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200 μm optical fibers

Manufactured by OceanOptics

The 200 μm optical fibers are designed for a variety of laboratory applications. They provide a core diameter of 200 micrometers, allowing for the efficient transmission of light signals. These fibers are constructed with high-quality materials to ensure reliable performance and durability in a laboratory setting.

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2 protocols using 200 μm optical fibers

1

Spectroscopic and Microscopic Analysis of Samples

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Absorbance spectra were collected using a USB 2000 + UV-Vis spectrometer with illumination from a HL-2000 Tungsten-Halogen light source guided through 200 μm optical fibers (Ocean Optics, Dunedin, FL). Mass spectra were acquired as an average of 60 laser shots using a Voyager-DE STR MALDI-TOF mass spectrometer (Applied Biosystems, Framingham, MA) operating in positive reflector mode at an accelerating voltage of 20 kV. Scanning electron microscopy (SEM) was performed on an FEI NNS450 SEM (Hillsboro, OR) in CFAMM at UC Riverside. For SEM analysis, all samples were sputtered with a Pt/Pd mixture for 30 s to enhance contrast and prevent titania sample charging. Atomic force microscopy was conducted on a Veeco Dimension 5000 (Santa Barbara, CA) under tapping mode at a scan rate of 1 Hz.
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2

Spectroscopic and Microscopic Analysis of Samples

Check if the same lab product or an alternative is used in the 5 most similar protocols
Absorbance spectra were collected using a USB 2000 + UV-Vis spectrometer with illumination from a HL-2000 Tungsten-Halogen light source guided through 200 μm optical fibers (Ocean Optics, Dunedin, FL). Mass spectra were acquired as an average of 60 laser shots using a Voyager-DE STR MALDI-TOF mass spectrometer (Applied Biosystems, Framingham, MA) operating in positive reflector mode at an accelerating voltage of 20 kV. Scanning electron microscopy (SEM) was performed on an FEI NNS450 SEM (Hillsboro, OR) in CFAMM at UC Riverside. For SEM analysis, all samples were sputtered with a Pt/Pd mixture for 30 s to enhance contrast and prevent titania sample charging. Atomic force microscopy was conducted on a Veeco Dimension 5000 (Santa Barbara, CA) under tapping mode at a scan rate of 1 Hz.
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