Jsm 6701f scanning electron microscope
The JSM-6701F is a scanning electron microscope (SEM) developed by JEOL. It is designed to provide high-resolution images of sample surfaces. The JSM-6701F uses a field emission electron gun to generate a focused electron beam that scans the sample surface, and detectors collect the signals emitted from the sample, which are then processed to create the final image.
Lab products found in correlation
10 protocols using jsm 6701f scanning electron microscope
Characterization of Stretchable Electronics
Scanning Electron Microscopy of Biofilms
Wear Surface Characterization of 304 Stainless Steel
Scanning Electron Microscopy of E. coli in Honey
Comprehensive Characterization of Nanomaterials
Correlative Microscopy of nAChR Clusters
Comprehensive Materials Characterization Protocol
SEM Examination of Accurel Surface
Visualizing Polysaccharide Morphology
The freeze-dried powder sample was adhered to the copper sample table, then the sample surface was sprayed with gold. The surface structure of QPS1 was observed using a JSM-6701F scanning electron microscope (Jeol Ltd., Tokyo, Japan).
Preparing Cells for SEM Imaging
About PubCompare
Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.
We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.
However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.
Ready to get started?
Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required
Revolutionizing how scientists
search and build protocols!