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7000 diffractometer

Manufactured by Schimadzu
Sourced in Japan

The Shimadzu 7000 Diffractometer is a versatile X-ray powder diffraction (XRD) instrument designed for phase identification and structural characterization of a wide range of materials. It provides accurate and reliable data acquisition and analysis for various applications in materials science, geology, chemistry, and pharmaceuticals.

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3 protocols using 7000 diffractometer

1

Zirconium Tungesto-Vanadate Crystalline Structure Analysis

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In order to determine the crystalline structure of the prepared zirconium tungesto-vanadate, the material was scanned at 4°min−1 for 2θ values between 10° and 80° using Schimadzu-7000 diffractometer with CuKα radiation beam (λ = 0.154060 nm).
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2

Structural Characterization of Nano-MgO

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The initial characterization for prepared nano-MgO was monitored by measuring the UV–vis absorbance spectrum by using a UV-Visible Spectroscopy (Shimadzu, Tokyo, Japan) to detect the surface plasmon resonance band6 ,8 (link)–10 (link). The structural properties (real estate properties) of the nano-MgO were analyzed by transmission electron microscope (JEOL JEM2100F- Japan), scanning electronmicroscopy (SEM) (JEOL JSM 6360LA, Japan), scientific particle size analyzer (PSA) and its chemical composition was demonstrated by an energy dispersive X-Ray (EDX) analyzer. The FTIR spectrums were measured using Shimadzu FTIR-8400 S, Japan, over the wavelength range 400–4000 cm−1. X-ray diffraction patterns were obtained using Schimadzu 7000 diffractometer operating with Cu Kα1 radiation(λ = 0.15406 nm) generated at 30 kV and 30 mA with the scan rate of 2°/min for 2θ values between 20° and 80°. The average particle size was estimated using the Scherrer formula Eq. (1). D=kλ/βcosθ where D is particle diameter, k is a constant equals 0.9, λ is wavelength of X-ray source (0.1541 nm), β is the full width at half maximum (FWHM) and θ is the half diffraction angle.
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3

Structural Analysis of Bentonite Types

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X-ray powder diffractometry was performed by (Schimadzu 7000 diffractometer, Kyoto, Japan) to determine the structure of the four several types of bentonites (HAFR 1, 2, 3 and 4).
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