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Slide on microtip ge atr crystal

Manufactured by Thermo Fisher Scientific
Sourced in United States

The Slide-On MicroTip Ge ATR crystal is a specialized accessory for infrared spectroscopy instrumentation. It provides a small-volume attenuated total reflectance (ATR) sampling interface for analyzing solid or liquid samples. The Ge crystal offers high refractive index for effective sample contact and analysis.

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2 protocols using slide on microtip ge atr crystal

1

Spectroscopic Characterization of Photoactive Materials

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To characterize the photoexcitation and photodynamic properties of these materials, spectroscopic examinations were conducted by the AvaSpec-3648 spectrophotometer with 2 nm spectral resolution (Avantes Inc., Apeldoorn, The Netherlands) in the transmission mode with deuterium-halogen lamp (AvaLight-DH-S-BAL Avantes Inc., Apeldoorn, The Netherlands). The ATR-FTIR spectra of photoactive materials deposited on the slide glass were obtained using a Nicolet iN10 infrared microscope (Thermo Fisher Scientific, Waltham, MA, USA) equipped with liquid nitrogen-cooled mercury cadmium telluride (MCT-A) detector and Slide-On MicroTip Ge ATR crystal. The microscope was continuously purged with dry air. All spectra were collected in the range of 3750–675 cm−1 with a spectral resolution of 4 cm−1, averaging 128 scans. Directly before sampling, the background spectrum of germanium/air was recorded as a reference (256 scans, 4 cm−1). All spectra were registered at room temperature. Each sample was measured three times and then averaged to cover variation in material thickness. All spectra were analyzed using OriginPro (ver. 2019, OriginLab Corporation, Northampton, MA, USA).
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2

Attenuated Total Reflectance Analysis on Samples

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The ATR analysis was performed on a Nicolet iN10 by Thermo Fischer Scientific (Waltham, MA, USA) with a Slide-On MicroTip Ge ATR crystal (throughput > 50%, 27° average angle). The detector was cooled with liquid nitrogen. The samples were tested after the drop test with the commercial products and after the aggressive drop test in the oven. A reference on the backside of the sample was first measured, followed by a measurement on the zone of the sample affected by the drop. Each time the background of air was taken before measuring the samples with an acquisition time of 51 s and a total number of acquisitions equal to 256.
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