Escalab 250xi x ray photoelectron spectrometer
The ESCALAB 250Xi is an X-ray photoelectron spectrometer (XPS) manufactured by Thermo Fisher Scientific. It is a versatile instrument designed for surface analysis, providing detailed information about the chemical composition and electronic structure of materials. The ESCALAB 250Xi utilizes advanced X-ray technology to generate and analyze photoelectrons emitted from the sample surface, enabling the identification and quantification of elements present, as well as their chemical states.
Lab products found in correlation
64 protocols using escalab 250xi x ray photoelectron spectrometer
Surface Characterization of Novel Materials
Comprehensive Characterization of Synthesized Nanoparticles
Zeiss,
Germany) and transmission electron microscopy (TEM, FEI Inc., USA)
were used to examine the morphologies of the as-synthesized NPs. The
hydrodynamic sizes and zeta potentials of the NPs were measured by
dynamic light scattering (DLS). The optical absorbance spectra were
analyzed using a UV-1800 spectrometer (Shimadzu, Japan). The crystalline
forms of the products were characterized by X-ray diffraction (XRD,
XRD-7000, Shimadzu, Japan) with Cu Kα radiation (λ = 1.5406
Å). X-ray photoelectron spectroscopy (XPS) was also employed
to analyze the elemental compositions of the intermediate and final
products using an ESCALAB 250Xi X-ray photoelectron spectrometer (Thermo
Scientific, USA). Magnetic properties were examined on a magnetometer
with an applied field between -20,000 and 20,000 Oe at room temperature
(VSM, Quantum Design PPMS).
Comprehensive Characterization of Materials
XPS Analysis of Fiber Surface
Comprehensive Characterization of PPy@Co3O4 Composite
Comprehensive Materials Characterization Protocol
morphology of the products was examined using a field-emission scanning
electron microscopy (FESEM, TESCAN VEGA II). Transmission electron
microscopy (TEM) and high-resolution TEM (HRTEM) images were acquired
on a JEOL-2100 electron microscope at an acceleration voltage of 200
kV. The crystal phases of the samples were determined using an X-ray
powder diffractometer (XRD) with a Ultima IV diffraction meter (Rigaku,
Japan) and Cu Kα radiation source. We scanned the sample for
the range of 30–80° at a scanning rate of 4° min–1. The BET surface area was determined from nitrogen
adsorption–desorption isotherms using a Micromeritics ASAP
2460. The optical absorption property of the samples was measured
by a UV–vis diffuse reflectance spectroscopy (DRS, UH4150,
Hitachi) with BaSO4 as the reflectance standard. Further
evidence for the composition of the product was recorded from X-ray
photoelectron spectroscopy (XPS) using an ESCALAB 250Xi X-ray photoelectron
spectrometer (Thermo Scientific) using an Al Kα radiation.
Characterization of HfS2-rGO and HfP-rGO Catalysts
Comprehensive Structural Characterization of Samples
Comprehensive Characterization of Materials
Comprehensive Characterization of Magnesium Oxide
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