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4k temcam f416

Manufactured by TVIPS

The 4k TemCam-F416 is a high-resolution digital camera designed for transmission electron microscopy (TEM) applications. It features a 4096 x 4096 pixel sensor, enabling the capture of detailed, high-quality images at a resolution of 4K. The camera is optimized for low-dose imaging and delivers fast frame rates, making it suitable for a variety of TEM techniques.

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5 protocols using 4k temcam f416

1

Negative Stain EM of ESCRT-I Subcomplex

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The ESCRT-I TSG101–VPS28 head subcomplex was purified as described above. Void peak fractions from the final size-exclusion step were pooled and diluted to 3.5 μM for negative stain electron microscopy. 5 μl of sample was applied to glow-discharged continuous carbon-coated copper grids (CF400-CU, Electron Microscopy Sciences) and negatively stained with 2 % (w/v) uranyl acetate. Samples were inspected using transmission electron microscopy (Tecnai-12, FEI) operated at 120 keV with a magnification of 49,000×. Images were collected with a charge-coupled device (CCD) detector (4k TemCam-F416, TVIPS).
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2

Vps24 Filament Self-Assembly and Negative Staining

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We concentrated Vps24 to 350 μM for overnight self-assembly at 4 °C18 (link) and we then diluted the resulting filaments to 3.5 μM for negative stain EM. We placed 4 μl droplets of the sample on glow-discharged carbon-coated copper grids and we negatively stained them using 2% (w/v) uranyl acetate solution. We examined the negatively stained samples under a transmission electron microscope (Tecnai-12; FEI) operated at 120 keV and recorded on a charge-coupled device camera (4k TemCam-F416; TVIPS) at a magnification of 49,000×.
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3

Vps24 Filament Self-Assembly and Negative Staining

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We concentrated Vps24 to 350 μM for overnight self-assembly at 4 °C18 (link) and we then diluted the resulting filaments to 3.5 μM for negative stain EM. We placed 4 μl droplets of the sample on glow-discharged carbon-coated copper grids and we negatively stained them using 2% (w/v) uranyl acetate solution. We examined the negatively stained samples under a transmission electron microscope (Tecnai-12; FEI) operated at 120 keV and recorded on a charge-coupled device camera (4k TemCam-F416; TVIPS) at a magnification of 49,000×.
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4

Negative Stain EM of ESCRT-I Subcomplex

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The ESCRT-I TSG101–VPS28 head subcomplex was purified as described above. Void peak fractions from the final size-exclusion step were pooled and diluted to 3.5 μM for negative stain electron microscopy. 5 μl of sample was applied to glow-discharged continuous carbon-coated copper grids (CF400-CU, Electron Microscopy Sciences) and negatively stained with 2 % (w/v) uranyl acetate. Samples were inspected using transmission electron microscopy (Tecnai-12, FEI) operated at 120 keV with a magnification of 49,000×. Images were collected with a charge-coupled device (CCD) detector (4k TemCam-F416, TVIPS).
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5

Purification and Characterization of ESCRT-I

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The ESCRT-I TSG101, VPS28 head subcomplex was purified as described above. Void peak fractions from the final size-exclusion step were pooled and diluted to 3.5 µM for negative stain electron microscopy. 5 µl of sample was applied to glow-discharged continuous carbon-coated copper grids (CF400-CU, Electron Microscopy Sciences) and negatively stained with 2 % (w/v) uranyl acetate. Samples were inspected using transmission electron microscopy (Tecnai-12, FEI) operated at 120 keV with a magnification of 49,000×. Images were collected with a chargecoupled device (CCD) detector (4k TemCam-F416, TVIPS).
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