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Escalab 250xi x ray photoelectron spectrometer

Manufactured by Thermo Fisher Scientific
Sourced in United States

The ESCALAB 250Xi is an X-ray photoelectron spectrometer (XPS) manufactured by Thermo Fisher Scientific. It is a versatile instrument designed for surface analysis, providing detailed information about the chemical composition and electronic structure of materials. The ESCALAB 250Xi utilizes advanced X-ray technology to generate and analyze photoelectrons emitted from the sample surface, enabling the identification and quantification of elements present, as well as their chemical states.

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64 protocols using escalab 250xi x ray photoelectron spectrometer

1

Surface Characterization of Novel Materials

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The surface composition and valence states were analyzed with XPS, using an Escalab 250Xi X-ray photoelectron spectrometer (Thermo Fisher) with Al Ka (1486.6 eV) X-rays as the excitation source, and the binding energy of the C 1 s peak at 284.8 eV was taken as an internal reference. The morphologies were examined by SEM conducted on a Hitachi SU4800 scanning electron microanalyzer with an accelerating voltage of 15 kV. Powder X-ray diffraction (PXRD) patterns were taken on PANalytical X-pert diffractometer (PANalytical, Netherlands) with Cu Kα radiation at 40 kV and 40 mA at room temperature. Transmission electron microscope (TEM) images were conducted on FEI Talos F200X G2 TEM equipment. HAADF-STEM images and energy dispersive spectra (EDS) elemental mapping were conducted on FEI Themis Z TEM equipment.
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2

Comprehensive Characterization of Synthesized Nanoparticles

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Field emission scanning electron microscopy (FESEM, JSM-7800F,
Zeiss,
Germany) and transmission electron microscopy (TEM, FEI Inc., USA)
were used to examine the morphologies of the as-synthesized NPs. The
hydrodynamic sizes and zeta potentials of the NPs were measured by
dynamic light scattering (DLS). The optical absorbance spectra were
analyzed using a UV-1800 spectrometer (Shimadzu, Japan). The crystalline
forms of the products were characterized by X-ray diffraction (XRD,
XRD-7000, Shimadzu, Japan) with Cu Kα radiation (λ = 1.5406
Å). X-ray photoelectron spectroscopy (XPS) was also employed
to analyze the elemental compositions of the intermediate and final
products using an ESCALAB 250Xi X-ray photoelectron spectrometer (Thermo
Scientific, USA). Magnetic properties were examined on a magnetometer
with an applied field between -20,000 and 20,000 Oe at room temperature
(VSM, Quantum Design PPMS).
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3

Comprehensive Characterization of Materials

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X-Ray diffraction (XRD) patterns were carried out by an Ultima IV X-ray diffractometer. The scanning electron microscopy (SEM) analyses were conducted using a Quanta 3D FEG apparatus. Transmission electron microscopy (TEM) image was obtained by a JEM-2100 microscope. Fourier transform infrared (FTIR) spectrum was performed on a Nicolet iS50. X-ray photoelectron spectroscopy (XPS) was acquired in Thermo scientific ESCALAB 250Xi X-ray photoelectron spectrometer. The UV-vis diffuse reflectance spectroscopy (DRS) of the samples was measured using an Agilent Cary 5000 spectrometer. The photoluminescence (PL) spectrum of the samples were measured with an F-4600 fluorometer at excitation wavelength of 325 nm. Time-resolved photoluminescence spectra of samples were recorded on a FLS920 Full-featured fluorescence spectrometer at excitation wavelength of 330 nm.
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4

XPS Analysis of Fiber Surface

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The XPS analysis was performed in a Thermo Scientific Escalab 250Xi X-ray Photoelectron Spectrometer (Sudbury, UK) using a 5 mg sample with a vacuum of 2 × 10−8 mTorr in the test chamber and a monochromatic X ray source with an aluminum anode and radiation energy of 1486.6 eV. Spectra were obtained with an energy pass of 117.4 eV and of 11.5 eV for the high-resolution spectra. The analysis region was 1400–0 eV of binding energy. In order to identify the chemical species on the surface of the fibers, C 1s were fitted using Gaussian functions. Prior to curve fitting, the spectra were baseline corrected using the Shirley function.
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5

Comprehensive Characterization of PPy@Co3O4 Composite

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To analyze the crystal structure and phase composition of the prepared samples, we employed the Smart Lab X-ray diffractometer (XRD) from Rigaku Corporation, Japan. The microscopic morphology of the materials was observed using the S-3400 scanning electron microscope (SEM) from Hitachi Ltd., Japan. Elemental scanning analysis was carried out with an energy dispersive X-ray spectroscope (EDS). Additionally, we utilized the H-7650 transmission electron microscope (TEM) from Hitachi Ltd. to observe the samples. For the observation of PPy in the PPy@Co3O4 composite, Fourier-transform infrared spectroscopy (FT-IR) analysis was performed using the Spec drum infrared spectrometer from PerkinElmer, USA. The chemical environment of elements in the PPy@Co3O4 composite was analyzed using the ESCALAB 250Xi X-ray photoelectron spectrometer (XPS) from Thermo Fisher Scientific, USA. The Brunauer–Emmett–Teller (BET) method was employed to determine the specific surface area using a Hitachi Regulus 8100 instrument. The Barrett–Joyner–Halenda (BJH) method was utilized to assess the pore size distribution.
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6

