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Axs d4 endeavour x diffractometer

Manufactured by Bruker

The Bruker AXS D4 Endeavour X diffractometer is an X-ray diffraction instrument designed for materials characterization. It is capable of performing powder X-ray diffraction analysis to identify and quantify crystalline phases in samples.

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4 protocols using axs d4 endeavour x diffractometer

1

Characterization of SrRuO3/g-C3N4 Heterostructures

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X-ray diffraction
(XRD) patterns for all SrRuO3/g-C3N4 samples were obtained with a Bruker AXS D4 Endeavour X diffractometer.
Transmission electron microscopy (TEM) images of pure SrRuO3, g-C3N4, and mesoporous 1.5% SrRuO3/g-C3N4 heterostructure acquired using a JEOL
JEM-2100F electron microscope (Japan) operated at 200 kV. Fourier
transform infrared (FT-IR) spectra in the range of 400–4000
cm–1 for all SrRuO3/g-C3N4 samples were recorded using a PerkinElmer after adding KBr.
The N2 adsorption/desorption isotherms were measured after
outgassing at 200 °C overnight by employing the Quantachrome
Autosorb equipment at 77 K. X-ray photoelectron spectroscopy (XPS)
measurement for the mesoporous 1.5% SrRuO3/g-C3N4 heterostructure was conducted with a Thermo Scientific
K-ALPHA spectrometer. The diffuse reflectance spectra for pure SrRuO3, g-C3N4, and all mesoporous SrRuO3/g-C3N4 samples were measured using
a Varian Cary 100 scan UV–vis system in the wavelength range
of ∼200–800 nm. Photoluminescence (PL) spectra for pure
SrRuO3, g-C3N4, and all mesoporous
SrRuO3/g-C3N4 samples were measured
employing a 150 W xenon lamp as an excitation source at λ ∼
365 nm via a spectrofluorophotometer, (RF-5301 PC). A Zahner Zennium
electrochemical workstation was used to estimate the transient photocurrent
measurements.
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2

Analytical Characterization of Nanomaterials

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XRD patterns were
recorded through a Bruker AXS D4 Endeavour X diffractometer. TEM images
were determined using a JEOL JEM-2100F electron microscope (Japan)
operating at 200 kV. N2 adsorption–desorption isotherms
were recorded at 77 K employing the Quantachrome Autosorb equipment
after outgassing at 200 °C overnight. A spectrofluorophotometer
was used to record photoluminescence (PL) by applying a xenon lamp
(150 W) as an excitation source at λ ∼ 365 nm (RF-5301
PC, 400 W, 50/60 Hz) at room temperature. X-ray photoelectron spectroscopy
(XPS) data were analyzed using a Thermo Scientific K-ALPHA spectrometer.
Fourier transform infrared spectrometry (FT-IR) spectra were measured
at 400–4000 cm–1 via a PerkinElmer after
mixing with KBr. Zahner Zennium electrochemical workstation was used
for determining transient photocurrent measurements. Diffuse reflectance
spectra were recorded using a Varian Cary 100 Scan UV–vis system
at λ ∼ 200–800 nm.
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3

Comprehensive Physicochemical Characterization of RuO2/LaNaTaO3 Photocatalyst

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The detailed physicochemical characterization
of the developed RuO2/LaNaTaO3 photocatalyst
was performed to have a better understanding of composition, structure,
and surface morphology of the perovskite photocatalysts. The X-ray
diffraction pattern was measured through Cu Kα1/2, λα1 = 154.060 pm, λα2 = 154.439 pm radiation using a Bruker AXS D4 Endeavour X diffractometer.
Field emission secondary electron microscopy (FE-SEM) was conducted
with an FE scanning electron microanalyzer (JEOL-6300F, 5 kV). The
N2 isotherm of the RuO2/LaNaTaO3 perovskites
was performed at 77 K by analyzing adsorption isotherms with a Micromeritics
ASAP 2010 volumetric adsorption unit. UV–vis diffuse reflectance
spectra (DRS) of the RuO2/LaNaTaO3 perovskites
were recorded on a UV–vis spectrophotometer (UV-2600, Shimadzu)
at λ = 200–800 nm. A VG Escalab 200R electron spectrometer
was applied to examine X-ray photoelectron spectra (XPS) for RuO2/LaNaTaO3 perovskites equipped with a Mg Kα
X-ray source powered at 100 W. The C 1s peak at 284.8 eV was employed
as calibration to estimate the binding energies (BE) of 1%RuO2/LaNaTaO3 perovskite.
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4

Advanced Materials Characterization Techniques

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XRD
patterns were determined using the Bruker AXS D4 Endeavour X diffractometer.
TEM images were examined by a JEOL JEM-2100F electron microscope.
N2 adsorption–desorption isotherms were measured
using the Quantachrome Autosorb equipment at 77 K after outgassing
at 200 °C for 12 h. A spectrofluorophotometer (RF-5301 PC, 400
W, 50/60 Hz) was used to measure the photoluminescence (PL) by employing
a xenon lamp (150 W) as the excitation source at λ ∼
365 nm. Spectra obtained by X-ray photoelectron spectroscopy (XPS)
were analyzed using a Thermo Scientific K-Alpha spectrometer. The
Zahner Zennium electrochemical workstation was employed to determine
the transient photocurrent measurements. The system comprised a standard
three-electrode Pt wire as the counter electrode and a calomel electrode
as the reference electrode; the synthesized samples were used as working
electrodes immersed in 0.1 M Na2SO4 as the electrolyte.
A 500 W xenon lamp was applied as the UV–vis light source.
Spectra were recorded using a Perkin Elmer Fourier transform infrared
spectrometer (FT-IR) at 400–4000 cm–1. Diffuse
reflectance spectra were determined at λ ∼ 200–800
nm by applying a Varian Cary 100 Scan UV–vis system.
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