Axis ultra

Manufactured by Shimadzu

Sourced in United Kingdom, Japan, Jamaica

The Axis Ultra is a versatile X-ray photoelectron spectroscopy (XPS) instrument designed for surface analysis. It provides high-performance elemental and chemical state analysis of solid samples.

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Lab products found in correlation

S 4800, by Hitachi (7 mentions) Nicolet is50, by Thermo Fisher Scientific (6 mentions) Smartlab, by Rigaku (4 mentions) Nicolet 6700, by Thermo Fisher Scientific (3 mentions) Jem 2100, by JEOL (2 mentions) Tensor 27, by Bruker (2 mentions) Nano zs90, by Malvern Panalytical (2 mentions) Oca 20 contact angle system, by Dataphysics (2 mentions) Arm200f, by JEOL (2 mentions) Dimension icon, by Bruker (2 mentions) Jem 2010, by JEOL (2 mentions) Jem 2100f, by JEOL (2 mentions) Labram hr, by Horiba (2 mentions) Asap 2020, by Micromeritics (2 mentions) Lambda 950, by PerkinElmer (2 mentions) Labram hr800, by Horiba (2 mentions) D8 advance, by Bruker (2 mentions) Quanta 450, by JEOL (2 mentions) Dimension icon spm, by Bruker (2 mentions) Jem arm200f, by JEOL (2 mentions)

124 protocols using axis ultra

Comprehensive Nanoparticle Characterization

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The nanoparticles were characterized
using scanning electron microscopy (SEM, Inspect FEI F50), atomic
force microscopy (AFM, Nanoscope 8.10 tapping mode), X-ray photoelectron
spectroscopy (XPS, Kratos Axis Ultra, with a monochromatic Al Ka X-ray
source), XRD (Bruker D8 ADVANCE ECO, Co Kα, λ = 1.7889
A), ATR-FTIR (Perkin Elmer Frontier), UV–vis spectroscopy (Agilent
technologies Cary 60 Uv–vis), and TEM (Tecnai_G2_Spirit). Particles
were collected using a centrifuge (Dynamica VELOCITY 14R). Magnetization
measurements were carried out using a Quantum design MPMS at 295 K
in the field range ± 1.50 T.

Al-Antaki A.H., Luo X., Duan X., Lamb R.N., Hutchison W.D., Lawrance W, & Raston C.L. (2019). Continuous Flow Copper Laser Ablation Synthesis of Copper(I and II) Oxide Nanoparticles in Water. ACS Omega, 4(8), 13577-13584.

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Comprehensive Characterization of ZnO Nanoparticles

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The morphology of the ZnO NPs was analyzed via SEM using a JEOL JSM-5300 scanning electron microscope, at a working distance of 11 mm and a voltage of 15 kV. The elemental composition was performed via EDS coupled to the SEM equipment, using Aztec software (Oxford). The TEM analysis was performed with a JEOL JEM-2010F transmission electron microscope, with an acceleration of 120 kV. The structural analysis of the ZnO NPs was performed using an ATR-IR piece of equipment (Perkin Elmer Brand, 0.5 cm⁻¹ resolution and 400 to 3500 cm⁻¹ measurement range) and via XRD (Bruker-D2 Phase, with a radiation of Cu Ka = 1.541 Å at a step of 0.022 from 10 to 80°). For the elemental chemical analysis, an XPS system (Axis-Ultra, Kratos, in SPECS system using Al Kα monochromatic X-rays at 1486.6 eV) was used. To evaluate the optical properties of the NPs, the PL (Horiba Nanlog, using ethanol as solvent and a concentration of 100 ppm) and UV-Vis (Perkin Elmer brand spectrophotometer, Lambda 365 with a wavelength of 190–800 nm, and a scanning speed of 600 nm/s) spectra were analyzed.

Luque-Morales P.A., Lopez-Peraza A., Nava-Olivas O.J., Amaya-Parra G., Baez-Lopez Y.A., Orozco-Carmona V.M., Garrafa-Galvez H.E, & Chinchillas-Chinchillas M.D. (2021). ZnO Semiconductor Nanoparticles and Their Application in Photocatalytic Degradation of Various Organic Dyes. Materials, 14(24), 7537.

