Em ace600 coater
The EM ACE600 coater is a high-performance vacuum evaporation system designed for depositing thin films onto samples. It is capable of producing uniform and controlled coatings, making it suitable for a wide range of applications in materials science, nanotechnology, and electron microscopy.
Lab products found in correlation
12 protocols using em ace600 coater
Ultrastructural Analysis of RABV Infection
Snail Mucus Imaging by SEM-EDS
Scanning Electron Microscopy Cell Imaging
Nanofibrous Layer Morphology Analysis
Preparation of Surfaces for Cell Culture
Sapphire discs (Leica; #16770158) were washed and sonicated in water and then again in pure ethanol. Individual discs were subsequently dried with dry nitrogen gas and placed into a custom-built metal holder. In preparation for the deposition of a thin (approximately 4 nm) carbon-coordinate system, each disc was covered with a SEMF2 finder grid (SPI; #2305C-XA) and the metal holder containing the grids was placed into an EM ACE600 coater (Leica). Carbon-coated discs were baked for 12h at 120°C, and then stored at room temperature until use. On the culture day, discs were briefly sterilized by UV-exposure in a tissue culture hood and then coated for 20 min with a small drop of 0.01% poly-L-lysine (Sigma-Aldrich; #P8920) in distilled water, followed by three washes with water. Each sapphire disc was then placed onto a separate glass coverslip.
Protein Preparation for High-Resolution SEM
Cryo-EM Sample Preparation for α1β1γ2S Receptor
Grids were loaded into a Titan Krios microscope operated at 300 kV. Images were acquired on a Falcon three direct-detector using counting mode at a nominal magnification of 120,000, corresponding to a pixel size of 0.649 Å, and at a defocus range between −1.2 to −2.5 µm. Each micrograph was recorded over 200 frames at a dose rate of ~0.6 e−/pixel/s and a total exposure time of 40 s, resulting in a total dose of ~37 e−/Å2.
Scaffold Morphology and Composition Analysis
Micro-/Macro-Structure Analysis of TGs
SEM Characterization of Pristine mPBI and Composite PP-PBI Membranes
SEM images of the thin m-PBI layer (6 μm thickness) and of the prepared composite PP-PBI membrane cross-section samples before and after cycling tests in the VRFB were obtained using a Hitachi Regulus 8230 series high-resolution scanning electron microscope (Tokyo, Japan), equipped with an energy dispersed X-ray analysis (EDX) detector. Experimental conditions of 6.0 kV accelerating voltage and 2 to 3 μA current were used for both electron imaging and EDX analysis. Secondary electron (SE) images were recorded with an in lens detector at a working distance (WD) of 8 to 9 mm depending on the sample. The built-in software “Hitachi Regulus” was used for SEM imaging and the software “Oxford-Aztec 3.3” was used for EDX analysis.
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