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56 protocols using s 4200

1

Characterization of Curcumin-Loaded Microspheres

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Curcumin encapsulated microspheres were characterized for size and morphology by scanning electron microscopy (SEM, Hitachi S-4200, Hitachi Ltd, Tokyo, Japan). The microspheres were suspended in a water drop and placed on a double sided carbon tape attached to an aluminum stub, air dried, and then sputter coated with gold for 30 seconds. Curcumin encapsulation was confirmed by fluorescent microscopy using a Nikon Eclipse Ti inverted fluorescence microscope (Nikon Instruments Inc., Melville, NY). To do so, microspheres were suspended into a water drop on a glass slide and imaged after covering with a glass cover slip. Drug loading in the microspheres was determined by fully dissolving microspheres in DMSO (1 mg/mL) overnight, centrifuging at 16,500×g for 3 min, and quantifying the curcumin concentration in the supernatant using fluorescence of curcumin (excitation 488 nm, emission 535 nm) in a plate reader (Tecan Group Ltd., Mannedorf, Switzerland). Drug loading and encapsulation efficiency were calculated from the extracted curcumin using established methods [42 (link)]. Size of the microspheres was quantified using ImageJ 1.45s software (Freeware, NIH, Bethseda, MD) by measuring SEM diameters of >100 microspheres.
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2

Characterization of Electron Beam-Irradiated Bone Materials

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After the irradiation of all specimens under strict dose calculations (Figure 2), all specimens were analyzed in vitro by elementary analysis with an EA 1110® elementary analyzer (CE instruments Co., Milan, Italy) using cold field emission. To observe the changed ultra-structures and to detect their elementary components, a Leo1455VP-SEM® (Carl Zeiss Inc., Aalen, Germany) scanning electron microscope (SEM), and S-4200® (Hitachi Co., Tokyo, Japan) field emission scanning electron microscope (FE-SEM) were also used. For the analysis of the molecular changes after EBI, 8D advance® (Bruker Co., Berlin, Germany) X-ray diffraction (XRD) analysis was performed. The three-dimensional changes on the surfaces of the specimen were evaluated with a LSM 5 Pascal® (Carl Zeiss Inc., Aalen, Germany) confocal laser scanning microscope (CLSM).

Basic study designs showing the electron beam irradiated bone materials, according to their origin, energy, and radiation dose.

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3

Visualizing Nanoparticle Skin Penetration

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The 3D skins were freeze-dried, after which the keratinized cell surface was observed by scanning electron microscopy (S-4200, Hitachi, Japan). FITC-labeled nanoparticles were treated on 3D skin to observe the side view of the epidermal layer. Briefly, 1 mg/ml FITC solution was prepared and mixed with FITC (Sigma Aldrich, USA) and 200 mM sodium bicarbonate (Thermos Fisher Scientific, USA). After centrifuging 1 ml of chitosan-coated ceramide nanoparticle for 30 min at 4 °C, the supernatant was removed and the collected nanoparticles were resuspended in 1 ml FITC solution, then reacted for 1 h at RT. FITC-labeled nanoparticles were collected by centrifugation for 30 min at 4 °C, after which they were washed with distilled water. Following another round of centrifugation, the resuspended nanoparticles in PBS were dropped on the prepared 3D skin for 1 h at 37 °C. Finally, the 3D skin was washed with PBS and sectioned into OCT blocks. The epidermis morphology was then observed by confocal microscopy.
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4

Meridianin C Treatment on YD-10B Cells

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YD‐10B cells were seeded in 6‐well plates (0.5 × 106 cells/2 mL/well) the day before meridianin C treatment. Cells were then treated with vehicle control (DMSO) or 1 μM meridianin C for 2 h. The conditioned cells were centrifuged, fixed in 0.5% glutaraldehyde and 0.5% paraformaldehyde fixative, washed with 0.1 M phosphate‐buffered saline (PBS), and post‐fixed with 1% osmium tetroxide solution for 1 h. 2% tannic acid was used to conductively stain for 12 h, later washed with PBS, and fixed with 1% osmium tetroxide solution for 1 h. The specimens were dehydrated with ethanol, t‐butyl alcohol and freeze dryer. Finally, the specimen was sputter coated with platinum‐palladium (Pt‐Pd) in an ion coater for 2 min, followed by microscopic examinations (S‐4200, Hitachi Co., Tokyo, Japan).
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5