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Comprehensive Characterization of Photovoltaic Devices

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The I–V measurements and
stability test were performed using a
Keithley 2400 digital source meter under simulated sunlight from a
Newport 94123A solar simulator matching the AM 1.5G irradiation (100
mW cm^–2). The devices were measured from 1.4 to
−0.2 V at a scan rate of 10 mV/s. XPS was carried out on PHI
5000 Versa Probe III. EQE was measured by Enlitech QE-R3011. UV-absorption
spectra were recorded using a Youke UV-1901 UV–vis spectrometer.
AFM scans were obtained by Bruker Dimension Edge. STEM was performed
by an FEI Titan Themis (300 kV). The contact angle measurement was
carried out by a contact angle meter (OSA25, Kruss). SCLC and conductivity
were tested using a Keithley 2400 digital source meter. Ultraviolet
photoelectron spectroscopy (UPS) was performed using a UPS system
(Kratos, Axis Ultra) using HeI radiation of 21.22 eV.
XRD patterns
were obtained using an EMPYREAN four-circle diffractometer operated
at 40 kV and 30 mA at a scan rate of 20° per minute. SEM images
were obtained using a field-emission scanning electron microscope
(FEI inspect) at an acceleration voltage of 8 kV. Steady-state PL
and TRPL were measured using Edinburgh Instruments, FLS 920 equipped
with a light source with an excitation wavelength of 375 nm. EIS plots
were measured using a CorrTest Electrochemical Workstation under dark
conditions.

Liu Y., Sun H., Liao F., Li G., Zhao C., Cui C., Mei J, & Zhao Y. (2021). Bridging Effects of Sulfur Anions at Titanium Oxide and Perovskite Interfaces on Interfacial Defect Passivation and Performance Enhancement of Perovskite Solar Cells. ACS Omega, 6(50), 34485-34493.

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Comprehensive Material Characterization

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The morphology of the sample was characterized by environmental scanning electron microscope, E-SEM, (Quanta 200 s, Phillips Electron Optics Company) and transmission electron microscope, TEM, (JEOL JEM-2100, USA). X-ray diffraction, XRD pattern was collected using a diffractometer (Rigaku SmartLab) equipped with a Cu Kα radiation source (λ = 1.5406 A). The electronic states of the different elements in the sample were examined using X-ray photoelectron spectroscopy, XPS, (Kratos Axis Ultra).

Jagadale A., Zhou X., Blaisdell D, & Yang S. (2018). Carbon nanofibers (CNFs) supported cobalt- nickel sulfide (CoNi2S4) nanoparticles hybrid anode for high performance lithium ion capacitor. Scientific Reports, 8, 1602.

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Comprehensive Structural and Surface Analysis of Nanomaterials

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TEM, field emission SEM, and HAADF-STEM with EDS detectors for elemental mapping analysis were taken on JEOL-7700, JEOL-7800, and HF-5000 microscopes, respectively. Samples for TEM and SEM analysis were prepared by dispersing samples in ethanol via ultrasonication and dried on a copper grid and silicon substrates, respectively. ET tilt series were carried out by tilting the specimen inside Tecnai F30 G2 TEM over an angular range of −60° to 60° under the electron beam and the images were processed via IMODE software. Nitrogen adsorption/desorption measurement was conducted using a Micromeritics TriStar II system at 77 K. Before the measurement, all samples were degassed for 12 hours under a vacuum environment at 170°C. The pore size and specific surface area of samples were calculated through the BJH and BET methods, respectively. The zeta potential of the polymer core in reactive solution and PEI-modified SNP-x dispersed in water was tested by DLS using a Zetasizer NanoZS from Malvern Instruments. XPS measurement was conducted using a Kratos Axis ULTRA.

Cheng D., Zhang J., Fu J., Song H, & Yu C. (2023). A hierarchical spatial assembly approach of silica-polymer composites leads to versatile silica/carbon nanoparticles. Science Advances, 9(40), eadi7502.

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Characterization of SnO2 Nanocrystals

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The crystal structure of the hydrogenated and non-hydrogenated SnO₂ nanocrystals were characterized by X-ray diffraction (Haoyuan DX-2700, Dandong, China) using Cu Kα1 radiation with 2θ ranging from 20° to 80°. The morphology was analyzed by field-emission scanning electron microscope (Hitachi SU8020, Japan) with an acceleration voltage of 20 kV. The surface compositions were determined on an X-ray photoelectron spectroscope (Kratos Axis ultra, Japan) and on an infrared (IR) spectrometer (Bruker Tensor 27, Germany) by mixing 0.001 g of sample with 0.100 g of KBr and pressing into tablet.

Yuan Y., Wang Y., Wang M., Liu J., Pei C., Liu B., Zhao H., Liu S, & Yang H. (2017). Effect of Unsaturated Sn Atoms on Gas-Sensing Property in Hydrogenated SnO2 Nanocrystals and Sensing Mechanism. Scientific Reports, 7, 1231.

