UV-vis-NIR absorption spectroscopy was conducted on a PerkinElmer Lambda 1050 spectrophotometer at various temperatures for both solution and solid states. Steady-state photoluminescence spectra were recorded though an Edinburgh Instruments FLSP920 double-monochromator luminescence spectrometer equipped with a nitrogen-cooled near-IR sensitive photomultiplier (Hamamatsu).
Flsp920 double monochromator luminescence spectrometer
Manufactured by Hamamatsu Photonics
The FLSP920 double-monochromator luminescence spectrometer is a laboratory instrument designed for the analysis of luminescence properties. It features a double-monochromator system to provide high-resolution spectral analysis of luminescent samples. The core function of the FLSP920 is to measure and analyze the emission spectrum of luminescent materials.
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Lab products found in correlation
Nitrogen cooled near ir sensitive photomultiplier, by Hamamatsu Photonics (2 mentions)
Lambda 1050 spectrophotometer, by PerkinElmer (1 mentions)
Lambda 900 uv vis nir spectrophotometer, by PerkinElmer (1 mentions)
3d feg microscope, by Thermo Fisher Scientific (1 mentions)
2d phaser, by Bruker (1 mentions)
3 protocols using flsp920 double monochromator luminescence spectrometer
1
Spectroscopic Characterization of Materials
2
Characterization of nanomaterials
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SEM images were recorded by a FEI Quanta 3D FEG microscope, using a 5-kV electron beam and a secondary electron detector. XRD patterns were obtained by a Bruker 2D phaser (Cu Kα radiation, λ = 1.5405 Å). UV-vis-NIR absorption measurements were performed by PerkinElmer Lambda 900 UV-vis-NIR spectrophotometer. Steady-state photoluminescence spectra were measured by Edinburgh Instruments FLSP920 double-monochromator luminescence spectrometer, with a near-infrared photomultiplier (Hamamatsu).
3
Characterization of Thin Film Materials
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A PerkinElmer Lambda 1050 spectrophotometer was used to measure UV–vis–NIR absorption for solution and thin films, and an Edinburgh Instruments FLSP920 double‐monochromator luminescence spectrometer, equipped with a nitrogen‐cooled near‐IR sensitive photomultiplier (Hamamatsu), was utilized to record corresponding photoluminescence. 2D‐GIWAXS was performed based on a Xenocs‐SAXS/WAXS system, where the X‐ray wavelength was 1.5418 Å and the fixed angle was 0.2° for X‐ray irradiation. Before measurement, the thin films spin‐coated from various solutions were annealed at 100°C for 30 min to remove residual solvent.
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