S 4200
The S-4200 is a scanning electron microscope (SEM) manufactured by Hitachi. It is designed for high-resolution imaging of a wide range of samples. The S-4200 utilizes a field emission gun (FEG) to generate a high-brightness electron beam, enabling detailed observation and analysis of specimen surfaces at the nanometer scale.
Lab products found in correlation
56 protocols using s 4200
Characterization of Curcumin-Loaded Microspheres
Characterization of Electron Beam-Irradiated Bone Materials
Basic study designs showing the electron beam irradiated bone materials, according to their origin, energy, and radiation dose.
Visualizing Nanoparticle Skin Penetration
Meridianin C Treatment on YD-10B Cells
Characterization of Nanomaterial Structures
Morphological Analysis of Film Surfaces
Characterization of Sintered Biphasic Calcium Phosphate
Microstructural Analysis of SnO2 Nanowires
Characterization of Nanomaterials Using Analytical Techniques
Comprehensive Characterization of CdSe Nanoparticles
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