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22 protocols using supra 55 sapphire

1

Electron Microscopy Visualization of Bacteria

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RN450 was grown in MH from overnight cultures following a 1:100 dilution at 37°C, 220 rpm for 2 h. Ampicillin (6 × MIC, 9 h), nigericin (4 × MIC, 6 h) and 0.1% EtOH were added and incubated. Samples were washed with PBS (Thermo Fisher Scientific, US) three times and fixed by 2.5% glutaraldehyde overnight at 4°C. For SEM, the samples were dehydrated by incubation with 30%, 50%, 70%, 80%, 95% and 100% gradient concentrations of ethanol. The fixed samples were spray-coated with a thin layer of gold and examined by scanning electron microscopy SUPRA55 SAPPHIRE (Carl Zeiss AG, German).
For TEM, the fixative was removed by centrifuging, and then samples were embedded in agar (BD, USA), followed by fixation using 2.5% glutaraldehyde at 5°C overnight. After washing with PBS three times at 4°C (each wash involving a 15 min incubation), samples were cut into ultrathin sections (70 nm) with a diamond knife. Images were recorded digitally with a transmission electron microscope HT-7800 (Hitachi, Tokyo, JP).
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2

Comprehensive Membrane Characterization Techniques

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The morphology of membranes was measured by a scanning electron microscope (SEM, SUPRA 55 SAPPHIRE Carl Zeiss, Oberkochen, Germany). The structure of membranes was tested by using a Rigaku Ultima IV X-ray powder diffractometer (XRD) with a Cu Kα target (λ = 1.54056 Å) at a scanning speed of 5° min−1 from 10 to 65° (40 kV and 40 mA). The chemistry of membrane samples was analyzed by a Fourier transform infrared spectrometer (FTIR, Thermo Scientific, Nicolet Magna 550, Waltham, MA, USA) in the scanning range of 400–4000 cm−1 with a resolution frequency of 2 cm−1 for 64 times scan. X-ray photoelectron spectroscopy (XPS) measurements were carried out on a Thermo Scientific K-Alpha XPS spectrometer using Al Kα X-ray source for radiation. The mechanical properties of membranes were characterized by using a CMT6103 electronic universal test machine from MTS at room temperature at a rate of 2 mm min−1. The thermal stability of PVC powder, PVC-P4VP and PVC-P4VP/PA membranes was measured using a thermogravimetric analyzer (TGA, STA449F3, Netzsch, Selb, Germany) with a heating rate of 10 °C min−1 in nitrogen.
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3

Comprehensive Characterization of Reinforced Composite Materials

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The RCMs and RPMs were investigated by FT-IR (MagnA-IR550, Thermo Fisher Scientific, Waltham, MA, USA) in the range 4000–400 cm−1. The analysis of the size and morphology of the RCMs and RPMs were performed using field-emission scanning electron microscopy (SEM, Supra 55 Sapphire, Carl Zeiss, Jena, Germany)). Thermogravimetric analysis of the RCMs and RPMs performed using TGA-DSC/DTA analyzer (STA 449 F5, NETZSCH-Gerätebau GmbH, Selb, Germany). The RCMs and RPMs were weighed by analytical balance with an accuracy of 0.1 mg (Practum124-1cn, Sartorius AG, Göttingen, Germany). The zeta potentials of the RCMs and RPMs were measured using a Laser Nanoparticle Size and Zeta Potential Analyzer (Zetasizer Nano, Malvern, UK). The RCM and RPM pore and specific surface area were measured at 77 k using surface area and pore size analyzer (ASAP2020, Micromeritics, Norcross, GA, USA). The mechanical properties of RCM were tested by an electronic universal testing machine (JDL-10000N, Yangzhou Tianfa test Machinery Co., Ltd., Yangzhou, China).
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4

Characterization of Polymer Surface Morphology

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The surface morphology of coupling treated polyimide films was observed by scanning electron microscope (SEM, SUPRA 55 SAPPHIRE, Zeiss). The phases of treated samples were identified by Panalytical Empyrean X-ray diffraction (XRD) with copper target. The scan step was 0.05° and the counting time was 0.4 s. The composition and chemical states after treatment were evaluated by X-ray photoelectron spectroscopy (XPS, ESCALAB250Xi, Thermo Fisher Scientific).
Dynamic mechanical analysis was performed using a TA Instruments Q800. Storage and loss modulus (E′, E′′) were measured in temperature sweep mode (1 Hz, 3 °C min−1) at the temperature ranging from 40 to 450 °C. All measurements were performed under nitrogen atmosphere. The mechanical properties of the coupling treated polyimide films were measured at ambient temperature on tensile tester (INSTRON 5569) according to GB/T 1040-2006 standard. Before testing, the thickness of pristine and treated polyimide films was measured by thickness gauge to calculate cross-sectional area, which was in order to prevent the influence of creep effect during irradiation process. The strain rate was set to 3 mm min−1. The tensile strength and elongation were determined by the maximum stress and the strain, respectively; and the average values were calculated from the stress–strain curves for five polyimide samples at each treated parameter.
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5

