Cm 20 super twin microscope
The CM-20 Super Twin microscope is a high-performance laboratory instrument designed for various imaging applications. It features a twin-lens optical system that enables simultaneous observation and photographic recording. The microscope offers advanced capabilities for magnification and resolution, making it suitable for a wide range of scientific and research endeavors.
Lab products found in correlation
3 protocols using cm 20 super twin microscope
Synthesis and Characterization of Titania Nanoparticles
Characterization of nHAP Nanoparticles
Characterization of Synthesized Materials
crystal structure of synthesized materials was characterized by the
X-ray Diffraction (XRD) technique using an X’Pert PRO X-ray
diffractometer (Cu Kα1, 1.54060 Å) (PANalytical). Measured
XRD patterns were compared to standards of YVO4 (no. 78074)
and YPO4 (no. 79754) found in the Inorganic Crystal Structure
Database (ICSD). Microstructural analyses (particle size, morphology)
were performed by electron microscopy. SEM was carried out using an
FEI Nova NanoSEM 230. High resolution transmission electron microscopy
(HR-TEM) was performed using a Philips CM-20 Super Twin microscope.
ICP-OES measurements were conducted on Thermo Scientific ICAP 7000
SERIES.
About PubCompare
Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.
We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.
However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.
Ready to get started?
Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required
Revolutionizing how scientists
search and build protocols!