Polydimethylsiloxane (PDMS) substrates with different formulations were used to mimic physiological and pathological conditions: Sylgard®527 ratio 1:1 (E = 11.7 ± 5.4 kPa) and Sylgard®184 (Dow Corning) ratio 1:10 (E = 434.3 ± 54.4 kPa). PDMS Stiffness was determined via AFM (5500 Atomic Force Microscope, Keysight Technologies, Santa Rosa, CA, USA) using a spherical borosilicate glass tip (diameter = 10 μm, stiffness = 0.85 N/m), and Young’s modulus E was calculated using a Hertz contact model. To enable live imaging at high magnification using a 100 × objective, thin (~80 μm) PDMS films were deposited on glass slides, degassed under vacuum for 30 min, cured for 2h at 100°C, and mounted on custom made cell culture dishes. PDMS was then ozone-treated and coated with Matrigel (Geltrex, ThermoFisher) for 1h at 37°C to complex cell attachment sites similar the cardiac basement membrane.
5500 atomic force microscope
Manufactured by Keysight
Sourced in United States
The 5500 Atomic Force Microscope is a laboratory instrument designed for high-resolution imaging and analysis of surface topography at the nanoscale level. It utilizes a sharp probe to scan a sample surface, enabling the capture of detailed three-dimensional images with exceptional resolution.
Automatically generated - may contain errors
4 protocols using 5500 atomic force microscope
1
Mimicking Physiological Conditions with PDMS Substrates
2
Mimicking Physiological Conditions with PDMS Substrates
3
Nanoscale Surface Characterization with AFM
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Atomic Force Microscopy (AFM) measurements were performed by a Keysight Technologies 5500 Atomic Force Microscope. The tapping mode (Mac Mode) in air at room temperature was used. The cantilever material was silicone with a spring constant of 13–77 N/m and radius < 10 nm. Keysight PicoView and Gwyddion software were used to analyse the images, with a surface area of 5 × 5 μm.
4
Nanoparticle Characterization using DLS, AFM, and TEM
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The average particle size
of the nanoparticles was calculated using DLS technique on NanoBrook
90Plus Particle Analyzer. Each DLS measurement is repeated at least
three times and mean value is presented in the report. Standard deviation
calculated from these values have been shown as error bars. AFM analysis
was done using a 5500 Atomic Force Microscope by Keysight Technologies.
TEM imaging of the nanoparticles was performed at the NASA AMES facility
using a Hitachi H-9500 System (operating voltage of the system was
300 kV). COMSOL software was utilized to stimulate and analyze various
fluidic properties of the herringbone-patterned 3D printed MIVM device.
Encapsulation efficiency was calculated from % EE = [(drug added –
free “unentrapped drug”)/drug added] × 100. The
drug loading is 10 or 15% the weight of the PLGA, which represents
10 or 15% drug loading. These measurements were performed in triplicate,
and the standard deviation calculated from the obtained results have
been shown in the figures in the form of error bars.
of the nanoparticles was calculated using DLS technique on NanoBrook
90Plus Particle Analyzer. Each DLS measurement is repeated at least
three times and mean value is presented in the report. Standard deviation
calculated from these values have been shown as error bars. AFM analysis
was done using a 5500 Atomic Force Microscope by Keysight Technologies.
TEM imaging of the nanoparticles was performed at the NASA AMES facility
using a Hitachi H-9500 System (operating voltage of the system was
300 kV). COMSOL software was utilized to stimulate and analyze various
fluidic properties of the herringbone-patterned 3D printed MIVM device.
Encapsulation efficiency was calculated from % EE = [(drug added –
free “unentrapped drug”)/drug added] × 100. The
drug loading is 10 or 15% the weight of the PLGA, which represents
10 or 15% drug loading. These measurements were performed in triplicate,
and the standard deviation calculated from the obtained results have
been shown in the figures in the form of error bars.
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