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61 protocols using jsm it500hr

1

Characterization of Nano and Microparticles

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The particle size distributions of the nanosuspensions were measured by Malvern Instruments Zetasizer Pro dynamic light scattering (DLS). Before the measurements, the nanosuspensions were diluted to the appropriate concentration using water to prevent multiple scattering. We visually confirmed that the nanosuspensions were dispersed in the water during the measurements. All the measurements were performed in triplicate.
The particle size distributions of the microparticle samples were measured by a Malvern Instruments Mastersizer 3000 laser diffraction size analyzer. Before the measurements, the microparticle samples were suspended in the saturated heptane solution of the compound containing 0.2% sorbitan monooleate which was used to keep the microparticle samples dispersed during the measurements. And, to prevent bubbles in the test samples caused by sorbitan monooleate, heptane was chosen as the solvent instead of water. All the measurements were performed in triplicate.
The morphologies of the nanosuspensions and microparticle samples were visualized using JEOL JSM-IT500HR scanning electron microscopy (SEM). Before the measurement, the mounted samples were coated with platinum under vacuum. We measured different points in more than three images to confirm that the pictured image reflected the whole sample and was not biased in terms of particle size and shape.
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2

High-Precision 3D Printing of Hydrogels

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All printing was performed using an EZROBO-5GX 3D printer with an AD3300C
dispenser (Iwashita, Japan), equipped with a nozzle and temperature controller.
During printing, ink was heated to 85°C using a temperature control
system and syringe heating pad, and various nozzle sizes (600-, 400-, 200-, and
100-μm size of nozzles) were used. Printing structures were designed
using Ez- EDITOR robot communication software. The diameters of the printed
hydrogels were compared with those of the printing nozzle using a field-emission
scanning electron microscope (FE-SEM, JSM-IT-500HR, JEOL, Japan) at an
accelerating voltage of 15.0 kV with gold sputtering to enhance image
contrasts.
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3

Morphological Analysis of CMC/SS Dressings

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CMC/SS dressings with various concentrations (1%, 2%, and 3%T) were morphologically analyzed through scanning electron microscopy (SEM; JEOL, JSM-IT-500HR, Peabody, MA, USA) compared with pure CMC and SS dressings. Cylindrical samples were cut into small pieces and coated with gold by using a sputtering device prior to SEM observation. The pore sizes of the samples (300 randomly selected pores) were determined from SEM images by using ImageJ software.
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4

BTCP-AE-FM Scaffold Morphology Analysis

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DPSCs were cultured in DMEM-F12 media containing 10% FBS, 1% penicillin/streptomycin, and 1% GlutaMAX (all from Thermo Fisher Scientific, Waltham, MA, USA) and were maintained at standard conditions in a humidified 37 °C incubator with 5% CO2. Prior to cell seeding, BTCP-AE-FM samples (Ø 12 mm) were sterilized using O3, and then UV light (30 min/side). The meshes were laid into the bottom of the well and fixed with sterilized plastic rings. After that, 105 cells were seeded into each well containing fiber mesh, then incubated for 3 days at 37 °C. Cell morphology was studied with SEM (JEOL JSM-IT500HR, Tokyo, Japan). Samples were fixed in 2% glutaraldehyde (Sigma-Aldrich, St. Louis, MO, USA) for 2 h and then in a 1% OsO4 solution (Sigma-Aldrich, St. Louis, MO, USA) for 1 h. Samples were dehydrated in ethanol solutions (10%, 30%, 50%, 70%, 80%, 90%, and 100% EtOH) for 15 min for each step, then dried using CO2 at a critical point and covered with a gold layer of about 12 nm thickness before microscopic investigation. The accelerating voltage was 15 kV.
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5

Failure Mode Analysis of Repair RBCs

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After µTBS tests, five specimens were randomly selected and subjected to failure mode analysis under a scanning electron microscope (SEM) (JEOL JSM-IT500HR, JEOL, Tokyo, Japan) at 65× magnification, using the backscattered electron mode. Failure modes were recorded as adhesive (between substrate and repair RBC), cohesive (within the substrate or the repair RBC), or mixed (both adhesive and cohesive).
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6

Characterizing Au-SF and Au-tSF Hydrogels

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Au-SF and Au-tSF hydrogels prepared with 1 mM Au3+ were freeze-dried, cut and sputter-coated with platinum. Surface feature analysis was visualized using a scanning electron microscope (SEM) (JSM-IT500HR, Jeol, Tokyo, Japan) at 300× and 15,000× magnifications.
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7

Surface Morphology Analysis via SEM

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Two samples of each type of post that received surface treatments were subjected to SEM for morphological analysis of the surface using a gold coater (Gold sputtering unit, JEOL Ltd., Akishima, Japan) and observed at 500× magnification with a scanning electron microscope (JSM-IT500HR, JEOL Ltd., Tokyo, Japan).
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8

Scaffold Pore Characterization by SEM

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The SF scaffolds were visualized by scanning electron microscope (SEM) (JSM-IT500HR, JEOL, USA). The scaffolds were glued on a copper plate and sputtered with gold before SEM imaging. The SEM was operated at the accelerating voltage of 3 keV. The pore diameters of the scaffolds were measured using ImageJ software.
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9

Characterization of Electrogalvanized Coatings

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Optical microscopy (OM) was used to determine the coating thickness from a cross-sectional view of the corrugated specimens. Scanning electron microscopy (SEM, JSM-IT500HR, JEOL Ltd., Tokyo, Japan) was employed to analyze the surface morphology at zone 5 of the electrogalvanized corrugated samples. The phase identification was carried out at the same zone using X-ray diffractometry (XRD, PW3710, Philips, Almelo, Netherlands) with a Cu radiation source and a scan rate of 0.02 °/min.
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10

Scanning Electron Microscopy Analysis of Surface Morphology

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Samples were analyzed with a Jeol JSM-IT500HR (Jeol, Tokyo, Japan) scanning electron microscope (SEM) equipped with a built-in energy dispersive X-ray spectrometer (EDS). Using the dry silicon-drift (SDD) EDS detector enables fast and high accuracy elemental analysis [16 (link), 17 (link)].
For the surface images, samples were coated with gold (Jeol JFC-1300 auto fine coater, Jeol, Tokyo, Japan) and the images were captured using secondary electron imaging mode and 5, 10 and 15 kV accelerating voltage. The morphological characteristics of the control and anodized discs were recorded at ×500, ×2000, ×5000, ×10000 and ×20000 magnifications and for better surface visualization were tilted at 45°.
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