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10 protocols using jsm 6701f scanning electron microscope

1

Characterization of Stretchable Electronics

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Cyclic strain tests were performed on a motorized linear stage with built-in controller (Zaber Technologies Inc.). A Keithley 2000 digital multimeter was used tomonitor the resistance change. Strain and resistance data were recorded with a custom-made LabViewcode. The transmittance spectra were recorded utilizing a Shimadzu UV-1700 spectrophotometer. SEM was performed on a JEOL JSM-6701F scanning electron microscope. The dielectric constant and capacitance of the elastomeric dielectric were measured using LCR meter (GW INSTEK LCR-819.) the by fabricating 12 ITO–elastomeric dielectric–evaporated alumina capacitors and averaging the unit area capacitance of all 12 capacitors. Kelvin probe force microscopy was conducted with a Bruker Dimension Icon Scanning Probe Microscope to measure the work function of AgNW. Transistor electrical characterization was performed with two Keithley 2400 source meter. The measurement sequences were controlled by a custom-made LabViewcode. All the transistor measurements were tested under ambient atmospheric conditions.
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2

Scanning Electron Microscopy of Biofilms

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Biofilms without the treatment of azalomycin F5a were grown on plastic disks as described above. Referring to the method reported by Peters et al. [26 (link)], samples were first washed three times with PBS to remove planktonic cells, and then placed into 2.5% glutaraldehyde for 24 h at 4 °C. Secondly, the disks were gradually dehydrated in a series of ethanol solutions (25%, 50%, 75%, 90%, 95% and 100%) with a 10 min interval, and subsequently washed with hexamethyldisilazane for 20 min and desiccated to achieve complete dehydration. Finally, samples were mounted on aluminum stubs with double-sided carbon tape and sputter coated with carbon. To assess the biofilm structure, Biofilms on disks were imaged with a JSM-6701F scanning electron microscope (JEOL, Tokyo, Japan) with the voltage set to 5.0 kV.
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3

Wear Surface Characterization of 304 Stainless Steel

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The surface topographies and EDS analysis of the wear surfaces of the 304 ring-discs were examined using a JSM-6701F scanning electron microscope (manufactured by JEOL in Japan). Raman spectra with a resolution of 0.7 cm−1 were obtained to identify the metal oxide products. X-ray diffraction patterns were obtained on a Bruker D8 Advance XRD machine to analyse the metal oxide products. The hardness and Young modulus of the metal oxide films at room temperature were measured using a Hysitron TI950 nanoindenter. The surface roughness was measured using laser-interference profilometry (LI–3, Huazhong University of Science and Technology, China). The wear mass losses of the 304 ring-discs were determined by measuring the weights before and after the tests with an analytical balance with a resolution of 0.0000 l g (MS205DU, Shanghai Jiehui Electronic Technology Ltd., China).
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4

Scanning Electron Microscopy of E. coli in Honey

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Prior processing, 0.50 mL of 0.5 McFarland E. coli suspension was incubated with 4.50 mL of honey at 37 °C for 24 h. The sample was then centrifuged at 3500 rpm for 5 min, the pellet was fixed with 2.5% (v/v) glutaraldehyde in 0.01 M phosphate buffer solution (PBS) for overnight. The sample was washed thrice for 10 min with 0.01 M PBS and subsequently by distilled water for another 10 min. The sample was dehydrated with ascending concentrations of ethanol solution, started with 25% (v/v) ethanol solution for 5 min followed by 50% (v/v) ethanol solution for 10 min, 75% (v/v) ethanol solution for 10 min, 95% (v/v) ethanol solution for 10 min and lastly with absolute ethanol for 10 min. After dehydration, the sample was subjected to freeze drying for 24 h. Thereafter, the sample was transferred to a carbon tape on copper stage and coated with platinum and viewed under JEOL JSM-6701F scanning electron microscope. The steps were repeated for negative control by replacing honey with normal saline added to the bacterial suspension.
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5

