Cantilevers
Cantilevers are a core component in atomic force microscopy (AFM) instruments. They are small, flexible beams that are used to detect and measure the interactions between a probe tip and a sample surface at the nanoscale level. Cantilevers are designed to respond to very small forces, allowing for high-resolution imaging and measurement of surface topography and properties.
4 protocols using cantilevers
Atomic Force Microscopy of Supported Lipid Bilayers
Atomic Force Microscopy of Self-Assembled Spidroins
force electron microscopy (AFM) measurements, self-assembled recombinant
spidroin dispersions were diluted to 0.1 mg/mL by deionized water.
10 μL of the aqueous solution was then added onto a clean mica
surface for coating for 120 s, followed by purging with nitrogen gas.
The morphologies of the nanoparticles and nanofibrils were observed
by an ICON AFM fast scanning system (Bruker ICON). A silicon tip with
a nominal spring constant of 0.4 N/m (ScanAsyst-Air, Bruker) was used
for the AFM measurements. The mechanical properties of self-assembled
spidroins was measured by a cantilever with a spring constant of ≈34.32
N m–1 and a tip radius of 8 nm. Of note, the spring
constant of the cantilevers (Bruker, Germany) was calibrated by a
sapphire wafer. The morphological and mechanical data of self-assembled
spidroins were processed by the software NanoScope Analysis 1.8.
Surface Characterization by Tapping Mode AFM
Mechanical Characterization of Hydrogels
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