2010 transmission electron microscope

The silver cellulose nanocomposites were characterised by inductively coupled plasma mass spectrometry (ICP-MS), performed on a Perkin Elmer DRC ICPMS ultra trace metal analyser. The structure of the silver/cellulose nanocomposites was studied using X-ray powder diffraction using a Siemens D 5000 X-ray diffractometer fitted with Ni-filtered Cu Kα (λ = 0.154 nm) at room temperature. The diameter d of the spherical nanocrystallites was estimated by using Scherrer's formula, d = kλ/B cos θ, where λ = wavelength of X-rays (0.154 nm), K a constant (0.9), B is the full-width half-maximum of intensity (FWHM) and θ is the peak angle (measured in radians). The average of all four silver peaks observed was used to determine the Ag nanocluster diameter, d. Ultraviolet-visible reflectance spectra were recorded using a Varian Cary 5E Ultraviolet-visible-NIR spectrometer, equipped with a Harrick Praying Mantis solid-state diffuse reflectance accessory. Transmission Electron Microscopy (TEM) images were obtained using a JEOL 2010 transmission electron microscope (JEOL UK Ltd. Welwyn Garden City) running at 120 kV.

Transmission
electron microscopy (TEM) was carried out using a JEOL-2010 transmission
electron microscope (JEOL Co., Japan) with an acceleration voltage
of 200 kV. The samples were coated on a carbon film and dried at 60
°C overnight.

The crystal structure of samples was characterized by powder X-ray diffraction (TD-3000) with Cu–K radiation (λ = 0.1541874 nm) at an angle of 10–70°. FT-IR spectra were recorded with a Thermo Nicolet IS10 FTIR analyzer, and KBr was used as reference. The morphology of the samples was characterized with a JEOL-7500B field emission scanning electron microscope and a JEOL-2010 transmission electron microscope. X-ray photoelectron spectroscopy (XPS) analysis was performed with an Escalab-250xi system. Solid UV-visible spectra were measured with an SP-752 spectrophotometer. Photoluminescence (PL) spectroscopy was performed using a Hitachi F-4700 with excitation wavelength at 350 nm. A Chi 660E electrochemical workstation was used for photochemical characterization. Ag/AgCl and Pt were used as control electrodes, and 0.5 M Na₂SO₄ solution was used as electrolyte. Electron spin resonance (ESR) was measured with a Bruker A-300 spectrometer, and DMPO was used to capture free radical signals during photocatalysis.

Transmission Electron Microscopy (TEM) was performed with a JEOL-2010 transmission electron microscope (JEOL Co., Japan). Fourier Transform Infrared (FTIR) spectroscopy was performed with a PerkinElmer 580B IR spectrophotometer (PerkinElmer, USA). Powder X-ray Diffraction (XRD) was performed with a D8 Focus diffractometer (Bruker Co., Germany). Zeta-potential was measured by a Zetasizer Nano ZS (Malvern Instruments Ltd., UK). Ultraviolet-Visible (UV-Vis) absorption spectra was recorded using a Shimadzu UV-3600 spectrophotometer (Shimadzu Co., Japan). Inductively coupled plasma mass spectrometry (ICP-MS) analysis was performed with an ELAN 9000/DRC ICP-MS system (PerkinElmer, USA). Fluorescence spectra was acquired with a modular spectrofluorometer using Fluorolog-3 (Horiba Jobin Yvon, France). Nitrogen adsorption–desorption isotherms were determined using an Accelerated Surface Area and Porosimetry System (ASAP2020M).