Characterization of Nanomaterial Structures

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Crystal structure of the prepared samples was characterized by X-ray diffraction (XRD, Bruker-D8-AXS diffractometer, Germany) with Cu-Kα radiation at a setting of 40 kV and 150 mA. The images were captured using a transmission electron microscope (TEM) with a Jeol JEM-1230 apparatus operating at 120 kV. With the same EDAX detector, an energy-dispersive X-ray (EDx) study was performed (SEM, Hitachi S-4200). The chemical compositions (Axis Ultra DLD, Kratos) were performed using X-ray photoelectron spectroscopy (XPS) with a 325 nm excitation wavelength. At room temperature, UV–visible absorption studies were conducted by the UV‒Vis 2450 (Shimadzu) spectrophotometer to record diffuse reflectance spectra (DRS). The photoluminescence (PL) spectra were carried out with a fluorescent spectrophotometer (HORIBA-Jobin-Yvon).
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Morphological Analysis of Film Surfaces

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Morphology of film surfaces was monitored using SEM (SEM Hitachi S-4200). The accelerated voltage was 15 kV. The surfaces of the films were coated with gold under vacuum before observation.
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7

Characterization of Sintered Biphasic Calcium Phosphate

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The apparent density of the sintered BCP disk samples was measured, from which the porosity was calculated. The microstructure of the disk samples was observed using scanning electron microscopy (S-4200, Hitachi, Tokyo, Japan). The HA:TCP ratio in the BCP samples was analyzed using X-ray diffractometry (X'pert MPD-PRO, Panalytical, Almelo, The Netherlands), which was carried out at 40 kV and 30 mA with a copper target. The compressive strength of the BCP disks was evaluated using a universal test machine (Testometric M350-10CT, Lancashire, England (500 kgf load cell, 0.5 mm/min crosshead speed).
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8

Microstructural Analysis of SnO2 Nanowires

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The microstructure of the pristine and Au-implanted SnO2 nanowires was examined through field-emission scanning electron microscopy (FE-SEM, Hitachi, S-4200) and transmission electron microscopy (TEM, Philips CM-200). The bulk and surface chemistries were characterized through energy-dispersive X-ray spectroscopy (EDS, Oxford INCA energy) installed in the FE-SEM equipment and X-ray photoelectron spectroscopy (XPS, Thermo K-Alpha), respectively. For further elemental analysis, EDS line scans were performed using the EDS analyzer (EDS, Oxford INCA energy) installed in the TEM equipment.
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9

Characterization of Nanomaterials Using Analytical Techniques

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Powder X-ray diffraction (PXRD) analysis is carried out utilizing a PAN analytical X'Pert-PRO MPD with Cu Kα radiation. Scanning Electron Microscopy (SEM) analysis is carried out using a SEM, Hitachi, and S-4200. To record UV absorption spectra, a V-730 double-beam UV-Visible spectrometer is used. A PerkinElmer L1280134 is used to record Fourier Transform Infrared Spectroscopy. The photoluminescence excitation and emission spectra were recorded on a Horiba Fluorolog Spectrofluorometer at room temperature.
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10

Comprehensive Characterization of CdSe Nanoparticles

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CdSe NPs were analyzed by XRD, SEM, TEM, and the Brunauer, Emmett, and Teller (BET) techniques. XRD spectrum was recorded in ambient temperature to ascertain the crystalline phase of the CdSe NPs. To fulfill this task, D8 Advance diffractometer device (Bruker, Hamburg, Germany) was used with Cu Kα radiation (λ = 1.5406 A°). The morphological features of nanoparticles were determined by SEM (S-4200, Hitachi, Ibaraki, Japan). In addition, high-resolution transmission electron microscopy (HR-TEM) pictures of synthesized CdSe NPs were acquired by a Cs-corrected high resolution TEM (JEM-2200FS, JEOL, Tokyo, Japan) operating at 200 kV. A BET test was applied by a Belsorp mini II instrument utilizing nitrogen adsorption/desorption at 77 K (Bel, Osaka, Japan).
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