with Cu Kα Radiation

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Data were recorded on Bruker APEX-II DUO diffractometer using Cu Kα radiation (wavelength = 1.54178 Å) and a graphite monochromator.
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3

X-ray Crystallography of Borane Compounds

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For crystals of 4a and 4b, X-ray diffraction data were collected at 120 K with a Bruker ApexII DUO diffractometer using graphite monochromatic Cu-Kα and Mo-Kα radiation, respectively. Using Olex2,60 the structures were solved with the ShelXT61 (link) structure solution program using intrinsic phasing and refined with the XL62 refinement package using least-squares minimization. Hydrogen atom of the BH group in 4b was found in the difference Fourier synthesis while positions of other hydrogen atoms were calculated, and they all were refined in the isotropic approximation within the riding model. Crystallographic data and structure refinement parameters are given in Table S1. CCDC 2020560 and 2020559 contain the supplementary crystallographic data for 4a and 4b, respectively.
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4

Single Crystal X-Ray Diffraction

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Bruker Kappa APEXII DUO diffractometer

54637 measured reflections

7810 independent reflections

5762 reflections with I > 2σ(I)

Rint = 0.045

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