To determine Young’s modulus (E) of hydrogels, a gel disc of 5 mm by 1 mm was first placed onto a polydimethylsiloxane mold on a glass slide and immersed in a drop of DMEM. The slide was then placed in an MFP-3D system (Asylum Research) to perform atomic force microscopy analysis with silicon nitride cantilevers (Bruker Model MLCT). A spring constant of the cantilever was determined from thermal fluctuations at room temperature (RT) (20 to 40 mN/m). The cantilever was brought toward the hydrogel surface at 1 μm/s and indented on the surface until it reached the trigger voltage (0.5 V), followed by retraction. Force-indentation curves were fitted using the Hertzian model with a pyramid indenter.
Mfp 3d system
Manufactured by Oxford Instruments
Sourced in United States
The MFP-3D system is a high-performance atomic force microscope (AFM) designed for a wide range of applications. It provides nanoscale imaging, measurement, and characterization capabilities for various samples. The MFP-3D system is capable of operating in multiple imaging modes and can be configured with a variety of specialized accessories to address specific research and analysis requirements.
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Lab products found in correlation
11 protocols using mfp 3d system
1
Hydrogel Young's Modulus Determination
2
Characterization of Photoactive Semiconductors
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The PS samples were characterized by X-ray diffraction (XRD) (Philips X'Pert diffractometer) using PANalytical Pro, equipped with a source of Cu-Kα: 1.540598 Å, voltage at 40 kV, current at 40 mA, and X'Celerator detector. The software used to collate the results was the X'Pert HighScore Plus by Rietveld refinement and simulation of crystal structures complemented by the Jmol software. Scanning electron microscopy (SEM) and Energy Dispersive X-ray (EDX) (JEOL JSM-6490LV) measurements were obtained with 3.0-nm resolution, magnification × 5~300.000 and 0.3~30 kV accelerating voltage under high vacuum (~10−6 mbar). Atomic force microscopy (AFM) measurements were carried out using a Asylum Research MFP 3D system in tapping mode. Spectrophotometer Cary 5000 of UV-VIS-NIR at atmospheric pressure and room temperature was used for to obtain the reflectance measurements as a function of wavelength. The cyclic voltammetry experiments (CV) were carried out through a potentiostat (Princeton Applied Research, PARSTAT 2263) using a Electrochemistry PowerSuite software for data collected. This system has 3-electrode cell with a platinum wire as the counter electrode, a Si/Al substrate as the working electrode, and an Ag/AgCl (3 MNaCl) reference electrode; a analog system reported by Bhattacharyya [31 ].
3
Nanoscale Magnetic Characterization by MFM
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Near-room-temperature MFM measurements were performed using an Asylum Research MFP-3D system. Low-temperature MFM measurements were performed with a homemade variable-temperature MFM (Rutgers University). The tips were coated with nominally 100-nm Co by magnetron sputtering. The MFM signal (the shift of resonant frequency) is proportional to the out-of-plane stray field gradient, which was extracted by a phase-locked loop (SPECS). MFM images were taken with constant-height noncontact mode.
4
Atomic Force Microscopy of Polymer Blends
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AFM scanning was performed at room temperature using an MFP-3D system
(Asylum Research, USA) in tapping mode with a cantilever (k: 8.45–37.97 N/m) at a scan frequency of 1 Hz. The
sample was prepared by drop-casting the PAzo and PCL–PUU solutions
(∼2 wt %) on a silicon wafer. Several specimens were scanned
in different regions to ensure reproducibility of the results.
(Asylum Research, USA) in tapping mode with a cantilever (k: 8.45–37.97 N/m) at a scan frequency of 1 Hz. The
sample was prepared by drop-casting the PAzo and PCL–PUU solutions
(∼2 wt %) on a silicon wafer. Several specimens were scanned
in different regions to ensure reproducibility of the results.
5
Atomic Force Microscopy of Sunscreens
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AFM analyses were performed using an Asylum Research MFP-3D system (Goleta, CA, USA) in tapping mode. Maximum scan areas were 90 μm × 90 μm. The cantilever and samples were located using a charge-couple device monitor. Unmodified sunscreens were transferred onto a glass slide, flatted with a glass coverslip, and air-dried. Size-related sample imaging was conducted at 10 μm, 5 μm, 2 μm, and 1.2 μm scan widths. Acquired phase and height images were analyzed using Asylum Research IGOR PRO-based software.
6
High-Resolution Topography of Renal Cells
7
Measurement of PEG-PES/NMP-DMF Membrane Roughness
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In this study, the mean roughness (Ra) and root mean square (RRMS) of the PEG-PES/NMP-DMF mixed matrix membranes were measured using atomic force microscope MFP-3D system (Asylum Research, USA) in the scan size of 20 μm × 20 μm.
8
Thickness-Dependent Room-Temperature MFM Measurements
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The thickness-dependent room-temperature MFM measurements were performed using an Asylum Research MFP-3D system. The MFM images (color bar, yellow and blue) were measured by typical tapping/lift mode. The lift height is fixed at 100 nm for scanning nanoflakes of thickness above 100 nm to reduce the influence of stray fields created by the MFM tips.
The temperature-dependent MFM measurements (Figs. 3 and 6B and fig. S16) (color bar, brown and white) were performed in a homebuilt variable-temperature MFM (Rutgers University) using commercial piezoresistive cantilevers with a spring constant k ~ 3 N/m and a resonant frequency f0 ~ 43 kHz. The tips were coated with nominally 100-nm Co by using magnetron sputtering. The MFM signal (the shift of resonant frequency) is proportional to the out-of-plane stray field gradient, which was extracted by a phase-locked loop (SPECS). MFM images were taken with constant-height noncontact mode. The magnetic field was applied by clamping two permanent magnets on the side of MFM probe. The north poles of two magnets face each other to generate an out-of-plane field (max, ~0.04 T) with a tiny in-plane field component (<0.003 T) due to misalignment, calibrated by a gauss meter. The cryogenic MFM measurements were performed inside a superconducting magnet.
The temperature-dependent MFM measurements (
9
Nanomechanical Characterization of Surfaces
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Surface topography imaging and force-indentation curve measurements were performed on an Asylum Research MFP-3D system. Single-crystal diamond tips (D80, SCD Probes) with tip radii of 5 to 10 nm and a spring constant of ~3.5 N/m, according to the manufacturer’s specifications, were used for force-indentation experiments. The spring constant of each AFM cantilever was calibrated via thermal noise method (41 (link)) before indentation experiments. During the force-indentation experiments, the z-piezo displacement speed was controlled at a rate of 100 nm/s. Different rates ranging from 50 to 1000 nm/s were also tested and showed no clear difference for the force-indentation curves.
10
Measuring Scaffold Stiffness Using Colloidal Probe
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