Elemental composition analysis was done using an Oxford EDS detector on FEI Quanta 600 SEM, and results were analyzed using AZtec software by Oxford Instruments. The powdered sample was exposed to a beam, and imaging was done at 20 kV acceleration voltage.
Eds detector
Manufactured by Thermo Fisher Scientific
Sourced in United States
The EDS (Energy Dispersive Spectrometry) detector is an analytical instrument used in electron microscopy applications. Its core function is to detect and analyze the X-rays emitted by a sample when exposed to an electron beam, allowing for the identification and quantification of the elements present in the sample.
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4 protocols using eds detector
1
Elemental Composition Analysis via SEM
2
Quantitative Analysis of Ag Nanoparticles
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Transmission electron microscopy (TEM) and STEM-EDS were performed on a TALOS (FEI, Hillsboro, Oregon, USA) field emission gun transmission electron microscope equipped with an FEI EDS detector and a high angle annular dark-field (HAADF) detector operating at 200 kV. For qualitative elemental chemical analysis, ESPRIT software from Bruker was used. Conventional TEM bright field images and STEM HAADF (Z-contrast) images were taken at different regions along the nanosheet in order to obtain the average particle size as well as the particle size distribution of Ag in the matrix (silver sulfur and carbon matrix). By analyzing different areas of the film across its thickness, the Feret diameters of several particles were calculated based on STEM-HAADF imaging. ImageJ and Digital Micrograph software were then used for particle size analysis as well as the particle shape analysis (circularity). The quantitative statistical analysis of the images is performed in order to characterize the particle size (Feret diameter) (d), standard deviation in size (σ), circularity (c).
3
Quantitative Elemental Analysis via SEM-EDS
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SEM analysis was performed using FEI QUANTA 650 FEG (ThermoFisher Scientific, Oregon, USA). Microphotographs were taken under pressure of 50 Pa and HV of 10.00 kV. X-ray microanalysis of the materials was performed using the energy dispersive spectroscopy method, using the FEI QUANTA 650 FEG microscope, equipped with an EDS detector (Thermo Fisher Scientific, Portland, OR, USA).
4
Microstructural Analysis of Ti6Al4V Lattice and Zn–2%Fe Alloy
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The microstructure of the tested materials was examined using JSM-5600 (Tokyo, Japan) scanning electron microscopy (SEM) integrated with an energy dispersive X-ray spectroscopy (EDS) detector (Thermo Fisher Scientific, Waltham, MA, USA) for localized chemical composition analysis with a spot size of 1 [35 (link)]. Phase identification was carried out by X-ray diffraction (XRD) analysis, using an X-ray diffractometer (RIGAKU-2100H (Tokyo, Japan) with Cu–K . Diffraction patterns were generated in the range of 20°–90° at 40 kV, 30 mA, and a scanning rate of 0.02 /min. The additively manufactured Ti6Al4V lattice and biodegradable Zn–2%Fe alloy were separately tested as monolithic bulk materials. In order to examine the phases composing the interface between the Ti lattice and the biodegradable Zn-based alloy, the OI–TiZn system was tested in the form of powder subsequent to the removal of intact Ti-base lattice rods. Prior to the XRD analysis, the final powder was ground to obtain a fine grain size of about 100 μm.
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