Comprehensive Materials Characterization Protocol

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The
morphology of the products was examined using a field-emission scanning
electron microscopy (FESEM, TESCAN VEGA II). Transmission electron
microscopy (TEM) and high-resolution TEM (HRTEM) images were acquired
on a JEOL-2100 electron microscope at an acceleration voltage of 200
kV. The crystal phases of the samples were determined using an X-ray
powder diffractometer (XRD) with a Ultima IV diffraction meter (Rigaku,
Japan) and Cu Kα radiation source. We scanned the sample for
the range of 30–80° at a scanning rate of 4° min–1. The BET surface area was determined from nitrogen
adsorption–desorption isotherms using a Micromeritics ASAP
2460. The optical absorption property of the samples was measured
by a UV–vis diffuse reflectance spectroscopy (DRS, UH4150,
Hitachi) with BaSO4 as the reflectance standard. Further
evidence for the composition of the product was recorded from X-ray
photoelectron spectroscopy (XPS) using an ESCALAB 250Xi X-ray photoelectron
spectrometer (Thermo Scientific) using an Al Kα radiation.
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7

Characterization of HfS2-rGO and HfP-rGO Catalysts

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Crystals of the prepared HfS2-rGO NS and HfP-rGO NS catalysts were analyzed by powder X-ray diffraction (XRD) using a Bruker D8 advanced diffractometer with Cu Kα radiation (λ = 1.5418 Å). Raman spectra of HfS2-rGO NS and HfP-rGO NS were recorded using a Renishaw inVia spectrometer with 532 nm laser excitation. Morphologies of the HfS2-rGO NS and HfP-rGO NS catalysts were captured by scanning electron microscopy (SEM), and the elements in the catalysts were distinguished by elemental mapping techniques using a Hitachi (S-4800) SEM. The in-depth morphology of the prepared catalysts was further examined by transmission electron microscopy (TEM) and selected area electron diffraction tests using a Tecnai (20 U-TWIN) TEM. The elemental composition and the binding energies of the HfS2-rGO NS and HfP-rGO NS were detected using a Thermo Fisher Scientific ESCALAB 250Xi X-ray photoelectron spectrometer (XPS) with Al Kα radiation.
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8

Comprehensive Structural Characterization of Samples

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The microcosmic surface morphology of the samples was observed using a scanning electron microscope (Hitachi SU8010, Hitachi, Tokyo, Japan). The functional groups of the samples were analyzed using a Fourier transform infrared spectrometer (NEXUS 670, Thermo Fisher Scientific, Waltham, MA, USA). The spectra were collected using KBr powder as a matrix in the range of 450–4000 cm−1. X-ray powder diffraction (XRD) patterns were recorded on a DRON-4-07 X-ray diffractometer (Bourevestnik, St. Petersburg, Russia) in the range of 10° < 2θ < 80° using Cu Kα irradiation. XPS analysis was performed using an ESCALAB 250XI X-ray photoelectron spectrometer (Thermo Fisher Scientific, Waltham, MA, USA), selecting Al Kaas as the X-ray source.
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9

Comprehensive Characterization of Materials

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TEM and HAADF-STEM images were acquired with a JEOL-2010 FEI Tecnai G20 field-emission microscope (JEOL, Tokyo, Japan) operated at 200 kV. SEM images were obtained by field emission scanning electron microscopy (JSM6700). ICP was performed on an Ultima2. PXRD patterns were recorded on a Miniflex 600 X-ray diffractometer under Cu Kα radiation (λ = 1.5406). The Raman spectra were performed on a Labram HR800 Evolution over a range of 300–3500 cm−1. The N2 adsorption–desorption isotherms of the samples were collected using a Micromeritics ASAP 2460 instrument. The micropore size distributions of the samples were calculated via a non-local density functional theory (NLDFT) method and the mesopore size distributions were calculated by the Barrett–Joyner–Halenda (BJH) adsorption isotherms. The specific surface areas were measured using the Brunauer–Emmett–Teller (BET) model. Elemental analyses were measured by a vario EL cube (Elementar, Germany). XPS was performed on an ESCALAB 250Xi X-ray photoelectron spectrometer (Thermo Fisher) using monochromatized Al Kα radiation (15 kV, 10 mA).
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10

Comprehensive Characterization of Magnesium Oxide

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The surface morphology and elemental composition of the MGO was investigated by scanning electron microscopy (SEM, Quanta−200, The Netherlands). Energy dispersive spectroscopy (EDS) spectra were measured by an energy-dispersive X-ray spectrometer (EDAX Genesis 2000, USA). X-ray diffraction (XRD) patterns of MGO were obtained by using a powder diffractometer (Rigaku D/max−2500) with a Cu Kα source. A Fourier transform infrared (FT-IR) spectroscopy (PerkinElmer S pectrum One, Waltham, MA, USA) was applied to characterize the samples by using the KBr pellet technique. The X-ray photoelectron spectroscopy (XPS) was performed on an ESCALAB 250Xi X-ray photoelectron spectrometer (Thermo Fisher, Waltham, MA, USA).
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