Jem 6510

X-ray diffraction (Smart Lab, Rigaku, Tokyo, Japan) analysis was used for the composition of the self-made cement without K⁺, Na⁺, and Mg²⁺ and the composition of dolomitic rocks. The length changes of all specimens prepared by different aggregates were measured at different ages and the expansion ratio of all the specimens were calculated by the abovementioned formula. Each length change value used was the mean value of three replicate specimens. The morphologies of aggregate grains enriched dolomite selected from the microbars cured in TMAH solution were also observed by SEM (JEOL, JEM-6510, Tokyo, Japan) coupled with EDS analysis. Orthogonal polarized light microscopy (DM750P, Leica, Germany) was also used to investigate the cracks as a result of ACR.

X-ray diffraction (Smart Lab, Rigaku, Tokyo, Japan) analysis was used for the composition of self-made cement without K⁺ and Na⁺ and the mineralogical detection of dolomitic rocks. The length changes of all the specimens prepared by BFL-1 and BFL-9 aggregates were measured at different intervals and the expansions of modified microbars were calculated by JC/T 313–2009 (Chinese Standard). Each length change value used was the mean value of five replicate specimens. The porosities and pore size distribution of original and reacted aggregates were tested by mercury intrusion porosimetry (MIP). Corresponding thermo-gravimetric analysis was carried out by thermal gravimetric analyser (SDT Q600) at temperatures ranging from 20 to 950°C with N₂ ambience. The morphologies of BFL-9 grains enriched dolomite selected from the modified microbars cured for 140 days were also observed by scanning electron microscopy (SEM, JEOL, JEM-6510) coupled with energy dispersive spectrometer (EDS) analysis.

Mineral grains were characterised using an SEM (JEOL JEM-6510) at Tohoku University. The samples for TEM analysis were prepared by argon-ion milling. A TEM (JEOL JEM-2010) at Tohoku University with an accelerating voltage of 200 kV was used to observe the crystal structure of ZnS minerals. Selected-area electron diffractions, used to examine partial diffraction patterns for areas 400 nm in diameter, were obtained with the TEM. Electron back-scattered diffraction (EBSD) analyses were carried out using an SEM (Hitachi S-3400N) with HKL Technology and Channel 5 software at Tohoku University.