The artificial ligament was observed immediately after coating, using low vacuum- subsequent scanning electron microscopy (SEM) (SU3500, Hitachi, Japan) equipped with an energy dispersive X-ray spectrometer (EDS) (Octane Plus, Ametek Inc. U.S.A.), with acceleration voltage of 20 kV at 60 Pa. The artificial ligament was also observed at 50× magnification using SEM. Elemental analysis of the artificial ligament surface was performed using EDS.
Octane plus
Manufactured by Ametek
Sourced in United States
The Octane Plus is a laboratory instrument designed for the analysis and measurement of octane levels in fuel samples. It provides precise and reliable octane rating data to support quality control and research activities in the fuel industry.
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6 protocols using octane plus
1
Characterization of Artificial Ligament
2
Elemental Distribution Analysis of Plant Tissues
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Transversely and longitudinally sectioned and air-dried root, stem and leaf tissues were fixed on aluminum stubs covered with a carbon sticker. Surface conductivity was increased by carbon coating, which in turn also resulted in a uniform, approximately 60 nm thick, carbon layer on the tissue surface. The distribution of Si was analyzed with a Jeol JSM-IT300 scanning electron microscope (SEM) equipped with an energy dispersive X-ray (EDX) analyser (EDAX, Octane Plus, Ametek, United States).
Plant phytoliths were examined at several different spots on each of the three plant tissues studied (root, stem, and leaf). Raw data were processed with the TEAM Enhanced ver. 4.3 (EDAX-Ametek, United States) software and all values were expressed as weight % of the total analyzed Si element.
Plant phytoliths were examined at several different spots on each of the three plant tissues studied (root, stem, and leaf). Raw data were processed with the TEAM Enhanced ver. 4.3 (EDAX-Ametek, United States) software and all values were expressed as weight % of the total analyzed Si element.
3
Nanomaterial Characterization Protocol
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Scanning Electron Microscopic (SEM) image was recorded on a FEI Nano SEM450 microscope. The distribution of Pt active component was analyzed using energy-dispersive X-ray spectroscopy (EDS, Ametek Octane Plus). The XPS measurement was performed on Escalab 250Xi (Thermo Fisher Scientific, USA) using Al Kα radiation as the X-ray source. The C 1s peak at 284.8 eV, representing carbon contamination, was used as the reference for the spectra. Inductively coupled plasma atomic emission spectrometry (ICP-AES) analysis was performed on a PerkinElmer Optima 7300 V instrument.
4
Scanning Electron Microscopy of Biomaterials
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Scanning electron microscopy (SEM)/energy dispersive X-ray spectrometer (EDS) observations were made after laser irradiation and after 14 days of cell culture, as mentioned above, in all 6 groups (non-coated, laser-exposed without apatite coated, HAP, SrHAP, SrSiP and SrZnSiP). SEM was performed using a low vacuum scanning electron microscope (SU3500; Hitachi, Tokyo, Japan) equipped with EDS (Octane Plus; Ametek Inc., PA. USA), with acceleration voltage of 20 kV at 60 Pa [14 (link)].
5
Microstructure and Elemental Analysis
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The microstructure and morphology of the prepared samples were observed by SEM (Tescan GAIA FEG SEM). An X-ray detector (AMETEK Octane Plus) was used to collect the EDS data.
6
Microstructural and Elemental Analysis of Materials
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The microstructure and composition of tested materials were analyzed using FESEM and EDS. For the analysis of filler morphology and constitution, three samples from each group were dried for five days in a desiccator. Then, samples were mounted on stubs with carbon plaster and were sputter coated with Au (60%) /Pd (40%) approximately 7 nm in thickness to reduce electrostatic charging with ion sputter coater (Emitech K550X, Quorum Technologies Ltd., Ashford, UK). Following sputter coating, samples were mounted on FESEM (Inspect F50, FEI Company, Hillsboro, OR, USA) equipped with EDS (Octane Plus, Ametek, Berwyn, PA, USA) to be examined under vacuum conditions. For analysis, the system was operated at 20 kV, with a constant working distance, and images with magnifications ranging from ×5,000 to ×30,000 were taken. For elemental analysis, EDS mapping was performed with Octane Plus EDS system (EDAX Inc. Mahwah, NJ, USA) in ×5,000 magnification samples (565,248 pixels for each sample).
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