For TEM, the fixative was removed by centrifuging, and then samples were embedded in agar (BD, USA), followed by fixation using 2.5% glutaraldehyde at 5°C overnight. After washing with PBS three times at 4°C (each wash involving a 15 min incubation), samples were cut into ultrathin sections (70 nm) with a diamond knife. Images were recorded digitally with a transmission electron microscope HT-7800 (Hitachi, Tokyo, JP).
Supra 55 sapphire
The SUPRA 55 SAPPHIRE is a high-performance scanning electron microscope (SEM) manufactured by Zeiss. It is designed to provide high-resolution imaging and advanced analytical capabilities for a wide range of applications. The core function of the SUPRA 55 SAPPHIRE is to enable users to obtain detailed information about the surface morphology, composition, and structure of a wide variety of samples.
Lab products found in correlation
22 protocols using supra 55 sapphire
Electron Microscopy Visualization of Bacteria
For TEM, the fixative was removed by centrifuging, and then samples were embedded in agar (BD, USA), followed by fixation using 2.5% glutaraldehyde at 5°C overnight. After washing with PBS three times at 4°C (each wash involving a 15 min incubation), samples were cut into ultrathin sections (70 nm) with a diamond knife. Images were recorded digitally with a transmission electron microscope HT-7800 (Hitachi, Tokyo, JP).
Comprehensive Membrane Characterization Techniques
Comprehensive Characterization of Reinforced Composite Materials
Characterization of Polymer Surface Morphology
Dynamic mechanical analysis was performed using a TA Instruments Q800. Storage and loss modulus (E′, E′′) were measured in temperature sweep mode (1 Hz, 3 °C min−1) at the temperature ranging from 40 to 450 °C. All measurements were performed under nitrogen atmosphere. The mechanical properties of the coupling treated polyimide films were measured at ambient temperature on tensile tester (INSTRON 5569) according to GB/T 1040-2006 standard. Before testing, the thickness of pristine and treated polyimide films was measured by thickness gauge to calculate cross-sectional area, which was in order to prevent the influence of creep effect during irradiation process. The strain rate was set to 3 mm min−1. The tensile strength and elongation were determined by the maximum stress and the strain, respectively; and the average values were calculated from the stress–strain curves for five polyimide samples at each treated parameter.
Scanning Electron Microscopy Analysis of WLAP
Multimodal Characterization of Carbon Materials
The electrode sheet after full charge/discharge was washed with dimethyl carbonate (DMC) before ex situ testing. Ex situ X-ray photoelectron spectroscopy (XPS) was carried out after the electrode material was etched 10, 50, 100 and 150 nm, respectively.
Characterization of Workpiece Surface
Biochar Characterization and Properties
Morphology Analysis of RCMs and RPMs
Structural and Electrical Characterization of DPyCF
About PubCompare
Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.
We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.
However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.
Ready to get started?
Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required
Revolutionizing how scientists
search and build protocols!