Comprehensive Characterization of Nanomaterials

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The crystal structure was examined using X-ray diffraction diffractometer (X’pert PRO, PANalytical, Almelo, The Netherlands). The BET-specific surface area, pore diameter, and pore size were determined via the N2 adsorption–desorption isotherms at 77 K with a surface area (ASAP 2010, Micromeritics, Norcross, Georgia, USA). The morphologies were studied by field emission scanning electron microscope (FESEM) (JSM-6701F scanning electron microscope, JEOL, Tokio, Japan) and transmission electron microscope (TEM) (Tecnai G2TF20, FEI, Hillsboro, Oregon, USA). The functional groups were characterized using Fourier transmission infrared spectroscopy (FTIR) (model IFS120HR, Bruker, Karlsruhe, Germany) equipped with a DTGS detector, collecting 32 scans per sample at a resolution of 4 cm−1 and Raman spectroscopy (model IFS120HR, Bruker, Germany). Zeta potential was determined using a Zeta sizer Nano-ZS90 dynamic light scattering instrument (Malvern, Britain). X-ray photoelectron spectroscopy (XPS, ESCALAB 250Xi, Thermo Fisher Scientific, Waltham, Massachusetts, USA) was used to identify the electronic state and chemical bonding at the surface of the synthesized samples. The concentration of sulfonamides was measured by high-performance liquid chromatography (HPLC, 1260 Infinity series, Agilent Technologies, Santa Clara, California, USA).
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6

Correlative Microscopy of nAChR Clusters

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nAChRs labeled with Alexa 488 and gold nanocrystals were observed with a fluorescent microscope (Axioplan 2, Carl Zeiss, Oberkochen, Germany) and then were fixed with 2% paraformaldehyde solubilized in PBS. The positions of the nAChR clusters were recorded using grid maps captured with phase contrast. After observation through fluorescent microscopy, clusters were further fixed with 2.5% glutaraldehyde for one hour and then dehydrated in graded ethanol and t-butanol. Samples were then freeze-dried with JFD-320 (JEOL, Tokyo, Japan). Gold nanocrystals at the fluorescent site were imaged using a JSM-6701F scanning electron microscope (JEOL).
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7

Comprehensive Materials Characterization Protocol

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X-ray powder diffraction (XRD) was employed to investigate the phase purity of the samples on a D8 Advance X-ray diffractometer (Bruker AXS, Karlsruhe, Germany). The morphologies and microstructures of the products were observed by field-emission scanning electron microscopy (SEM) and field-emission transmission electron microscopy (TEM). The SEM investigation was performed on a JSM-6701F scanning electron microscope (JEOL Ltd., Tokyo, Japan), and the TEM observation was carried out on a JEM-1200EX transmission electron microscope (JEOL Ltd., Tokyo, Japan). X-ray photoelectron spectroscopy (XPS) was used to record the chemical states of the elements on a PHI-5702 multi-functional X-ray photoelectron spectrometer (Physical Electronics, Chanhassen, MN, USA). The ultraviolet–visible (UV-Vis) diffuse reflectance spectra of the samples were tested by using a TU-1901 double beam UV-Vis spectrophotometer (Beijing Purkinje General Instrument Co. Ltd., Beijing, China) with BaSO4 as a reference. An RF-6000 fluorescence spectrophotometer (Shimadzu, Kyoto, Japan) was available to record the PL spectra of the samples (excitation wavelength: ~350 nm).
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8

SEM Examination of Accurel Surface

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Scanning electron microscopy (SEM) was employed to examine the surface of Accurel. The sample was coated with gold and viewed under a high vacuum. A surface of Accurel was conducted using a JSM-6701F scanning electron microscope (JEOL Ltd., Tokyo, Japan) at an acceleration voltage of 10.0 kV.
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9

Visualizing Polysaccharide Morphology

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A solution of 10 μg/L of QPS1 was prepared. 10 μL of this solution was dropped onto the surface (Φ 1 cm 2 ) of a freshly-cleaved mica sheet then left to dry naturally in ambient air. The morphology of the polysaccharide molecules in the solution was observed using atomic force microscopy (Multimode 8, Bruker AXS GmbH, Karlsruhe, Germany), and operated in tapping mode under ambient conditions using commercial silicon nitride cantilevers (L:115 µm, W: 25 µm) with a spring constant of 0.4 N/m.
The freeze-dried powder sample was adhered to the copper sample table, then the sample surface was sprayed with gold. The surface structure of QPS1 was observed using a JSM-6701F scanning electron microscope (Jeol Ltd., Tokyo, Japan).
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10

Preparing Cells for SEM Imaging

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For imaging by scanning electron microscopy, sorted cells were fixed in 2.5% glutaraldehyde in 0.1 M phosphate buffer for 1 hour (pH 7.4) at room temperature, treated postfixation with 1% osmium tetroxide (Ted Pella Inc.) at room temperature for 1 hour, and then dehydrated through a graded ethanol series from 25 to 100% and critical point dried using a CPD 030 critical point dryer (Bal-Tec AG, Liechtenstein). The cell surface was coated with 15 nm of gold by sputter coating using a SCD005 high-vacuum sputter coater (Bal-Tec AG). The coated samples were examined under a field emission JSM-6701F Scanning Electron Microscope (JEOL Ltd., United States) at an acceleration voltage of 8 kV using the in-lens secondary electron detector.
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