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Jem 100s transmission electron microscope

Manufactured by JEOL
Sourced in Japan

The JEM-100S is a transmission electron microscope (TEM) manufactured by JEOL. It is designed to produce high-resolution images of microscopic samples by transmitting a beam of electrons through the specimen. The JEM-100S allows users to observe the internal structure and composition of materials at the nanoscale level.

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3 protocols using jem 100s transmission electron microscope

1

Negative Staining Electron Microscopy

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Negative contrast electron microscopy was performed on two samples of the isolate. The first sample was the original isolate and the second sample was the isolate after filtration (filter 0.22 nm). The PEK cell line was infected with these samples, and the supernatant was collected on days 1–3. Virus particles in the supernatants were visualized by negative staining EM analysis. Supernatants from each sample (1 mL) were centrifuged at 3000× g for 20 min at 4 °C to remove cell debris. The clarified supernatants were then centrifuged at 13,000× g for 40 min at 4 °C. The pellets were resuspended in 10 μL PBS. Formvar carbon-coated copper grids were floated in droplets of virus suspension for 10 min and stained with 2% phosphotungstic acid for 1 min at room temperature. Subsequently, the grids were examined by transmission electronic microscopy [7 (link)]. The samples were viewed using a JEM-100S transmission electron microscope (JEOL, Tokyo, Japan) at an accelerating voltage of 80 kV.
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2

Leaf Ultrastructure Visualization

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Green and white sectors with equal area were first excised from the same leaf (Fig. 1a) and then proceeded to further fine cutting, fixation and observation under a JEOL JEM 100 S transmission electron microscope following the procedure as previously reported in Hung et al.27 (link).
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3

Comprehensive Polymer Characterization Techniques

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UV–Vis spectra were recorded on Shimadzu 2040 instrument. Fourier transforms infrared (FTIR) spectrometer (VERTEX 70 F T-IR) spectra were measured in ATR discs at room temperature within the wavenumber range of 400–4000 cm−1. Bruker high-performance digital FT-NMR spectrometer Avance III 400 MHZ was employed to perform routine 1H/13C high–resolution spectra along with common 2D experiments (COSY, HMBC, HSQC, …). The crystalline structure of prepared polymers was checked by X-ray diffraction (2,020,964 PA Analytical Empyrean). A scanning electron microscope (SEM; JEOL (JSM-5200)) was employed to investigate the morphologies of the prepared polymers. Samples were prepared by placing a slight part of a film on a carbon tube on a stub, which was coated with a gold thin layer. Micrographs of the prepared new polymeric materials using a JEM-100S Transmission Electron Microscope (TEM, Jeol, Tokyo, Japan) were taken. The different area pictures were captured at adjustable magnifications that identify the particle size and morphology. TGA-50H thermogravimetric analyzer was used to study the thermal stability of synthesized polymeric materials. Samples were heated from 10 to 600 °C in a platinum pan with a heating rate of 10 °C min−1 under an N2 atmosphere with a flow rate of 25 mL min−1.
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