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Jsm 7610f field emission instrument

Manufactured by JEOL

The JSM-7610F is a field emission scanning electron microscope (FE-SEM) manufactured by JEOL. It is designed to provide high-resolution imaging and analysis capabilities for a wide range of applications. The JSM-7610F utilizes a field emission gun to generate a high-brightness electron beam, enabling the user to achieve high-resolution imaging with minimal beam damage to the sample.

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2 protocols using jsm 7610f field emission instrument

1

Comprehensive Material Characterization

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UV–vis–NIR spectra were
obtained by using a Shimadzu UV-1900 spectrophotometer. SEM images
were obtained by using a JEOL JSM-7610F field emission instrument.
TEM images were obtained by using a JEOL JEM-2100 field emission TEM.
The STEM images were captured with a high-angle annular dark-field
(HAADF) detector. Energy-dispersive X-ray spectroscopy (EDS) is affiliated
with TEM. The X-ray diffraction (XRD) patterns of the samples were
obtained using an X-ray powder diffractometer (Rigaku TTRAX III).
XPS analysis was obtained using a high-resolution electron spectrometer
(ULVAC-PHI).
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2

Characterization of Nanomaterials

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Shimadzu UV-1900 spectrophotometer was employed for collecting UV–vis spectra. Scanning electron microscope (SEM) images were obtained using a JEOL JSM-7610F field emission instrument. Transmission electron microscope (TEM) images were obtained using a JEOL JEM-2100 field emission TEM. Atomic force microscopy (AFM) image was collected by Bruker Dimension Icon AFM in light tapping mode.
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