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Comprehensive Materials Characterization Protocol

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Transmission
electron
microscopy (TEM) images of the samples were obtained on a JEOL JEM
1230 operated at 120 kV. Powder X-ray diffraction (XRD) patterns of
the samples were collected on a Bruker SMART APEXII X-ray diffractometer
equipped with a Cu Kα radiation source (λ = 1.5418 Å).
X-ray photoelectron spectroscopy (XPS) measurements were carried out
in an ion-pumped chamber (evacuated to 10^–9 Torr)
of a photoelectron spectrometer (Kratos Axis-Ultra) equipped with
a focused X-ray source (Al Kα, hν = 1486.6
eV). The UV–vis absorption spectra were recorded on a Cary
300 Bio UV–vis spectrophotometer. Fourier transform infrared
spectra were measured with an FTS 45 infrared spectrophotometer with
the KBr pellet technique. The photocurrent measurements were carried
out in a conventional three-electrode station (Autolab PGSTAT204).

Vu M.H., Nguyen C.C, & Do T.O. (2020). Synergistic Effect of Fe Doping and Plasmonic Au Nanoparticles on W18O49 Nanorods for Enhancing Photoelectrochemical Nitrogen Reduction. ACS Sustainable Chemistry & Engineering, 8(32), 12321-12330.

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Surface Composition of Fluorinated Cellulose Ester

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Surface composition of the fluorinated
cellulose ester was evaluated using the AXIS Ultra instrument (Kratos
Analytical, U.K.). A sample, deposited on paper, was mounted on a
sample holder using an ultrahigh vacuum-compatible carbon tape and
pre-evacuated overnight. A fresh piece of pure cellulosic filter paper
(Whatman) was analyzed as an in situ reference. Measurements were
performed using monochromated Al Kα irradiation at 100 W and
under neutralization. Wide scans as well as high-resolution regions
of C 1s, O 1s, and F 1s were recorded on several locations with a
nominal analysis area of 400 × 800 μm². Analysis
depth of the method is less than 5 nm. Data analysis was performed
with CasaXPS, and all binding energies were charge-corrected using
the main cellulosic C–O component at 286.7 eV as the reference.

Khanjani P., King A.W., Partl G.J., Johansson L.S., Kostiainen M.A, & Ras R.H. (2018). Superhydrophobic Paper from Nanostructured Fluorinated Cellulose Esters. ACS Applied Materials & Interfaces, 10(13), 11280-11288.

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SEM, XRD, and Micro-Indentation Analysis of Regenerated Dental Layers

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The morphology of the reconstructed layer was observed on a scanning electron microscope (FEI company, NovaSEM 430, USA) operated at 10–20 kV. For higher resolution in the SEM image, all samples were coated with an Au/Pd film. The crystalline phase of the newly grown layer was examined by X-ray diffraction (Rigatu, D/max, USA) with Cu Kα radiation (λ = 1.5405) at 40 kV and 100 mA. An X-Ray Imaging Photoelectron Spectrometer (Kratos, Axis Ultra, UK) was used to analyze the chemical composition of the regenerated layer, with Al Kα X-rays at 40 kV with a power of 225 W.
A TriboIndenter (Hysitron Inc., US) with a 100 nm Berkovich tip at a maximum load of 1000 μN was used to measure the elastic modulus and hardness of our samples. All specimens were cut thinly so that the weak strength of dentin would not affect the final result. Three indents were performed for each sample, and results were analyzed statistically.

Sun M., Wu N, & Chen H. (2017). Laser-assisted Rapid Mineralization of Human Tooth Enamel. Scientific Reports, 7, 9611.

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X-ray Photoelectron Spectroscopy of Materials

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X-ray photoelectron spectroscopy (XPS) was conducted using a Kratos
Analytical Axis Ultra instrument with a monochromated Al K_α X-ray source (1486.69 eV) operated at 15 kV and 10 mA (150 W) in
a 5 × 10^–8 Torr chamber. Survey spectra were
collected using an analyzer pass energy of 160 eV, and binding energies
were collected from −5 to 1200 eV scanned at 1 eV increments.
Each step was integrated for 500 ms and the entire spectrum was averaged
across 5 sweeps. Regional C 1s spectra (276.9–300.0 eV) were
collected using the same conditions as the survey spectra, except
a pass energy of 20 eV (resolution of 0.4 eV) was used.

Thostenson J.O., Ngaboyamahina E., Sellgren K.L., Hawkins B.T., Piascik J.R., Klem E.J., Parker C.B., Deshusses M.A., Stoner B.R, & Glass J.T. (2017). Enhanced H2O2 Production at Reductive Potentials from Oxidized Boron-Doped Ultrananocrystalline Diamond Electrodes. ACS Applied Materials & Interfaces, 9(19), 16610-16619.

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