Phi1257

Manufactured by PerkinElmer

Sourced in United States

The PHI1257 is a benchtop X-ray Photoelectron Spectroscopy (XPS) system designed for surface analysis. It provides high-resolution surface chemical characterization capabilities.

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Lab products found in correlation

Senterra dispersive raman microscope spectrometer, by Bruker (1 mentions) Spectrum two, by PerkinElmer (1 mentions) Invia raman spectrometer, by Renishaw (1 mentions) Miniflex, by Rigaku (1 mentions)

4 protocols using phi1257

Structural Characterization of Gold Nanorods

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Transmission electron micrography
(TEM) was performed (JEOL JEM 200 CX model operated at 200 kV) to
determine the structure and aspect ratio of the as-synthesized Au
NRs. A high-resolution UV–vis spectrophotometer (MODEL No.
LS 55) was used to measure UV–visible spectra. XPS analysis
was carried out in an ultrahigh vacuum chamber equipped with a hemispherical
electron energy analyzer (PerkinElmer, PHI1257) using nonmonochromatized
Al Kα source. The photoluminescence (PL) and PL mapping were
studied by WITec α 300R+ Confocal PL microscope system (WITec
GnBH, Ulm, Germeny).

Kedawat G., Sharma I., Nagpal K., Kumar M., Gupta G, & Gupta B.K. (2019). Studies of Ultrafast Transient Absorption Spectroscopy of Gold Nanorods in an Aqueous Solution. ACS Omega, 4(7), 12626-12631.

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Raman Analysis and Characterization of Graphene

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Raman analysis of graphene
samples was performed to study the quality of graphene and the number
of layers in graphene by using a Renishaw inVia Raman spectrometer-I
by using 514.5 nm laser with a power of 5 mW with a 50× objective
lens. The structural properties of graphene were investigated using
high-resolution transmission electron microscopy (model Tecnai G2
F30 STWIN) attached with a field emission gun. Electron diffraction
patterns were used to analyze the crystalline nature of graphene.
Electronic measurements were carried out using a Keithley 2634B source
unit. Optical images were captured at different resolutions by using
Olympus MX51. X-ray photoelectron spectroscopy (XPS) was performed
to determine the chemical purity and elemental compositions of the
as-synthesized SLG, which was carried out in an ultra-high-vacuum
chamber equipped with a hemispherical electron energy analyzer (PerkinElmer,
PHI1257) using nonmonochromatized Al Kα source (1486.6 eV) with
a base pressure of 4 × 10^–10 Torr at room temperature.
The surface topography, grain size, and thickness of SLG were examined
by atomic force microscopy (AFM) (model: 5500; Agilent Technologies).
SLG was imaged in noncontact acoustic alternating current mode under
ambient condition.

Kashyap P.K., Sharma I, & Gupta B.K. (2019). Continuous Growth of Highly Reproducible Single-Layer Graphene Deposition on Cu Foil by Indigenously Developed LPCVD Setup. ACS Omega, 4(2), 2893-2901.

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Advanced Material Characterization Techniques

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Scanning electron microscopy (SEM)
images were obtained from a field emission scanning electron microscope
(FE-SEM-JEOL Model-JSM7, Japan), equipped with an energy-dispersive
spectrometer. Before the analysis, a thin layer of a gold and palladium
alloy was evenly coated on the sample. High-resolution transmission
electron microscopy (HR-TEM) images were taken by using a JEOL JEM-200CX
operating at 200 kV. The powder X-ray diffraction (XRD) patterns were
recorded on an X-ray diffractometer (XRD Rigaku, Japan). Raman spectra
were collected using a Bruker Optics Senterra dispersive Raman microscope
spectrometer with a 532 nm laser excitation. X-ray photoelectron spectroscopy
(XPS) spectra of the composite were recorded on a PerkinElmer, PHI1257
(USA), with Al Kα source and excitation energy of 1486.7 eV;
the binding energy was calibrated using C 1s at 284.5 eV. Fourier
transform infrared (FTIR) spectroscopy was performed with a Spectrum
Two (PerkinElmer, USA), equipped with an attenuated total reflection
cell using the KBr pellet method. The porous structures of the materials
were determined using a nitrogen adsorption isotherm obtained from
the BELSORP MAX instrument II (Japan) surface analyzer. The materials
were degassed at 200 °C for 2 h under a high vacuum before the
measurement.

Thakur A.K., Sengodu P., Jadhav A.H, & Malmali M. (2024). Manganese Carbonate/Laser-Induced Graphene Composite for Glucose Sensing. ACS Omega, 9(7), 7869-7880.

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Structural and Morphological Characterization of TiO2 Nanotubes

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For phase identification and gross structural analysis, the structural
characterization was performed using X-ray diffractometer (XRD, Rigaku:
MiniFlex, Cu Kα₁,
λ = 1.5406 Å). The
surface morphology, length and diameter of TiO₂ nanotubes were
determined by scanning electron microscopy (SEM, Model No. EVO-MA 10 VPSEM). The
microstructural studies were carried out using high-resolution transmission
electron microscopy (HRTEM, Model No. Technai G20-twin, 300 kv with
super twin lenses having point and line resolution of 0.144 nm and
0.232 nm, respectively) equipped with energy dispersive x-ray
analysis (EDAX) facility. Raman spectra were obtained using Renishaw InVia Raman
spectrometer, UK with an excitation source of 514.5 nm. The XPS
analysis was carried out in an ultra-high vacuum (UHV) chamber equipped with a
hemispherical electron energy analyzer (Perkin Elmer, PHI1257) using
non-monochromatized Al Kα source (excitation energy of
1486.7 eV) with a base pressure of
4 × 10⁻¹⁰ torr
at room temperature. The work function has been evaluated through open-counter
photoelectron emission (PEE) spectroscopy system.

Agrawal Y., Kedawat G., Kumar P., Dwivedi J., Singh V.N., Gupta R.K, & Gupta B.K. (2015). High-Performance Stable Field Emission with Ultralow Turn on Voltage from rGO Conformal Coated TiO2 Nanotubes 3D Arrays. Scientific Reports, 5, 11612.

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