S 4800 field
The S-4800 field emission scanning electron microscope (FE-SEM) is an advanced imaging tool designed by Hitachi for high-resolution, high-magnification analysis of materials. It utilizes a field emission electron source to produce a small, high-brightness electron beam, enabling the capture of detailed images with exceptional resolution and clarity.
Lab products found in correlation
11 protocols using s 4800 field
Epicuticular Wax Crystal Observation
Scanning Electron Microscopy of Powder Samples
Characterization of ZnO Nanoparticles
Characterization of Porous Nanocomposite Materials
Characterizing Carrageenase Immobilization by FTIR and SEM
Nanoparticle Imaging via SEM
Biofilm Cell Harvesting and Imaging
Cryogenic Fracture Surface Imaging
Scanning Electron Microscopy of Bivalve Shells
3D-Printed Hydrogel Surface Characterization
The microstructure network of the produced hydrogel and its ability to capture bacteria within its porous matrix was evaluated using Hitachi S-4800 field emission scanning electron microscopy (SEM) after Au/Pd sputtering. SEM imaging was performed on bare and bacteria-captured hydrogel samples. The first hydrogel sample was placed in a solution of PBS for 8 hours, while the second hydrogel was placed into a solution of 100% TSB inoculated with E. coli. Both hydrogel samples were freeze dried using a LyoStar 3 Freeze-dryer from SP Scientific for 18 hours prior to performing the SEM imaging.
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