Scanning Electron Microscopy Analysis of WLAP

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A field emission scanning electron microscope (SEM, ZEISS SUPRA 55 SAPPHIRE, Oberkochen, Germany) operating at 3 kV was utilized to observe the surface morphology of WLAP, and an energy dispersive spectrometer (EDS) operating at 20 kV was used to examine the elemental components of WLAP. The surface morphology of coatings was tested by an SEM (JEOL JSM-7610F Plus, Tokyo, Japan) operating at 5 kV. Using a confocal laser scanning microscope (CLSM, OLYMPUS OLS4000, Tokyo, Japan), the coating’s surface morphology was gathered and examined, and its surface roughness (Ra) was determined using the LEXT program. Three samples were used to assess each coating, and the Ra of each sample was estimated separately. The average of test results was selected.
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6

Multimodal Characterization of Carbon Materials

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X-ray diffraction (XRD, BRUKER D8 Advance, Germany) was used to determine the structure of the samples. Raman spectroscopy (HORIBA JY LabRAM HR Evolution, France) was performed at a laser wavelength of 532 nm. Defects were analyzed by electron paramagnetic resonance (EPR; SE/X-type X-band spectrometer, Poland) at a microwave frequency of 9.06 GHz. The morphologies were observed using field-emission scanning electron microscopy (FESEM; SUPRA 55 Sapphire, Zeiss, Germany) and high-resolution transmission electron microscopy (HRTEM; FEI Tecnai G2 F20s-twin 200 kV, USA). A TriStar II 3020 surface-area and porosity analyzer (Micromeritics, Georgia, USA) was used to perform N2 adsorption–desorption experiments. The specific surface area was calculated using the BET method. The microporous specific surface area (Smic) and micropore volume (Vmic) were calculated by the t-plot method. Pore size distributions (PSDs) were determined by density functional theory (DFT). The element composition and content of as-prepared carbon materials were analyzed with an element analyzer (Vario EL cube, Germany).
The electrode sheet after full charge/discharge was washed with dimethyl carbonate (DMC) before ex situ testing. Ex situ X-ray photoelectron spectroscopy (XPS) was carried out after the electrode material was etched 10, 50, 100 and 150 nm, respectively.
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7

Characterization of Workpiece Surface

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A scanning electron microscope (SEM, Supra 55 Sapphire, Carl Zeiss, Oberkochen, Germany) and atomic force microscope (AFM, Dimension Icon, Goettingen, Germany) were used to acquire the morphology of the workpiece. The XRD patterns of the surface of the workpiece were analyzed by x-ray diffractometer (XRD, Empyrean, PANalytical, Almelo, Netherlands) with Cu Kα1, λ = 0.154 nm. Chemical states of elements were analyzed using x-ray photoelectron spectroscopy (XPS, ESCALAB 250XI, Thermo Fisher Scientific, Waltham, MA, USA). The values of CA and SA were tested with a 5 μL droplet of water on an optical contact angle meter system (JC2000C1, Shanghai Zhongchen Digital Technic Apparatus Co. Ltd., Shanghai, China). The average values of CA and SA were obtained from five measurements at different areas on the surface of the workpiece. The Young−Laplace method was used to calculate the static contact angle [32 (link),33 (link)].
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8

Biochar Characterization and Properties

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The SBET of the biochar was measured by a specific surface area analyser (SSA-4000, BUILDER, China), and the functional groups of the biochar were determined by Fourier transform infrared spectroscopy (FTIR) (8400S, SHIMAZU, Japan). The apparent structure of the biochar was characterized by scanning electron microscopy (SEM) (Supra55 Sapphire, ZEISS, Germany and Coxem, OPTON, China). Thermogravimetric (TG) analysis of corn stover was performed using a thermogravimetric analyser (Setsy Evolution, SETARAM, France), and the surface phases of biochar were analysed by X-ray diffraction (XRD) (SmartLab (9), RIGAKU, Japan). Biochar yields were calculated as the ratio between the weights of the corn stover before and after pyrolysis. The sample was added to deionized water at a ratio of 1:20 (w/v), and the suspension was shaken for 1 h and allowed to stand for 5 min. The pH was measured by a pH meter. The surface functional groups of biochar were determined by improved Bohem titration14 ,15 , and the cation exchange capacity (CEC) of biochar was measured by sodium acetate-flame photometry14 .
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9

Morphology Analysis of RCMs and RPMs

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The surface morphology of the RCMs and RPMs was determined by SEM analysis (SEM, Supra 55 Sapphire, Carl Zeiss Germany, Oberkochen, Germany). The samples were evenly coated on the conductive adhesive of the sample sheet and then sprayed with gold for 0.5 h. The surface morphology of the RCMs and RPMs after the samples were sprayed with gold was observed by SEM under low vacuum conditions.
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10

Structural and Electrical Characterization of DPyCF

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A scanning electron microscope (SUPRA55 SAPPHIRE, Zeiss Corporation, Germany) equipped with an energy dispersive spectrometer (EDS) was used to characterize the structure and morphology of the MF and DPyCF. A confocal Raman spectrometer (lDSPeC ARCTlC; 532 nm laser wavelength, 50x objective lens) was used to characterize the structural characteristics of the DPyCF. An X-ray diffractometer (XRD, XRD-7000X) with Cu kα radiation (λ = 0.15406 nm) was used to identify the phase structure. The pressure applied to sensors during tests was controlled by a motorized motion platform (FUYU, FLS40, China) with a motion controller (FUYU, FSC-2A, China). Pressure acquisition was done via a parallel beam pressure transducer (HY, HYPX-017, China). The electrical resistance of the DPyCF@SR was measured by a digital source meter (Keithley, 2400, USA).
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