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Supra 40 microscope

Manufactured by Zeiss
Sourced in Germany

The SUPRA 40 is a scanning electron microscope (SEM) designed and manufactured by ZEISS. It is capable of high-resolution imaging and analysis of a wide range of materials. The SUPRA 40 features a field emission gun (FEG) source, which provides high-brightness and high-resolution imaging. The microscope is equipped with various detectors, including secondary electron, backscattered electron, and energy-dispersive X-ray (EDX) detectors, allowing for comprehensive analysis of samples.

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11 protocols using supra 40 microscope

1

Microstructure and Stability Analysis of LSCFMO Powder

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Powder particle size and morphology were assessed by field-emission scanning microscopy (FE-SEM) using ZEISS®® Supra 40 microscope (Carl Zeiss Microscopy GmbH, Jena, Germany), and the crystallographic structures were characterized by XRD. The elemental analysis of the synthesized powder was detected by energy dispersive X-ray spectroscopy (EDS) using Jeol IT300 SEM equipped with Xflash 630 M detector (Bruker Quantax) (JEOL Ltd., Tokyo, Japan).
The microstructure of the anode and cathode surfaces and the cross-section morphology of the cells were observed by SEM.
Subsequent studies investigated the microstructure and mechanical stability of LSCFMo powder under reducing conditions. For these studies, green tapes prepared from LSCFMo were sintered at 1225 °C for 3 h. Then, they were subjected to 5% H2/Ar gas flow as a reducing agent at 900 °C (heating rate = 5 °C/min) for 10 h. The phase stability of the tapes was assessed by XRD and the mechanical stability was tested manually. The bulk density of sintered and reduced tapes was evaluated by SEM analysis with the aid of image analysis software (ImageJ 1.54f). The surface porosity of the tape was assessed by proper threshold adjustment of the image and calculating the pixel ratio with respect to the total pixels in the image area.
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2

Cryofractured Surface Morphology Analysis

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Field emission scanning electron microscopy (FESEM) micrographs of the cryofractured surfaces of the specimens were acquired using a Zeiss Supra 40 microscope (Carl Zeiss AG, Oberkochen, Germany), with an accelerating voltage of 2.5 kV. Prior to the analysis, a Platinum–Palladium (80:20) conductive coating was sputtered onto the specimens.
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3

Morphological Analysis of Spray-Dried Microparticles

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The morphology of RBV raw material, spray-dried excipient microparticles and agglomerates was examined by Field Emission – Scanning Electron Microscopy (FE-SEM), using a Zeiss SUPRA 40 microscope (Zeiss, Oberkochen, Germany). The powder samples were fixed onto high-purity aluminum pin stubs using double-sided tape, with the exception of the agglomerates which were dipped in silver glue (Conductive Silver Paint, Agar Scientific, Stansted, UK), as it was not possible to stick them onto the bioadhesive tape without breaking them. This paint formed a thin highly conductive film on the agglomerate’s surface. In all cases, the magnifications selected ranged between 250× and 5000× to appreciate both the whole particle and its surface detail.
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4

Spatial Distribution of BNP in Fiber Reinforced Samples

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The spatial distribution of BNP in the fiber reinforced sample was investigated with a SEM Zeiss Supra 40 microscope (Zeiss, Oberkochen, Germany) equipped with a high-resolution cathode of Schottky type and conventional Everhart–Thornley (ET) and In-Lens secondary electron (SE) detectors. The nanoparticles as embedded within the fibers in the epoxy matrix were detected using the SEM in the transmission mode (T-SEM) after preparation of the sample as thin, electron-transparent layer [25 (link)]. Ultra-microtomed thin sections of the samples of fibers embedded in the epoxy resin, of around 100 nm in thickness, were prepared and deposited on a typical copper TEM grid for evaluation with TSEM, a dedicated sample holder specially developed for TSEM was used.
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5

Macrocolony Biofilm Imaging Protocol

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Single macrocolony biofilms grown on TY-agar plates were carefully cut from the plates with a sterile scalpel, and placed in a sterile glass Petri dish, in which they were fixed and dehydrated with graded ethanol series according to Fischer et al. (2012) . Afterward, agar blocks containing single macrocolonies were submitted to critical point drying. Samples were mounted on stubs and sputter coated with gold. SEM images were obtained with a ZEISS SUPRA 40 microscope.
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6

