After incubation with heavy metals, the fungal materials (spores) were separated by centrifugation, fixed with 1% glutaric aldehyde (15 min), then treated with 2% OsO4 in phosphate-bufferd saline (PBS, pH 7.4), washed and dehydrated in an increasing ethanol gradient (50%, 80%, 100%) in water. The uncut samples were sprayed with nanogold particles prior to observations with scanning electron microscopy (SEM, model JSM 630 F, Jeol) at 5–15 kV in the secondary electron mode. The sites of metal adsorption and precipitations were observed by using the SEM’s back scattering detector. A silicon peak detected is due to sample fixing on glass slides, traces of chloride and calcium peaks may also arise from the incubation medium. The elemental analysis of microbiomes, spores and cellwalls of EH8, EH10 and EH11 was carried out using eXL EDX-system (Oxford instruments). For this purpose, X-ray quanta were detected by a silicon detector, the data were analyzed using energy dispersive x-ray analysis software and the signals of element specific shells were resolved and annotated using Link-ISIS software5 (link).
Jsm 630 f
Manufactured by JEOL
The JSM 630 F is a high-resolution field emission scanning electron microscope (FESEM) manufactured by JEOL. It provides high-quality images and analysis capabilities for a wide range of applications. The core function of the JSM 630 F is to produce magnified images of small objects or features on the nanometer scale.
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2 protocols using jsm 630 f
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Fungal Spore Characterization by SEM
2
Characterization of Polymer Composites
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To prepare IR samples, a small amount of VCB and GCB (∼1 mg) was mixed with KBr, which was thoroughly crushed using a mortar and pestle. The mixture was transformed into a thin pellet under a pressure of 104 H2O per m2, which was subjected to molecular vibration measurement by a Fourier transform infrared spectrometer (FTIR; JASCO FTIR-620, Japan). To observe the surface morphology of VCB and GCB, a field emission scanning electron microscope (FE-SEM; JEOL JSM-630F) was utilized at an acceleration voltage of 15 kV.
To determine the presence of the POSS component in the SBR samples, infrared spectra were measured under attenuated total reflection (ATR) conditions. Additional characterizations of POSS were carried out by powder X-ray diffractometry (PXRD; Rigaku RINT 2000, Japan) and nuclear magnetic resonance spectrometry (29Si-NMR, AVANCE III 500; Bruker). A thermogravimetry analyzer (STA 409; Netzsch, Japan) was used to examine the thermal stability of composite materials as a function of time. The temperature-dependent weight loss patterns were monitored under a heating rate of 10 °C min−1 from 25 °C to 600 °C in air.
To determine the presence of the POSS component in the SBR samples, infrared spectra were measured under attenuated total reflection (ATR) conditions. Additional characterizations of POSS were carried out by powder X-ray diffractometry (PXRD; Rigaku RINT 2000, Japan) and nuclear magnetic resonance spectrometry (29Si-NMR, AVANCE III 500; Bruker). A thermogravimetry analyzer (STA 409; Netzsch, Japan) was used to examine the thermal stability of composite materials as a function of time. The temperature-dependent weight loss patterns were monitored under a heating rate of 10 °C min−1 from 25 °C to 600 °C in air.
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