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T6400

Manufactured by Horiba

The T6400 is a versatile lab equipment designed for a range of analytical applications. It features precise measurement capabilities and reliable performance. The core function of the T6400 is to provide accurate and consistent data for researchers and laboratory professionals.

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2 protocols using t6400

1

Raman Spectroscopy of Materials

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Raman measurements
were carried out
using a Horiba T6400 instrument in a single spectrometer configuration
with an 1800 L/mm grating and a Si charge-coupled device cooled by
liquid nitrogen. The laser excitation, operated at 532 nm wavelength
and 6 mW power to avoid heat-induced degradation of the sample, was
focused onto the specimen using a 100×/0.9 NA objective, which
was also used to collect the Raman signal in the so-called backscattering
geometry.
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2

Comprehensive Characterization of Material Properties

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The morphological features of the samples were characterized using a field-emission scanning electron microscope (SEM, FEI Quanta 200 FEG) and transmission electron microscope (TEM, JEOL 2011). Elemental distribution mapping was performed by energy dispersive spectroscopy (EDS) coupled with SEM. The crystal structure was determined by X-ray diffraction (XRD, Rigaku D/max 2500) with Cu Kα radiation (k = 1.5406 Å) operating at 40 kV. Raman measurements were performed by laser Raman spectroscopy (Jobin Yvon, T6400). X-ray photoelectron spectroscopy (XPS) was carried out using an AXIS ULTRA DLD instrument with aluminum Kα X-ray radiation. The resistance test was carried out on a semiconductor powder resistance tester ST2722 (JINGGE Electronics Co., Ltd, Suzhou, China). The Brunauer–Emmett–Teller (BET) specific surface area and pore features were determined using nitrogen adsorption desorption (JW-BK 122W, JWGB, China) at 77 K.
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