Jem f200 microscope

Room-temperature and variable temperature XRD patterns were acquired using a Rigaku SmartLab X-ray diffractometer (9 KW) by CuKα radiation (λ = 1.5406 Å). The crystal structures were refined employing Rietveld refinement method through the General Structure Analysis System program. Scanning electron microscope (SEM) images were captured using a JEOL JSM-7800F microscope. HRTEM observations, SAED patterns, HAADF-STEM images, elemental mapping distribution, and energy dispersive X-ray spectrometry (EDS) were obtained utilizing a JEOL JEMF200 microscope. For the preparation of TEM samples, the phosphors were dispersed in ethanol, then dropped on a copper grid and dried on a hot plate (423 K), and tested on small crystals. Impurity element analysis was performed using an ICP-MS spectrometer equipped with an Agilent 7850 spectrometer. X-ray photoelectron spectroscopy (XPS) analysis was performed on a Thermo Fischer ESCALAB 250Xi XPS microprobe with monochromatic Al Kα (hν = 1486.6 eV) radiation as the X-ray source. Electron paramagnetic resonance (EPR) spectra were measured using a Bruker A300 spectrometer operating at a frequency of 9.2 GHz. PFM hysteresis loops were measured using a Bruker Multimode 8 atomic force microscope.

The morphology of the materials was confirmed by scanning electron microscopy (SEM) and transmission electron microscopy (TEM) images, which were obtained using a Carl Zeiss SIGMA field-emission scanning electron microscope and a JEOL JEM-F200 microscope, respectively. X-ray diffraction (XRD) patterns were evaluated by the Bruker New D8-Advance, which operated at 40 kV and 40 mA using CuKa radiation (1.5406 Å), to verify the crystalline part of the materials. To identify the components of each sample, X-ray photoelectron spectroscopy (XPS) was conducted using the Thermo Fisher Scientific K-alpha + instrument that set the carbon peak as standard (C 1 s = 284.5 eV). The surface area was measured from the BET nitrogen adsorption/desorption isotherms using a Micromeritics 3Flex analyzer. The pore volume and diameter were calculated by exploring the desorption of the isotherm using the Barrett–Joyner–Halenda (BJH) method. The functional groups and binding of elements were analyzed by Fourier-transform infrared (FT-IR) spectroscopy using a Thermo Scientific (Waltham, MA, USA) Nicolet 6700 spectrometer.

Transmission electron microscopy (TEM) measurements were conducted on Hitachi HT-7700 with the accelerating voltage of 120 kV. High resolution transmission electron microscopy (HRTEM) was performed on a JEOL JEM-F200 microscope with an accelerating voltage of 200 kV. X-ray diffraction (XRD) patterns were acquired from a Rigaku Powder X-ray diffractometer with the Cu Kα radiation, and X-ray photoelectron spectra (XPS) were obtained on a Thermo Electron Model K-Alpha with Al Kα as the excitation sources.

The X-ray diffraction (XRD) was performed on the X’Pert-Pro MPD diffractometer with monochromatic Cu Kα radiation (λ = 1.541 Å). Cryogenic (scanning) transmission electron microscopy (cryo-(S)TEM) characterizations were carried out using a JEOL JEM-F200 microscope under cryogenic temperatures (− 180 °C) at 200 kV. The cycled graphite powder samples were scraped from the cycled graphite electrodes rinsed with DMC and loaded on the TEM grids. Then, the grid was transferred into the cryo-holder (Fischione 2550) in an Ar-filled glove box. Using a sealed container, the cryo-holder was quickly inserted into a JEOL JEM-F200 microscope. Liquid nitrogen was poured into the cryo-holder, and the sample temperature dropped and stabilized at about − 180 °C. The lattice spacings of graphite and other inorganic species were measured by Digital Micrograph (DM, Gatan) software. Inverse fast Fourier transform (iFFT) was performed to improve the signal-to-noise ratio. Strain analysis was performed based on the geometric phase analysis (GPA) method [23 (link), 24 (link)] using the FRWR tools plugin (www.physics.hu-berlin.de/en/sem/software/software_frwrtools) in DM. ImageJ software was used to color the image except for the distortion region by contrast difference, and the defect fraction was obtained by counting the area ratio of the uncolored part to the whole area.