Characterizing Sol-Si Particles with SEM and TEM

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Scanning electron microscopy (SEM) and transmission electron microscopy (TEM) were employed to analyze the shape and appearance of Sol-Si particles. Before analysis by the SEM technique (Zeiss SUPRA 40 microscope), CS/Sol-Si and CS were fixed in a glutaraldehyde solution (10% v/v in PBS) at 4 °C for 1 h, washed three times with PBS buffer, frozen at −80 °C, and afterward freeze-dried. The Sol-Si particles, CS/Sol-Si, and CS were all gold sputter-coated in an argon atmosphere before the analysis. The SEM images were registered at 50 k × and 10 k × magnification.
For TEM analysis (Zeiss 109 microscope), drops of Sol-Si particles in aqueous solution were placed on carbon-coated copper grids. After 1 min, the liquid was blotted with filter paper, and the particles were analyzed at room temperature. Before the measurements were performed, the aqueous solution was sonicated to ensure that the particles were suspended.
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7

Characterization of Cryofractured Polymer Surfaces

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Field emission scanning electron microscopy (FESEM) images of the cryofractured surfaces of both virgin and healed samples were obtained through a Zeiss (Oberkochen, Germany) Supra 40 microscope operating at an acceleration voltage of 2.5 kV. A platinum/palladium (80:20) conductive coating was sputtered on the specimens prior to observation to ensure good electrical conductivity. Fourier transform infrared spectroscopy (FT-IR) was carried out in attenuated total reflectance (ATR) mode using a Perkin-Elmer Spectrum One instrument (Perkin Elmer GmbH, Waltham, MA, USA), equipped with a ZnSe crystal, in a wavenumber range of 650–4000 cm−1. To enhance the signal-to-noise ratio, twenty scans were collected for each spectrum with a resolution of 4 cm−1.
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8

Characterization of VZO Thin Films

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The average thickness of VZO thin films was investigated by Field Emission Scanning Electron Microscopy (FESEM), using a Zeiss Supra 40 microscope. X-ray diffraction (XRD) measurements were performed by a Panalytical X’Pert Pro Diffractometer in the Bragg-Brentano configuration, equipped with a Cu Kα radiation as X-ray source (λ = 1.540 59 Å). X-ray photoelectron spectroscopy (XPS) was carried out by using a PHI 5000 VersaProbe (Physical Electronics) system. The X-ray source was a monochromatic Al Kα radiation. Sputter cleaning has been performed using the Ar+ source with a 2 kV ions accelerating voltage (10 μA ion current) and 1 min sputtering time. The piezoelectric properties of VZO thin films were studied using an aixDBLI Double Beam Laser Interferometer system, from aixACCT Systems. A large signal excitation voltage was applied on the sample at room temperature, and the mechanical displacement induced on the piezoelectric thin film acquired by the optical components of the interferometer system located in a vibration damped chamber. The average piezoelectric coefficient d33 for each sample is estimated according to the law of converse piezoelectric effect28 35 . Electrical characterization was performed using a Keithley 2635 A and a standard two point micro-contact setup, at room temperature in air.
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9

FESEM Characterization of Ag-NPs/pSi-PDMS Membranes

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The FESEM morphological characterization was performed using a Zeiss SUPRA 40 microscope (Zeiss SMT, Oberkochen, Germany). The pSi/PDMS membranes, decorated with Ag-NPs, were recovered from the elastomeric microfluidic chip, and covered with a copper grid connected to the FESEM stub to mitigate the electron surface charge-up effect due to the poorly conducting thick PDMS layer. The typical imaging parameters were an acceleration tension between 2.5–5 kV, a working distance of 3.5 mm, and an aperture size of 20 μm.
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10

Characterization of Cellulose Aerogel Microparticles

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The morphology of the cellulose aerogel microparticles was examined using a Zeiss Supra 40 microscope equipped with a field emission gun. The observations were performed with diaphragms from 7.5 to 20 μm in diameter and the acceleration voltage was set between 1 and 3 kV. Prior to the observations, a thin layer of platinum was applied on the surface of the particles with a Quorum Q150T metallizer to prevent the accumulation of electrostatic charges. SEM images were also used to estimate the size distribution of the cellulose aerogel microparticles, mean diameter was calculated as arithmetic average. At least 100 particles were measured. Specific surface area. The specific surface area was measured with a Micromeritics ASAP 2020 instrument using nitrogen adsorption and the Brunauer-Emmett-Teller (BET) method. The samples were degassed under high vacuum at 70 °C for 10 h prior to the measurements.
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