Thermo k alpha
The Thermo K-Alpha is an X-ray photoelectron spectroscopy (XPS) system. It is designed to analyze the chemical composition and electronic structure of material surfaces.
Lab products found in correlation
10 protocols using thermo k alpha
Electrolytic Synthesis of CD Nanoparticles
Characterization of Carbon Quantum Dots
Comprehensive Magnetite Characterization
Characterization of PMS/Mn3O4 Catalytic Materials
Surface Chemical Composition Analysis by XPS
Characterizing Magnetic Nanoparticles using Advanced Techniques
X-ray photoelectron spectroscopy (XPS) was used to characterize the chemical composition of MNP modified QTF, anti-IgG loaded MNP modified QTF, and after IgG detection with anti-IgG loaded MNP modified QTF. A Thermo K-Alpha (Thermo Fisher Sci., Waltham, MA, USA) instrument and a Thermo K-Alpha monochromatic high-performance XPS spectrometer (Thermo Fisher Sci., Waltham, MA, USA) at a pressure of 1 × 10 -9 torr were used for XPS characterization. A 400 µm spot size was used per sample.
Structural and Magnetic Properties of FeND
A superconducting quantum interference device (SQUID, Quantum Design, MPMS-SQUID-VSM, USA) was used to determine the magnetism exhibited by FeND. Specimens were packaged in plastic bags and measured at ambient temperature with a maximum applied magnetic field of 2 T.
Characterization of CoP@ZIF-8/pNF Electrocatalyst
Additionally, CoP@ZIF-8 was scraped off the pNF by continuous ultrasound in an anhydrous ethanol solution. The powder was then collected by centrifugation before being washed and dried. The resulting sample was used for XRD, TEM and XPS characterization. To measure the interior, the powder sample was etched by Ar plasma using a precision ion polishing system (Gatan 695, Pleasanton, CA, USA) for XPS testing.
Electrochemical and XPS Analysis of Materials
X-ray photoelectron spectroscopy (XPS) experiments were performed using a Thermo K Alpha (Thermo Scientific) spectrometer (operating at ≈ 10 -8 -10 -9 Torr), a 180° double focusing hemispherical analyzer running in constant analyzer energy (CAE) mode with a 128-channel detector. A mono-chromated Al Kα radiation source (1486.7 eV) was used. Peak fitting was performed with XPS Peak Fit (v. 4.1) software using Shirley background subtraction. Peaks were referenced to the adventitious carbon C1s peak (284.6 eV) and peak areas were normalized to the photoelectron cross-section of the F1s photoelectron signal using atomic sensitivity factors. 21
Structural Characterization of Glass Composition
X-ray photoelectron (XPS; Thermo K-alpha; Thermo Fisher Scientific) spectroscopy was used to study the structural coordination of molybdenum (Mo 3d) and neodymium (Nd 3d and Nd 4d) in glasses. The glasses were fractured prior their analysis by XPS. All the spectra were deconvoluted in CASA XPS software using Gaussian-Lorentzian peak fitting after Shirley background subtraction. 30 The deconvolutions were carried out subject to the constraint of a constant full width half maxima (FWHM) for the same element. All photoelectron binding energies were referenced to adventitious C 1s contamination peaks at a binding energy of 285.0 eV.
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