Jem 2100f field emission tem
The JEM-2100F field emission TEM is a transmission electron microscope manufactured by JEOL. It is designed to provide high-resolution imaging and analytical capabilities for a wide range of materials science and biological applications. The JEM-2100F utilizes a field emission electron source to generate a high-brightness electron beam, enabling enhanced resolution and signal-to-noise ratio.
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9 protocols using jem 2100f field emission tem
High-Resolution TEM Imaging
Synthesis and Characterization of Al2O3-Coated Fe3O4 Nanoparticles
Characterization of Nanofiber Mats via Microscopy and X-ray Diffraction
Transmission electron microscope (TEM) images of the samples were recorded on a JEM 2100 F field emission TEM (JEOL, Tokyo, Japan). Fiber samples were collected by fixing a lacey carbon-coated copper grid to the collector. X-ray diffraction (XRD) was conducted using a D/Max-BR diffractometer (Rigaku, Tokyo, Japan) over the 2θ range 5° to 60°. The instrument supplies Cu Kα radiation generated at 40 mV and 30 mA. The raw quercetin particles were also studied under cross-polarized light using an XP-700 polarized optical microscope (Shanghai Changfang Optical Instrument Co. Ltd, Shanghai, China).
Characterization of Regenerated Fibers
Characterization of Magnetic Oxide Nanoparticles
Mineral Characterization of NBC Composites
Interaction of GNCs with MRSA: Microstructural Analysis
Comprehensive Characterization of Aqueous Quantum Dots
Characterization of Deuterated Compound Solutions
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